1
Mixed-Signal VLSI Design Course Code: EE719 Department: Electrical - - PowerPoint PPT Presentation
Mixed-Signal VLSI Design Course Code: EE719 Department: Electrical - - PowerPoint PPT Presentation
Mixed-Signal VLSI Design Course Code: EE719 Department: Electrical Engineering Lecture 19: February 15, 2018 Instructor Name: M. Shojaei Baghini E-Mail ID: mshojaei@ee.iitb.ac.in 1 2 2 Module 24 Performance Parameters of Data Converters -
2 2
IIT-Bombay Lecture 19 M. Shojaei Baghini
Module 24 Performance Parameters of Data Converters - Part II
- Chapter 5, the Data Conversion Handbook,
Analog Devices, 2005.
3 3
IIT-Bombay Lecture 19 M. Shojaei Baghini
Ideal Characteristics of DAC/ADC
1 LSB Center point ADC (II) DAC (I)
D: LSB size
- Analog input range
May be [-VFS/2,VFS/2].
- Signed output code
may be used. Starting from DAC π
"#$_&'( = β + π-Γ2- 012
- 34
bi: bit # i
4 4
IIT-Bombay Lecture 19 M. Shojaei Baghini
Classification Based on Sampling Rate
- fs > 2fmax (Nyquist rate sampling)
β "Nyquist Convertersβ (fs /fmax > 2 but not much higher than 2) β It requires high-performance anti-aliasing filtering.
- fs >> 2fmax Oversampling (Oversampled converters)
β Simple anti-aliasing filter and smoothing filter is often enough. β Oversampling reduces quantization noise.
- fs < 2fmax (Undersampling or sub-sampling)
Useful for signals of which power is concentrated in a narrow band around a frequency.
5 5
IIT-Bombay Lecture 19 M. Shojaei Baghini
Common Performance Measures
Static Measures
- Monotonicity
- Offset
- Full-scale gain error and gain error
- Diff. nonlinearity (DNL) (mainly for Nyquist converters)
- Integral nonlinearity (INL) (mainly for Nyquist converters)
Dynamic Measures
- Delay, settling time
- Aperture uncertainty
- Distortion- harmonic content
- Signal-to-(noise and distortion) ratio (SNDR)
- Idle channel noise
- Spurious-free dynamic range (SFDR)
6 6
IIT-Bombay Lecture 19 M. Shojaei Baghini
Module 25 Offset and Gain Error in Data Converters
- Chapter 5, the Data Conversion Handbook,
Analog Devices, 2005.
- Full speed testing of A/D Converters, J. Doernberg,
et al. , IEEE JSSC, December 1984.
7 7
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications Offset Error (Zero Scale Error)
1 LSB Center point
Offset error is the shift of the first transition point.
- Similar notion for full scale error
8 8
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications - Concept of Gain Connecting center of segments will not results in a line.
9 9
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications β Simple Definition of Gain Error for DAC Gain error (in units of LSB) = V111 / (VFS β 1 LSB) - 1
Source: The data conversion handbook, Analog Devcies, 2005
10 10
IIT-Bombay Lecture 19 M. Shojaei Baghini
Module 26 DNL and INL in Data Converters
- Chapter 5, the Data Conversion Handbook,
Analog Devices, 2005.
- Full speed testing of A/D Converters, J. Doernberg,
et al. , IEEE JSSC, December 1984.
11 11
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications Differential Nonlinearity (DNL) of DAC
Source: The data conversion handbook, Analog Devices, 2005
- Variation of LSB with the code results in nonlinearity: SQNR degradation
12 12
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications Differential Nonlinearity (DNL) of ADC
Source: The data conversion handbook, Analog Devices, 2005
DNLmin: -1 LSB.
13 13
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications Integrated Nonlinearity (INL) of DAC
Source: The data conversion handbook, Analog Devices, 2005
7 5 1 3
14 14
IIT-Bombay Lecture 19 M. Shojaei Baghini
Static Specifications Integrated Nonlinearity (INL) of ADC
Understanding Data Converters, TI, 1995
Variation of transition points
15 15
IIT-Bombay Lecture 19 M. Shojaei Baghini