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Ringamp: The Scalable Amplifier We ve All Been Waiting For? - - PowerPoint PPT Presentation

Ringamp: The Scalable Amplifier We ve All Been Waiting For? Benjamin Hershberg Imec March 22 nd 2020 NANOSCALE CMOS ADAPTATION AND SURVIVAL Some ADC architectures have thrived and expanded. SAR VCO-based CT 2 NANOSCALE CMOS


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SLIDE 1

Benjamin Hershberg Imec

Ringamp: The Scalable Amplifier We’ve All Been Waiting For?

March 22nd 2020

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SLIDE 2

2

NANOSCALE CMOS

ADAPTATION AND SURVIVAL

Some ADC architectures have thrived and expanded. SAR VCO-based CT ΔΣ

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SLIDE 3

3

NANOSCALE CMOS

ADAPTATION AND SURVIVAL

Pipeline Algorithmic DT ΔΣ Folding Flash Sub-Ranging Others have lost ground, forced into niche applications.

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SLIDE 4

4

The reason? ... a hidden bottleneck: Residue Amplification

ADAPTATION AND SURVIVAL

NANOSCALE CMOS

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5

How has this constrained our solutions? What did we lose in diversity?

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6

REPLACING THE OPAMP

PROPOSED SOLUTIONS

Zero-crossing based Charge-steering

GmVRES ΦA VRES ΦR VOUT CL

Gm

ΦA

Gm-C style Dynamic Amplifier Inverter based

GmVRES VRES VOUT CL

Gm

ΦA RL

Gm-R style Dynamic Amplifier

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SLIDE 7

7

THE “IDEAL AMPLIFIER” WISHLIST

Fast slewing High bandwidth High linearity High gain Rail-to-rail

  • utput swing

Low noise Performance scales like digital CMOS Fully dynamic (switchable) class-AB

?

Speed Accuracy Efficiency Cost

+ – ?

Small area Low design effort

No solution can tick all the circles yet...

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SLIDE 8

8

THE “IDEAL AMPLIFIER” WISHLIST

Fast slewing High bandwidth High linearity High gain Rail-to-rail

  • utput swing

Low noise Performance scales like digital CMOS Fully dynamic (switchable) class-AB Small area Low design effort

Ring Amplifier

(ringamp)

INp OUTm

what else can we try?

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SLIDE 9

9

FUNDAMENTALS

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SLIDE 10

10

RING OSCILLATOR

IN SWITCHED CAPACITOR FEEDBACK

RST

VCMX=0.6V VIN ±VREF CLOAD

RST RST

VCMO

Example MDAC Feedback Structure

VIN VOUT

RST

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SLIDE 11

11

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

RING OSCILLATOR

IN SWITCHED CAPACITOR FEEDBACK

RST

VCMX=0.6V VIN ±VREF CLOAD

RST RST

VCMO

Example MDAC Feedback Structure

VIN VOUT

RST

VCMX = 0.6V (ideal settled input value)

VIN

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SLIDE 12

12

RING OSCILLATOR

IN SWITCHED CAPACITOR FEEDBACK

CL VOUT VIN

Feedback network

☺ Large gain ☺ Rail to rail swing ☺ Maximal slewing efficiency ☺ Small, simple layout ☺ Inherent class-AB behavior ☺ Fully compatible with digital CMOS

IT’S AN OSCILLATOR!

Sounds great! Only one problem…

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SLIDE 13

13

DUALITY

OSCILLATOR → AMPLIFIER Any ring oscillator can be stabilized

It’s just a matter of putting the poles in the right place

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SLIDE 14

14

RING AMPLIFIER

INp CLOAD OUTm

p1 p2 p3 ▪ Make p1 & p2 as fast as technology will allow

▪ p1 & p2 constrained by technology limits, not kT/CLOAD noise requirement ▪ Scales well into nanoscale CMOS

▪ Stabilize with p3

▪ ring oscillator → ring amplifier

BASIC PRINCIPLES

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SLIDE 15

15

RING AMPLIFIER

INp CLOAD OUTm

p1 p2 p3 ▪ But we can do even better

▪ Dynamic biasing

BASIC PRINCIPLES

Begin very fast but unstable:

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SLIDE 16

16

RING AMPLIFIER

INp CLOAD OUTm

p1 p2 p3

BASIC PRINCIPLES

▪ But we can do even better

▪ Dynamic biasing

Dynamically shift output pole:

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SLIDE 17

17

RING AMPLIFIER

INp CLOAD OUTm

p1 p2 p3

BASIC PRINCIPLES

▪ But we can do even better

▪ Dynamic biasing

Stable steady-state:

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SLIDE 18

18

RING AMPLIFIER

▪ AC analysis only explains steady-state

▪ How do we get to steady state? ▪ Do we ever get to steady state?

