FFS@le.ac.uk M OTIVATION Developing a SRAM FPGA based Flash File - - PowerPoint PPT Presentation

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Nov 13, 2023 446 likes •576 views

SEU P ROTECTION FOR H IGH - R ELIABILITY F LASH F ILE S YSTEMS Neil Perrins and Alistair A. McEwan FFS@le.ac.uk M OTIVATION Developing a SRAM FPGA based Flash File System. Intended for use in high reliability, high performance large

SLIDE 1

SEU PROTECTION FOR HIGH- RELIABILITY FLASH FILE SYSTEMS FFS@le.ac.uk

Neil Perrins and Alistair A. McEwan

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SLIDE 2

MOTIVATION

 Developing a SRAM FPGA based Flash File

System.

 Intended for use in high reliability, high

performance large data storage applications.

 We intend to improve the reliability of the Flash

File System for use in high radiation environments such as space.

SLIDE 3

SINGLE EVENT UPSETS

 What is a Single Event Upset (SEU)?  Soft errors.  Affects memory elements.  Where do they occur?  High radiation environments including space.  Smaller silicon features mean they can occur nearly

everywhere.

 What are the effects of SEU in relation to an

SRAM based FPGA?

SLIDE 4

SINGLE EVENT UPSETS

01010101010101 01010101010101 01010101010101 01010101010101 Radiation 01010101010101 01010101000101 01010101010101 01010101010101 01000101010101 01010101100101 01000101010101 00010100010101 Originally this data element contains 0x55555555555555. After one SEU this data element contains 0x55555455555555. After a while this data element contains 0x55555454554515.

SLIDE 5

EFFECTS OF SEUS ON FGPA

Configuration bits of an FPGA are stored in SRAM. These bits can be effected by SEU.

Pictures from “Software Fault-Tolerant Techniques for Softcore Processors in Commercial SRAM-Based FPGAs” Nathaniel H. Rollins and Michael J. Writhlin

SLIDE 6

PROCESSES IN THE FLASH FILE SYSTEM

Consumer Consumer Process

SLIDE 7

SIMULATOR

 Fault Injection on the bit stream.  Partial Reconfiguration to simulate the SEUs.

SLIDE 8

PARTIAL RECONFIGURATION

 Reconfiguration is when the device is configured

after start up.

 Partial Reconfiguration is when a part of a device

is reconfigured and dynamic partial reconfiguration is when only part of a device is reconfigured while the rest of the device is still running its circuit.

SLIDE 9

STRESS TEST THE FLASH FILE SYSTEM

 Going to use our test bench to test the Flash File

System for susceptibility to SEU.

 This should reveal parts of the Flash File System

that require SEU Mitigation and give ideas for which parts need verification.

SLIDE 10

RADIATION EFFECTS ON ELECTRONICS

 Single Event Effects  Single Event Gate Rupture  Single Event Latch Up  Single Event Functional Interrupt  Single Event Transient  Single Event Upset

SLIDE 11

SUMMARY

 Making a fault injection based test bench to

simulate SEUs.

 Using a fault injection test bench to stress test

ur flash file system.

 This should help us find the areas we need to

apply SEU mitigation.