Department of Electrical and Computer Engineering
Vishal Saxena
- 1-
CMOS Comparator Design
Extra Slides
Vishal Saxena, Boise State University
(vishalsaxena@boisestate.edu)
CMOS Comparator Design Extra Slides Vishal Saxena, Boise State - - PowerPoint PPT Presentation
Department of Electrical and Computer Engineering CMOS Comparator Design Extra Slides Vishal Saxena, Boise State University (vishalsaxena@boisestate.edu) Vishal Saxena -1- Comparator Design Considerations Comparator = Preamp
Department of Electrical and Computer Engineering
Vishal Saxena
(vishalsaxena@boisestate.edu)
Vishal Saxena
Vishal Saxena
Vos orginiates from:
mismatch (Vth,W/L)
current mirror
clock-feedthru imbalance
M1 M2
Vi Vos
M3 M4 VDD M5 M6 M8 M7 M9 VSS Φ
Vo
+
Vo
Latch
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VDD VSS Vo Φ
PA tracking Latch reseting Latch regenrating
Vo
+
Vo
M5 M6 M8 M7 M9 VSS Φ Vo
+
Vo
CL
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M8 M7 CL CL Vo
+
Vo
+
CL gmVo
L m
g t exp t V t V
pole RHP single , /C g s 1 /sC g s Δ
L m p L m
V V /sC g 1 1 1 /sC V g V V V
m L
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t V t V ln g C t
L
M8 M7 CL CL Vo
+
Vo
Vo(t=0) t
Vo Vo(t=0) t/(CL/gm) 1V 100mV 2.3 1V 10mV 4.6 1V 1mV 6.9 1V 100μV 9.2
Vishal Saxena
amplifier. be to g 1 2 R , R g 2 R g A
m7 9 9 m7 9 m5 V2
M5 M6 M8 M7 M9 Φ=1 Vo
+
Vo
+
Vm
Vi M3 M4 Vm
+
Vm
+
Vo
2 R9 2
gm7
gm7 gm5Vm
+
gm5Vm
m3 m1 V1
g g A
V2 V1 i V i
A V A V V
L m V2 V1 i
g t exp A A V t V
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L m V2 V1 i
g t exp A A V t V
Curve AV1AV2 Vi(t=0)
10 mV
1 mV
100 μV
10 μV Vo
+
Φ Vo
2 3 4 T/2 Comparator fails to produce valid logic outputs within T/2 when input falls into a region that is sufficiently close to the comparator threshold
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L m V2 V1 i
g t exp A A V t V
Vi Do Δ j Vos j+1
Assuming that the input is uniformly distributed over VFS, then
Vishal Saxena
M5 M6 M8 M7 Φ Vo
+
Vo
CL M9
Cgd Cgs
Vo
+
Vo
CM jump
in Vo
+ and Vo
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Dynamic offset derives from:
Φ Vo
+
Vo
50mV imbalance 10% jump CM 0.5V Dynamic offset is usually the dominant offset error in latches
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the gain of PA
its own offset (mostly static due to Vth, W, and L mismatches)
kickback noise
M1 M2
Vi Vos
M3 M4 VDD M5 M6 M8 M7 M9 VSS Φ
Vo
+
Vo
Latch
Kickback noise disturbs reference voltages, must settle before next sample
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M1 M2
Vi Vos
M3 M4 VDD M5 M6 M8 M7 M9 VSS Φ
Vo
+
Vo
Latch
L L
2 2 2 2
th
W Δ 1 V ΔV V W 4
9 m7 9 m5 V2
R g 2 R g A
m3 m1 V1
g g A
2 V2 2 V1 2 dyn
2 V2 2 V1 2
2 V1 2
2
2
2
A A V A A V A V V V V
Differential pair mismatch: Total input-referred comparator offset:
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, D S WL A ΔP σ
2 2 P 2 P 2
Suppose parameter P of two rectangular devices has a mismatch error of ΔP. The variance of parameter ΔP b/t the two devices is where, W and L are the effective width and length, D is the distance Ref: M. J. M. Pelgrom, et al., “Matching properties of MOS transistors,” IEEE Journal
2 2 2 2 Vth th Vth 2 2 β 2 2 β 2
A Threshold: σ V = +S D WL A σ β Current factor : S D β WL
1st term dominates for small devices
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1 S R1
L R R with std σ W
X X X X X X X X
W L 10 identical resistors
R1 R2
R2 R1 R1 R 2 1 1
σ 10σ σ σ 1 1 1 R 10R R R 10 A WL
j
2 S 1 R2 10 2 2 2 R2 R R1 R2 R1 j 1
L R R 10 10R with std σ , W σ σ 10σ σ 10σ
“Spatial averaging”
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N N N 2 1 N N N 3dB 3dB
A A A ω 1 j ω / ω 1 ω / ω A A ω ω , ω ω 2 1 2 N stages:
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A Vos Φ1 Φ2 Φ2' Vi Vo C
M1 M2 M3 M4
Vi
+
Vi
Vo
+
Vo
M6
, , OS pre amp OS in
A
Finite preamp gain: V V
, , ,
2 2 2 2 2
OS pre OS latch OS in
pre pre
A A
V V V
For the overall comparator :
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etc.) don’t track transistors; but it is fast!