▪ Must also consider

▪ DC ▪ Transient

BASIC PRINCIPLES

A “stable” ringamp with 73o phase margin:

[Lim, JSSC 2015]

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SLIDE 19

19

DYNAMIC LARGE-SIGNAL STABILIZATION

▪ Split signal into two paths ▪ Shift DC level (of transient wave) differently in each path

RST

VCMX VIN ±VREF CLOAD

RST RST

VCMO

Example MDAC Feedback Structure

  • VDZ

+

RST RST RST

  • VOS+

+VOS-

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SLIDE 20

20

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 0mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

  • VDZ

+ VAN VIN VOUT VA VBP VBN VAP

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21

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 0mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

  • VDZ

+ VAN VIN VOUT VA VBP VBN VAP

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22

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 0mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

  • VDZ

+ VAN VIN VOUT VA VBP VBN VAP

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23

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 0mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

  • VDZ

+ VAN VIN VOUT VA VBP VBN VAP

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24

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 200mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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25

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 250mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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26

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 300mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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27

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 350mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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28

DYNAMIC LARGE-SIGNAL STABILIZATION

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

VDEADZONE = 400mV

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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29

DYNAMIC LARGE-SIGNAL STABILIZATION

THREE OPERATION PHASES ▪ Slewing

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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30

DYNAMIC LARGE-SIGNAL STABILIZATION

THREE OPERATION PHASES ▪ Slewing

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

VIN

  • VDZ1

+ VOUT

RST RST RST

C3 C2 MCP MCN

CL Rail-to-rail inverters +

  • + -

Max VOV Max VOV Very small transistors

Slewing Efficiency: Theoretical Maximum!

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31

DYNAMIC LARGE-SIGNAL STABILIZATION

THREE OPERATION PHASES ▪ Slewing

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

VIN VCMX - VOS(IN) IRAMP VOUT

EN EN

VCMX + VOS(IN) td COUT IRAMP

Acts like bi-directional switchable current source

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32

DYNAMIC LARGE-SIGNAL STABILIZATION

THREE OPERATION PHASES ▪ Slewing ▪ Stabilization

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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33

  • VDZ

+ VAN VIN VOUT VA VBP VBN VAP

+VOS-

  • VOS+

VDD/2 VDD/2 - VOS VDD/2 VDD/2 + VOS

DYNAMIC LARGE-SIGNAL STABILIZATION

STABILIZATION

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SLIDE 34

34

DYNAMIC LARGE-SIGNAL STABILIZATION

STABILIZATION

  • VDZ

+ VAN VIN VOUT VA VBP VBN VAP

1. Reduced avg. overdrive voltage 2. Reduced output current 3. Reduced oscillation amplitude

Example here: operation on the edge of stability

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35

DYNAMIC LARGE-SIGNAL STABILIZATION

STABILIZATION (IN NANOSCALE)

▪ Modern example in 16nm FinFET CMOS

▪ Less intrinsic gain ▪ Different dynamic biasing mechanism (resistor) ▪ Class-AB biasing (outputs in weak-inversion at steady-state)

▪ But fundamental idea & behavior still the same

INm + INp

B A

OUTp

D C

OUTm

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36

DYNAMIC LARGE-SIGNAL STABILIZATION

STABILIZATION (IN NANOSCALE)

▪ Modern example in 16nm FinFET CMOS

▪ Less intrinsic gain ▪ Different dynamic biasing mechanism (resistor) ▪ Class-AB biasing (outputs in weak-inversion at steady-state)

▪ But fundamental idea & behavior still the same ▪ VOUT affects stability!

▪ VDS varies w.r.t. VOUT ▪ Thus, output pole location varies w.r.t. VOUT

INm + INp

B A

OUTp

D C

OUTm

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37

DYNAMIC LARGE-SIGNAL STABILIZATION

THREE OPERATION PHASES ▪ Slewing ▪ Stabilization ▪ Settling

1 2 3 4 5 6 0.2 0.4 0.6 0.8 1 1.2 Volts time (ns)

1.2 1 0.8 0.6 0.4 0.2 1 2 3 4 5 6

Volts time (ns)

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38

VIN

  • VDZ1

+ VOUT

RST RST RST

C3 C2 MCP MCN

DYNAMIC LARGE-SIGNAL STABILIZATION

SETTLING

▪ Weak-inversion steady-state ▪ Min VOV

☺ Low quiescent current ☺ Noise filtering

▪ Min VDSAT

☺ Wide swing ☺ High linearity

▪ Max ro

☺ High gain ☺ High linearity

small VOV + + ─ small VOV Dominant

  • utput pole

─ + ─ large ro, small VDSAT large ro, small VDSAT + ─

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39

VIN

  • VDZ1

+ VOUT

RST RST RST

C3 C2 MCP MCN

DYNAMIC LARGE-SIGNAL STABILIZATION

▪ Noise at output filtered by steady- state gm

▪ Internal noise ▪ Supply noise

▪ With smart design, noise at least as good as opamp

▪ But much faster ▪ But much more efficient

NOISE

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40

DYNAMIC LARGE-SIGNAL STABILIZATION

▪ SNR and THD may have different bias optimums ▪ Noise

▪ Best when over-damped ▪ lowest gm for most filtering

▪ Linearity

▪ Best when critically-damped ▪ Fastest settling

Less damped More damped

NOISE

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SLIDE 41

41

THE “IDEAL AMPLIFIER” WISHLIST

Fast slewing High bandwidth High linearity High gain Rail-to-rail

  • utput swing

Low noise Performance scales like digital CMOS Fully dynamic (switchable) class-AB Small area Low design effort

Ring Amplifier

(ringamp)

INp OUTm

So ... how did we do?

