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EE-452 13 - 1 Czochralski (CZ) crystal growing Si is purified - - PowerPoint PPT Presentation
EE-452 13 - 1 Czochralski (CZ) crystal growing Si is purified - - PowerPoint PPT Presentation
EE-452 13 - 1 Czochralski (CZ) crystal growing Si is purified from SiO2 (sand) by refining, distillation and CVD. It contains < 1 ppb impurities. Pulled crystals contain O ( ~ 1018 EE-452 13 - 2 Plummer cm-3) and C ( ~ 1016 cm-3),
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- Si is purified from SiO2 (sand) by refining, distillation and
CVD.
- It contains < 1 ppb impurities. Pulled crystals contain O (~1018
cm-3) and C (~1016 cm-3), plus dopants placed in the melt.
Czochralski (CZ) crystal growing
Plummer
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Crystal seed Molten polysilicon Heat shield Water jacket Single crystal silicon Quartz crucible Carbon heating element Crystal puller and rotation mechanism
CZ Crystal Puller
Figure 4.10
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- All Si wafers come
from “Czochralski” grown crystals.
- Polysilicon is
melted, then held just below 1417 °C, and a single crystal seed starts the growth.
- Pull rate, melt
temperature and rotation rate control the growth
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Silicon Ingot Grown by CZ Method
Photograph courtesy of Kayex Corp., 300 mm Si ingot
Photo 4.1
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An alternative process is the “Float Zone” process which can be used for refining or single crystal growth.
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Float Zone Crystal Growth
RF Gas inlet (inert) Molten zone Traveling RF coil Polycrystalline rod (silicon) Seed crystal Inert gas out Chuck Chuck
Figure 4.11
lummer
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- In the float zone process, dopants and other impurities are rejected
by the regrowing silicon crystal. Impurities tend to stay in the liquid and refining can be accomplished, especially with multiple passes. (See the Plummer for models of this process)
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Flat grind Diameter grind Preparing crystal ingot for grinding
Ingot Diameter Grind
Figure 4.20
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Internal diameter wafer saw
Internal Diameter Saw
Figure 4.23
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After crystal pulling, the boule is shaped and cut into wafers which are then polished on one side.
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Wafer Notch and Laser Scribe
1234567890
Notch
Scribed identification number
Figure 4.22
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Polished Wafer Edge
Figure 4.24
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Chemical Etch of Wafer Surface to Remove Sawing Damage
Figure 4.25
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Wafer Dimensions & Attributes
Table 4.3
Diameter (mm) Thickness (µm) Area (cm2) Weight (grams/lbs) Weight/25 Wafers (lbs)
150
675 ± 20 176.71 28 / 0.06
1.5 200
725 ± 20 314.16 53.08 / 0.12
3 300
775 ± 20 706.86 127.64 / 0.28
7 400
825 ± 20 1256.64 241.56 / 0.53
13
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88 die
200-mm wafer
232 die
300-mm wafer
Increase in Number of Chips
- n Larger Wafer Diameters
(Assume large 1.5 x 1.5 cm microprocessors)
Figure 4.13
Plummer
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