M1 M2
Vi
+
Vi
+
Vo
L
1 mL m1 V
L W L W g g A : up pull diode NMOS
L
1 p n mL m1 V
L W L W μ μ g g A : up pull diode PMOS
L m1 V
R g A : up pull Resistor
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M1 M2 M3 M4
Vi
+
Vi
+
Vo
Ip I
1 p p n m3 m1 V
L W L W I 2 I 2 I μ μ g g A
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JSSC, vol. 32, pp. 1887-1895, issue 12, 1997.
M1 M2 M7 M3 M4
Vi
+
Vi
+
Vo
M6
Vid gm1Vid ro1 1 gm3 ro3
gm5 ro5 Vod 3 r g //r //r //r g 1 // g 1 g A : gain DM
m1
m5 m3 m1 dm V
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Circuits, 1999, pp. 79-80.
M1 M2 M5 M4 M3
Vi
+
Vi
+
Vo
RL
X
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Ref: V. Srinivas, S. Pavan, A. Lachhwani, and N. Sasidhar, “A Distortion Compensating Flash Analog-to-Digital Conversion Technique," IEEE JSSC, vol. 41, no. 9, pp. 1959-1969, Sep. 2006.
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regenerate upon
make decision
BW)
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CMOS logic levels
mode (Φ = 1)
M6 M5 M7
Q+ Q-
Φ
Vi
+
Vi
M2 M3 M4
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M6 M5 M7 Φ Φ M8
Vi
+
Vi
M2 M3 M4
Q+ Q-
→ less short-circuit current
reset mode (Φ = 1)
regeneration
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M4 M3 Φ
Vi
+
Vi
M8 M5 M6 M1
Q+ Q-
M2 M9 M10 Φ Φ Φ
regeneration
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Φ
Vi
+
Vi
M8 M5 M6 M1
Q+ Q-
M2 M9 M10 Φ Φ Φ M4 M3
mode
“0”
regeneration
Ref: T. B. Cho and P. R. Gray, “A 10 b, 20 Msample/s, 35 mW pipeline A/D converter,” JSSC, vol. 30, pp. 166-172, issue 3, 1995.
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M1 M2 M5
Vi
+
M6
Vi
M3 M7 Φ M8 Φ Φ
RL RL Q+ Q-
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JSSC March 2000, pp. 318-25.
Vishal Saxena
Delta-Sigma Modulator for Audio Applications," IEEE JSSC, vol. 43, no. 2, pp. 351-360, Feb. 2008.
Vishal Saxena
Analog-to-Digital Conversion Technique," IEEE JSSC, vol. 41, no. 9, pp. 1959-1969, Sep. 2006. Pre-amp
Vishal Saxena
dB DR CT ΔΣ ADC Compensated for More Than One Cycle Excess Loop Delay," IEEE JSSC,
CML-Latch
Vishal Saxena
Vishal Saxena
Vishal Saxena
A 6-b 1.3-Gsample/s A/D Converter in 0.35-m CMOS IEEE JSSC, vol. 36, no. 12, Dec 2001.
Vishal Saxena
A 0.9-V 60-W 1-Bit Fourth-Order Delta-Sigma Modulator With 83-dB Dynamic Range IEEE JSSC, vol. 43, no. 2, Feb. 2008
Vishal Saxena
A 77-dB Dynamic Range, 7.5-MHz Hybrid Continuous-Time/Discrete-Time Cascaded ΔΣ Modulator, IEEE JSSC, vol. 43, no. 4, Apr 2008
Vishal Saxena
DR Consuming 16 mW, IEEE JSSC, vol. 39, no. 8, pp. 1341–1346, Aug. 2004.
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100-dB SFDR," IEEE JSSC, vol. 39, pp. 2139 - 2151, December 2004.
Vishal Saxena
80-MSample/s pipelined CMOS ADC," IEEE JSSC, vol. 38, pp. 2031 - 2039,
Vishal Saxena
µm digital CMOS Process using a nonlinear double interpolation technique," IEEE JSSC, vol. 37, pp. 1610 - 1617, Dec. 2002.
Vishal Saxena
S . Limotyrakis, S. D. Kulchycki, D. Su, and B. A. Wooley, "A 150MS/s 8b 71mW time-interleaved ADC in 0.18µm CMOS," proc. IEEE ISSCC, pp. 258 - 259, Feb 2004.
Vishal Saxena
Vishal Saxena
1.
Rudy van de Plassche, “CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters,” 2nd Ed., Springer, 2005.
2.
3.
4.