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42

TOPOLOGY SELECTION

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43

TOPOLOGY SELECTION

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

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SLIDE 44

44

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

Dead-zone embedding Class B Class AB Biasing Mode Class B+AB

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45

BIASING MODE

TOPOLOGY SELECTION

▪ Class-B

▪ Sub-threshold “dead-zone” ▪ Surrounded by “weak-zone”

☺ Fastest, most stable  Dead-zone distortion

DC Input Sweep

VIN

  • VDZ1

+ VOUT

RST RST RST

C3 C2 MCP MCN

VTEST IOUT

IOUT (mA) VIN (mV)

weak-zones dead-zone

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SLIDE 46

46

BIASING MODE

TOPOLOGY SELECTION

▪ Class-AB

▪ Only “weak zone” ▪ Always conducting

☺ Highest accuracy  Slower

IOUT (mA) DC Input Sweep VIN (mV)

weak-zone

VIN

  • VDZ1

+ VOUT

RST RST RST

C3 C2 MCP MCN

VTEST IOUT

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SLIDE 47

47

BIASING MODE

TOPOLOGY SELECTION

▪ Class-B + AB

▪ Class-B coarse charge ▪ Class-AB fine settle [Hershberg, VLSI 2013]

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SLIDE 48

48

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

Dead-zone embedding Directly before

  • utput

stage Earlier stages Location

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SLIDE 49

49

OUTm INp OUTm INp

▪ Directly before output stage

▪ Precise control of output stage biasing

▪ Best for:

▪ Class-AB operation ▪ High accuracy & linearity ▪ Low gain technologies ▪ Nanoscale CMOS 👎

EMBEDDING LOCATION

TOPOLOGY SELECTION

[Hershberg, VLSI 2013] [Lim, JSSC Oct. 2015]

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50

OUTm INp

▪ Before second-to-last stage

▪ Decouples stability from large signal biasing of output stage

▪ Best for:

▪ Class-B operation ▪ High speed ▪ Coarse charging [Hershberg, JSSC 2012]

EMBEDDING LOCATION

TOPOLOGY SELECTION

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SLIDE 51

51

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY CHOICES

Basic Topology Selection

Dead-zone embedding Capacitor CMOS Resistor Device Resistor

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SLIDE 52

52

CAPACITOR EMBEDDING

TOPOLOGY SELECTION

OUTm INp [Hershberg, VLSI 2013] OUTm INp [Hershberg, JSSC 2012]

▪ Direct voltage-mode control ▪ Best for

▪ Class-B biasing ▪ High-voltage applications

▪ Limitations

▪ If embedding in last stage, will reduce max slewing efficiency

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53

▪ Dynamically creates offset during stabilization ▪ Best for

▪ PVT robust design ▪ Nanoscale CMOS ▪ Slewing efficiency

▪ Limitations

▪ Speed problems if large VDZ offset needs to be embedded

RESISTOR EMBEDDING

TOPOLOGY SELECTION

OUTm INp [Lim, JSSC Oct. 2015]

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54

▪ Dynamically creates offset during stabilization ▪ Best for

▪ PVT robust design ▪ Nanoscale CMOS ▪ Slewing efficiency

▪ Limitations

▪ Speed problems if large VDZ offset needs to be embedded

RESISTOR EMBEDDING

TOPOLOGY SELECTION

OUTm INp [Lim, JSSC Oct. 2015]

If VDD increases ID increases VDZ increases If Temp decreases IOUT stable ID + VDZ

  • VOV +

IOUT

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55

▪ Dynamically creates offset during stabilization ▪ Best for

▪ PVT robust design ▪ Nanoscale CMOS ▪ Slewing efficiency

▪ Limitations

▪ Speed problems if large VDZ offset needs to be embedded

RESISTOR EMBEDDING

TOPOLOGY SELECTION

OUTm INp [Lim, JSSC Oct. 2015]

ΔVDZ = ID * RB

Want a big V? Needs a big R Creates slow stage 2 poles 

ωp = 1/RC ID + VDZ

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SLIDE 56

56

▪ Tunable on-state resistance ▪ Switchable (off-state) ▪ Best for

▪ Power-cycling ▪ Optimal biasing ▪ Nanoscale CMOS

▪ Limitations

▪ Less PVT robust than static resistor

CMOS RESISTOR EMBEDDING

TOPOLOGY SELECTION

[Lagos, JSSC Feb. 2019] OUTm INp

EN EN

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SLIDE 57

57

OUTm INp Bn Bp

OTHER EMBEDDINGS

TOPOLOGY SELECTION

▪ Current starved inverters ▪ Best for

▪ Dynamic control ▪ Analog PVT tracking schemes

▪ Limitations

▪ Slower (lowers 2nd stage output poles) [Hershberg, PhD Thesis 2012] [Leuenberger, CICC 2017]

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SLIDE 58

58

OTHER EMBEDDINGS

TOPOLOGY SELECTION

▪ Threshold voltage of output stage ▪ Best for

▪ Low supply voltages ▪ High speed ▪ Simplicity ▪ Area

▪ Limitations

▪ PVT variation ▪ Not with high supply voltages [Lim, JSSC Oct. 2015] OUTm

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SLIDE 59

59

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

Signaling mode Pseudo- differential Fully- differential

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SLIDE 60

60

▪ Can be purely inverter-based, most dynamic ▪ Best for

▪ Speed

▪ Limitations

▪ Large input offset must be canceled ▪ Limited accuracy

PSEUDO DIFFERENTIAL

TOPOLOGY SELECTION

OUTm INp CMFB OUTp INm

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61

▪ Fully-differential ▪ Best for

▪ General purpose ▪ Highest accuracy

▪ Limitations

▪ Moderate speed /power penalty (front stage becomes slower)

FULLY DIFFERENTIAL

TOPOLOGY SELECTION

OUTm INm

VDD VSS

OUTm INp

VCMFB

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SLIDE 62

62

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

Number

  • f stages
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63

THREE-STAGE

TOPOLOGY SELECTION

▪ The “workhorse” ▪ Best for

▪ Most applications

▪ Limitations

▪ Might not give enough gain in some technologies to support calibration-free operation ▪ CMFB can be a little tricky in fully-differential topologies

VDD DZP EN DZN VSS EN_i EN_i EN EN OUTm INp VDD DZP EN DZN VSS EN_i EN_i EN EN OUTp INm EN VDD EN Vs2p2 Vs2m2 Vs2p1 Vs2m1 VDD VSS MCM2

CMFB

MCM1

[Hershberg, ISSCC 2019]

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SLIDE 64

64

FOUR-STAGE

TOPOLOGY SELECTION

▪ When more gain is needed ▪ Best for

▪ High precision ▪ Calibration-free

▪ Limitations

▪ CMFB and latch-up require careful consideration ▪ A little less speed (extra internal pole) [Lim, VLSI 2017]

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SLIDE 65

65

TWO-STAGE

TOPOLOGY SELECTION

▪ Special purpose ▪ Best for

▪ Non-inverting feedback loop (e.g. CMFB) ▪ Low precision applications

▪ Limitations

▪ Low gain [Lagos, JSSC Feb. 2019]

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66

ONE STAGE?

TOPOLOGY SELECTION

OUTm INp

▪ “Inverter based amplifier” ▪ Best for

▪ Specialty applications

▪ Limitations

▪ Low gain ▪ Low gain-bandwidth ▪ Low slew rate / slew efficiency ▪ No gain before output stage (no large-signal effects)

▪ A multi-stage ringamp is generally faster and more efficient.

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SLIDE 67

67

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

CMFB

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SLIDE 68

68

TOPOLOGY SELECTION

CMFB

▪ Approach varies depending on topology

▪ Psuedo-differential ▪ Fully-differential ▪ Level of CM rejection needed

OUTm INp OUTp INm

EN EN EN EN EN EN EN EN

CMFB

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SLIDE 69

69

TOPOLOGY SELECTION

CMFB

▪ Approach varies depending on topology

▪ Psuedo-differential ▪ Fully-differential ▪ Level of CM rejection needed

▪ Passive CMFB

▪ Simple ▪ Often good enough [Hershberg, JSSC 2012]

OUTm INp rst rst rst OUTp INm

EN EN EN EN EN EN EN EN

VCM rst

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SLIDE 70

70

TOPOLOGY SELECTION

CMFB

▪ Approach varies depending on topology

▪ Psuedo-differential ▪ Fully-differential ▪ Level of CM rejection needed

▪ Passive CMFB

▪ Simple ▪ Often good enough

▪ Active CMFB

▪ Add gain ▪ Higher accuracy ▪ Larger rejection range [Lagos, JSSC Feb. 2019]

OUTm INp VCM rst rst rst OUTp INm

EN EN EN EN EN EN EN EN

Av 2-stage ringamp

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SLIDE 71

71

TOPOLOGY SELECTION

CMFB

▪ Fully differential

▪ Often requires global and local loops

▪ 3 paths

▪ DC bias ▪ Fast global feedback ▪ Fast local feedback

VDD DZP EN DZN VSS EN_i EN_i EN EN OUTm INp VDD DZP EN DZN VSS EN_i EN_i EN EN OUTp INm EN VDD EN Vs2p2 Vs2m2 Vs2p1 Vs2m1 VDD VSS MCM2 OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

CFB OUTm CSENSE MCM1

[Hershberg, ISSCC 2019]

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SLIDE 72

72

TOPOLOGY SELECTION

CMFB

▪ Fully differential

▪ Often requires global and local loops

▪ 3 paths

▪ DC bias ▪ Fast global feedback ▪ Fast local feedback [Hershberg, ISSCC 2019]

VDD DZP EN DZN VSS EN_i EN_i EN EN OUTm INp VDD DZP EN DZN VSS EN_i EN_i EN EN OUTp INm EN VDD EN Vs2p2 Vs2m2 Vs2p1 Vs2m1 VDD VSS MCM2 OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

CFB OUTm CSENSE MCM1

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SLIDE 73

73

TOPOLOGY SELECTION

CMFB

▪ Fully differential

▪ Often requires global and local loops

▪ 3 paths

▪ DC bias ▪ Fast global feedback ▪ Fast local feedback [Hershberg, ISSCC 2019]

VDD DZP EN DZN VSS EN_i EN_i EN EN OUTm INp VDD DZP EN DZN VSS EN_i EN_i EN EN OUTp INm EN VDD EN Vs2p2 Vs2m2 Vs2p1 Vs2m1 VDD VSS MCM2 OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

CFB OUTm CSENSE MCM1

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SLIDE 74

74

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

Power Cycling

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SLIDE 75

75

TOPOLOGY SELECTION

POWER CYCLING

OUTm INp

▪ Only operate when needed

▪ Save power

▪ Best solution very architecture dependent

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SLIDE 76

76

TOPOLOGY SELECTION

POWER CYCLING

▪ Only operate when needed

▪ Save power

▪ Best solution is very architecture dependent ▪ A naive solution: power gate + output switch

▪ Extra switch in feedback path  ▪ Undefined internal reset state  ▪ Signal dependent charge kickback  ▪ Clock must drive all switches on EN line  ▪ Headroom reduced by power gating switches  OUTm INp EN EN

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SLIDE 77

77

TOPOLOGY SELECTION

POWER CYCLING

OUTm INp EN

▪ Only operate when needed

▪ Save power

▪ Best solution is very architecture dependent ▪ A better solution: full-reset, self-disconnect

▪ Extra parasitics from pullup/pulldown switches  ▪ Clock must drive all switches on EN line  ▪ Headroom reduced by power gating switches 

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SLIDE 78

78

TOPOLOGY SELECTION

POWER CYCLING

OUTm INp EN

▪ Only operate when needed

▪ Save power

▪ Best solution is very architecture dependent ▪ A better solution: full-reset, self-disconnect

▪ Extra parasitics from pullup/pulldown switches  ▪ Clock must drive all switches on EN line  ▪ Headroom reduced by power gating switches 

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SLIDE 79

79

TOPOLOGY SELECTION

POWER CYCLING

OUTm INp

EN EN EN EN

[Lagos, JSSC Mar. 2019]

▪ A very elegant solution: self-resetting ▪ Requires

▪ Bias-enhancement (we’ll get to this later) ▪ CMOS resistors

▪ Best of all worlds

▪ No power-gating switches ▪ No pull-up or pull-down switches ▪ Small switches (CMOS resistors) minimize clock loading

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SLIDE 80

80

TOPOLOGY SELECTION

POWER CYCLING

▪ A very elegant solution: self-resetting ▪ Requires

▪ Bias-enhancement (we’ll get to this later) ▪ CMOS resistors

▪ Best of all worlds

▪ No power-gating switches ▪ No pull-up or pull-down switches ▪ Small switches (CMOS resistors) minimize clock loading [Lagos, JSSC Mar. 2019] OUTm INp

EN EN EN EN

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SLIDE 81

81

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential Auto- zero High- voltage Biasing Mode

TOPOLOGY SELECTION

Basic Topology Selection

Other Auto- zero

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SLIDE 82

82

TOPOLOGY SELECTION

AUTO-ZERO

▪ Not for free

▪ Extra complexity ▪ Sometimes extra power

▪ Some applications / topologies require it

▪ Pseudo-differential ringamps ▪ Zero-offset applications

▪ Most applications / topologies can avoid it

▪ Offset tolerant and “good enough” use cases ▪ System level methods

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SLIDE 83

83

TOPOLOGY SELECTION

AUTO-ZERO

▪ Not for free

▪ Extra complexity ▪ Sometimes extra power

▪ Some applications / topologies require it

▪ Pseudo-differential ringamps ▪ Zero-offset applications

▪ Most applications / topologies can avoid it

▪ Offset tolerant and “good enough” use cases ▪ System level methods

OUTm INp CMFB OUTp INm

“Good enough” partial cancellation:

  • 1. Inverter trip-point offset

(tech. dependent VTH mismatch)

  • 2. Stage 1 random offset

(largest source of random offset)

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SLIDE 84

84

TOPOLOGY SELECTION

AUTO-ZERO

[Lim, Oct. 2015]

▪ Not for free

▪ Extra complexity ▪ Sometimes extra power

▪ Some applications / topologies require it

▪ Pseudo-differential ringamps ▪ Zero-offset applications

▪ Most applications / topologies can avoid it

▪ Offset tolerant and “good enough” use cases ▪ System level methods

β = 1 CLOAD = CL + CAZ

Be careful with CAZ sizing : Stability Noise

Av +

  • IN

OUT CS CFB CAZ CL

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SLIDE 85

85

TOPOLOGY SELECTION

AUTO-ZERO

▪ Not for free

▪ Extra complexity ▪ Sometimes extra power

▪ Some applications / topologies require it

▪ Pseudo-differential ringamps ▪ Zero-offset applications

▪ Most applications / topologies can avoid it

▪ Offset tolerant and “good enough” use cases ▪ System level methods

β = CS / CFB CLOAD = CL + CFB//CS

[Lim, Oct. 2015] Av +

  • OUT

CS CFB CAZ VREF CL

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SLIDE 86

86

TOPOLOGY SELECTION

AUTO-ZERO

▪ Not for free

▪ Extra complexity ▪ Sometimes extra power

▪ Some applications / topologies require it

▪ Pseudo-differential ringamps ▪ Zero-offset applications

▪ Most applications / topologies can avoid it

▪ Offset tolerant and “good enough” use cases ▪ System level methods

OUTm INm

VDD VSS

OUTm INp

VCMFB

Differential topologies:

  • No inverter trip-point offset ☺
  • Only random mismatch offset
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SLIDE 87

87

TOPOLOGY SELECTION

AUTO-ZERO

▪ Not for free

▪ Extra complexity ▪ Sometimes extra power

▪ Some applications / topologies require it

▪ Pseudo-differential ringamps ▪ Zero-offset applications

▪ Most applications / topologies can avoid it

▪ Offset tolerant and “good enough” use cases ▪ System level methods Example: Pipelined SAR stage

Can often find simple methods to cancel ringamp offset somewhere else in the system

CDAC SAR Logic + IN

ringamp

+

  • +
  • + -

VOS + -

  • VOS

OUT β

  • +
slide-88
SLIDE 88

88

Basic Topology Selection

Location Dead-zone embedding Number

  • f stages

Other CMFB Signaling mode Power Cycling Device Pseudo- differential Fully- differential High- voltage Biasing Mode Auto- zero

TOPOLOGY SELECTION

Basic Topology Selection

Other High- voltage

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SLIDE 89

89

TOPOLOGY SELECTION

HIGH-VOLTAGE

▪ Capacitor embedding is best

▪ Can store large ΔV needed to generate dead-zone ▪ Can level shift between different VDDs ▪ Can couple in multiple output paths (coarse/fine) [ElShater, JSSC 2019]

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SLIDE 90

90

PATHWAYS TO PERFORMANCE

slide-91
SLIDE 91

91

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

slide-92
SLIDE 92

92

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Settled Linearity class-AB biasing (weak-zone only) Biasing Mode

slide-93
SLIDE 93

93

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Settled Linearity Dead-zone Degeneration Circuit Techniques External Gain Enhancement Techniques

slide-94
SLIDE 94

94

DEAD-ZONE DEGENERATION

LINEARITY ENHANCEMENT

▪ Motivation

▪ 1st order linear gain error often easy to calibrate (with digital or trimming) ▪ Higher order gain error much harder to correct

▪ Idea

▪ Feedback to “warp” VDZ as function of VOUT ▪ Especially useful in low-gain tech. like 28nm [Lagos, JSSC Mar. 2019] OUTm INp

VCM

+ VDZ

  • DC Open-loop Gain (dB)

VDZ (mV) VOUT (mV)

slide-95
SLIDE 95

95

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Settled Linearity Dead-zone Degeneration Circuit Techniques External Gain Enhancement Techniques

slide-96
SLIDE 96

96

EXTERNAL GAIN ENHANCEMENT TECHNIQUES

LINEARITY ENHANCEMENT

▪ Class-AB style ringamps compatible with many “classical” gain enhancement techniques ▪ Ringamps using Correlated Level Shifting (CLS) techniques: ▪ Split-CLS [Hershberg, JSSC 2012] ▪ A-CLS [T.C. Hung, JSSC 2019] ▪ WA-CLS [T.C. Hung, JSSC 2020] [T.C. Hung, JSSC 2020]

slide-97
SLIDE 97

97

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Settled Linearity Cascade More Stages Boost per-Stage Gain Increase Gain

slide-98
SLIDE 98

98

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Speed Minimize Internal Parasitics

slide-99
SLIDE 99

99

THE 2 COMMANDMENTS

OF HIGH SPEED RINGAMP DESIGN

1. Thou shalt never load the internal nodes 2. Thou shalt never limit the internal currents

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SLIDE 100

100

THE 2 COMMANDMENTS

OF HIGH SPEED RINGAMP DESIGN

▪ But many choose to break the rules...

▪ Trade speed for other benefits [Lim, JSSC Oct. 2015] OUTm INp

Current limiter for peak gm/ID

slide-101
SLIDE 101

101

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Speed Bias Enhancement Circuit Techniques

slide-102
SLIDE 102

102

BIAS-ENHANCEMENT

SPEED ENHANCEMENT

▪ Idea: use additional signal splitting to boost VOV and gm of internal stage

Increased bandwidth VOV boosted [Lagos, JSSC Mar. 2019] [Chen, TCASII 2017] OUTm INp THD Clock Frequency (MHz)

slide-103
SLIDE 103

103

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

More Speed Increase internal pole frequencies Increase Internal Power

slide-104
SLIDE 104

104

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

Less Noise Reduce noise of stage 1 Increase Internal Power

slide-105
SLIDE 105

105

My Ringamp Needs…

More Settled Linearity Less Noise More Speed Increase Gain Circuit Techniques Minimize Internal Parasitics Circuit Techniques Reduce

  • utput pole

frequency Increase Internal Power Biasing Mode

PATHWAYS TO PERFORMANCE

My Ringamp Needs…

Less Noise Filter internal noise with lower output gm Reduce

  • utput pole

frequency

slide-106
SLIDE 106

106

PVT CONSIDERATIONS

slide-107
SLIDE 107

107

FEEDBACK MAKES LIFE EASIER

PVT CONSIDERATIONS

▪ Open-loop amplifier (e.g. Gm-C integrator)

▪ Like balancing a ball on a hill ▪ No feedback to suppress parameter variation

  • E.g. open-loop residue gain

▪ Ring amplifier

▪ Like placing a ball safely away from the edge ▪ Feedback suppresses parameter variation ▪ But only as good as the feedback itself

  • Loop gain, bandwidth, stability
slide-108
SLIDE 108

108

APPROACH 1: ROBUST-BY-DESIGN

PVT CONSIDERATIONS

▪ Calibration-free approach

▪ Include extra margin to pass all corners ▪ Sacrifice some efficiency / speed

▪ Options for increasing phase margin

▪ Move internal poles higher

  • More power

▪ Move external pole lower

  • Less speed

built-in margin

slide-109
SLIDE 109

109

▪ Calibration-free approach

▪ Include extra margin to pass all corners ▪ Sacrifice some efficiency / speed

▪ Calibration-free ringamp ADCs

▪ [Hung, ISSCC 2020]

  • 100MS/s, 71.7dB SNDR, 2.2fJ/c-step FoMW

▪ [Lim, JSSC Dec. 2015]

  • 50MS/s, 70.9dB SNDR, 6.9fJ/c-step FoMW

▪ [Lim, VLSI 2017]

  • 100MS/s, 73.2dB SNDR, 6.1fJ/c-step FoMW

[Lim, Dec. JSSC 2015]

APPROACH 1: ROBUST-BY-DESIGN

PVT CONSIDERATIONS

Power supply +/- 50mV Temperature -20oC – 80oC

slide-110
SLIDE 110

110

APPROACH 2: CALIBRATION

PVT CONSIDERATIONS

▪ Calibration-based approach

▪ Use feedback to maintain optimal biasing ▪ Top performance ▪ More analog design freedom ▪ More digital complexity 

▪ Calibration-based ringamp ADCs

▪ [Hershberg 2019]

  • 3.2GS/s, 61.7dB SNDR, 19.3fJ/c-step FoMW

▪ More to come... active bias control

slide-111
SLIDE 111

111

PRACTICAL DESIGN

slide-112
SLIDE 112

112

TRANSIENT-BASED DESIGN & VALIDATION

PRACTICAL DESIGN

▪ Transient-centric design is becoming mainstream

▪ All “next-gen” amplifiers: ringamp, Gm-C, Gm-R, Charge-steering, Zero-crossing, etc.

▪ Modern compute power can handle it ▪ Multi-core with APS

slide-113
SLIDE 113

113

METHODS OF ANALYSIS

PRACTICAL DESIGN

▪ Transient waveform visual inspection ▪ Amplifier input nodes particularly useful ▪ Transient (+noise) FFT of sampled output ▪ Exercise full output swing, need enough FFT points ▪ AC, PAC, PSS, PNOISE where useful ▪ But always confirm with transient!

slide-114
SLIDE 114

114

METHODS OF ANALYSIS

PRACTICAL DESIGN

▪ Transient waveform visual inspection ▪ Amplifier input nodes particularly useful ▪ Transient (+noise) FFT of sampled output ▪ Exercise full output swing, need enough FFT points ▪ AC, PAC, PSS, PNOISE where useful ▪ But always confirm with transient!

slide-115
SLIDE 115

115

example environment:

1.5b flip-around MDAC

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

▪ Build in-situ testbench

▪ Real switches ▪ Actual feedback factor ▪ Real output loading ▪ Real timing control scheme ▪ Estimated parasitics ▪ Any other non-idealities

VCM

+

DSTGN[1:0]

φA INM CU CU XM VCM

1.5b sub-ADC 1.5b sub-DAC ringamp

INP CU CU XP VCM

EN

OUTP OUTM

slide-116
SLIDE 116

116

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

VDD DZP EN DZN VSS EN_i OUTm VDD VSS EN_i EN INp VDD DZP EN DZN VSS EN_i OUTp INm EN OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

Dz_nmos[7:0] 7 VDD DZN EN Dz_pmos[7:0] 7 VSS DZP EN

Trapped-Charge Bias Control

CFB OUTm CSENSE

▪ Fully-differential ▪ CMOS-resistor ▪ Bias-enhanced ▪ Self-resetting ▪ Multi-path CMFB

slide-117
SLIDE 117

117

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

VDD DZP EN DZN VSS EN_i OUTm VDD VSS EN_i EN INp VDD DZP EN DZN VSS EN_i OUTp INm EN OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

Dz_nmos[7:0] 7 VDD DZN EN Dz_pmos[7:0] 7 VSS DZP EN

Trapped-Charge Bias Control

CFB OUTm CSENSE

▪ Fully-differential ▪ CMOS-resistor ▪ Bias-enhanced ▪ Self-resetting ▪ Multi-path CMFB

slide-118
SLIDE 118

118

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

VDD DZP EN DZN VSS EN_i OUTm VDD VSS EN_i EN INp VDD DZP EN DZN VSS EN_i OUTp INm EN OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

Dz_nmos[7:0] 7 VDD DZN EN Dz_pmos[7:0] 7 VSS DZP EN

Trapped-Charge Bias Control

CFB OUTm CSENSE

▪ Fully-differential ▪ CMOS-resistor ▪ Bias-enhanced ▪ Self-resetting ▪ Multi-path CMFB

slide-119
SLIDE 119

119

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

▪ Fully-differential ▪ CMOS-resistor ▪ Bias-enhanced ▪ Self-resetting ▪ Multi-path CMFB

OUTm VDD VSS INp OUTp INm OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

Dz_nmos[7:0] 7 VDD DZN EN Dz_pmos[7:0] 7 VSS DZP EN

Trapped-Charge Bias Control

CFB OUTm CSENSE

slide-120
SLIDE 120

120

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

VDD DZP EN DZN VSS EN_i OUTm VDD VSS EN_i EN INp VDD DZP EN DZN VSS EN_i OUTp INm EN OUTp

B1

CFB CSMALL CBIG

EN

CSENSE

EN_i EN_i EN_i

Trapped Charge CMFB

Dz_nmos[7:0] 7 VDD DZN EN Dz_pmos[7:0] 7 VSS DZP EN

Trapped-Charge Bias Control

CFB OUTm CSENSE

▪ Fully-differential ▪ CMOS-resistor ▪ Bias-enhanced ▪ Self-resetting ▪ Multi-path CMFB

slide-121
SLIDE 121

121

DESIGN PROCEDURE

16NM DESIGN EXAMPLE

Baseline (final design)

VCM

+

DSTGN[1:0]

φA INM CU CU XM VCM

1.5b sub-ADC 1.5b sub-DAC ringamp

INP CU CU XP VCM

EN

OUTP OUTM

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SLIDE 122

122

ADJUST DRIVE STRENGTH

16NM DESIGN EXAMPLE

½x Output Drive

▪ Key parameter: output drive strength

▪ Smaller: more stable, less internal loading ▪ Larger: faster slew 3 different amplitudes:

slide-123
SLIDE 123

123

ADJUST DRIVE STRENGTH

16NM DESIGN EXAMPLE

2x Output Drive

▪ Key parameter: output drive strength

▪ Smaller: more stable, less internal loading ▪ Larger: faster slew 3 different amplitudes:

slide-124
SLIDE 124

124

ADJUST DRIVE STRENGTH

16NM DESIGN EXAMPLE

2x All Stages

3 different amplitudes:

▪ Key parameter: internal stage sizes

▪ Smaller: more efficient ▪ Larger: faster

slide-125
SLIDE 125

125

ADJUST DEADZONE

16NM DESIGN EXAMPLE

Optimal dead-zone

3 different amplitudes:

▪ Key parameter: dead-zone biasing

▪ Smaller: faster settling ▪ Larger: more stable

slide-126
SLIDE 126

126

ADJUST DEADZONE

16NM DESIGN EXAMPLE

Dead-zone too large

3 different amplitudes:

▪ Key parameter: dead-zone biasing

▪ Smaller: faster settling ▪ Larger: more stable

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SLIDE 127

127

ADJUST DEADZONE

16NM DESIGN EXAMPLE

Dead-zone too small

3 different amplitudes:

▪ Key parameter: dead-zone biasing

▪ Smaller: faster settling ▪ Larger: more stable

slide-128
SLIDE 128

128

EXAMPLE DESIGN PROCEDURE

PRACTICAL DESIGN

1. Build in-situ testbench with realistic timing & feedback conditions 2. Initialize ringamp with over-designed front stages (extra bandwidth) 3. Size output stage to balance worst-case slew rate / settling time (approx. 50/50) 4. Down-scale front stages for power efficiency (e.g. 4:2:1) 5. Iterate from #3 as necessary Ultimately, the best design procedure depends on many factors, e.g. optimization priorities and application type. With practice will come intuition and insight. This is the art of analog design!

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SLIDE 129

129

REVITALIZING THE ECOSYSTEM

slide-130
SLIDE 130

130

REVITALIZING THE ECOSYSTEM

CONCLUSIONS

...and diversity is increasing more architectural freedom amplifier- intensive techniques Ringamps remove the amplifier bottleneck... new applications

slide-131
SLIDE 131

131

REVITALIZING THE ECOSYSTEM

CASE STUDY

▪ Order-of-magnitude improvement in direct-RF sampling ADC SoTA ▪ 36 ringamps in system ▪ Very amplifier intensive

[Hershberg, ISSCC 2019 (1)] System 3.2 GS/s Channel 800 MS/s SNDR 63 dB SFDR 80 dB Power 61.3 mW FoMW 19 fJ/cs

c

VIN

STG2 1.5b CU = 128fF STG3 1.5b CU = 64fF c

clk

2 2 2

DOUT c

BACKEND 1.5b + 3b CU = 32fF 5 STG1 1.5b CU = 200fF STG4 1.5b CU = 32fF 2 STG9 1.5b CU = 32fF 2 STG4 1.5b CU = 32fF 2 CH0 CH1

DOUT[N:0]

CH2 CH3 D0[N:0] D1[N:0] D2[N:0] D3[N:0]

CLKIN

controller

mux

BUF

VIN

BUF

slide-132
SLIDE 132

132

REVITALIZING THE ECOSYSTEM

RINGAMP DESIGNS WITH MEASURED SILICON

[Park, ISSCC 2020] [Xiao, ASSCC 2019] LDO Pipeline Pipeline SAR PLL ...? [Hershberg, ISSCC 2019] [Hershberg, VLSI 2020] [Hershberg, VLSI 2013] [Lim, JSSC Dec. 2015] [Lim, JSSC Oct. 2015] [Lim, VLSI 2017] [Hershberg, JSSC 2012] [ElShater, JSSC 2019] [Hung, ISSCC 2020] [Chen, ESSCIRC 2019] [Leuenberger, CICC 2017] [Lagos, CICC 2018] [Lagos, VLSI 2017] [Hung, JSSC 2019] [Suguro, ISCAS 2016] [Munthal, SSCL 2019] [Chen, TCASII 2017] NS SAR VGA Sensor filter ΔΣ

slide-133
SLIDE 133

133

REVITALIZING THE ECOSYSTEM

RINGAMP TOPOLOGY DIVERSIFICATION

OUTm INp

Self-Biased [Lim, JSSC Oct. 2015] Bias-Enhanced [Chen, TCASII 2017] High Voltage [ElShater, ISSCC 2019] Self-Resetting [Lagos, JSSC Mar. 2019] Closed Loop Dynamic Amplifier [Tang, ISSCC 2020] Class B+AB [Hershberg, VLSI 2013] Power Management [Park, ISSCC 2020] Rapid Reset [T.C.Hung, ISSCC 2020]

slide-134
SLIDE 134

134

But is it the scalable amplifier you’ve been waiting for? Depends! Ringamps are an exciting new tool. It could be the right one for your task. Decide for yourself! ☺

REVITALIZING THE ECOSYSTEM

CONCLUSIONS

slide-135
SLIDE 135

135

THANK YOU FOR YOUR ATTENTION!