SLIDE 1 PVMD
Delft University of Technology
Recombination parameter J0
René van Swaaij
SLIDE 2 Learning objectives
- How is Voc related to saturation current density, J0,
and minority carrier lifetime?
- Relation between J0 and recombination
SLIDE 3 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
SLIDE 4 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
SLIDE 5 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
For:
SLIDE 6 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
For:
SLIDE 7 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
For:
SLIDE 8 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
For:
SLIDE 9 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
SLIDE 10 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
SLIDE 11 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
SLIDE 12 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
SLIDE 13 Recombination and Voc
EFn
Fn
EFp
Fp
eV eVoc
Voc depends on recombination rate
SLIDE 14
- Three recombination processes
+
Shockley- Read-Hall Radiative Auger
+
SLIDE 15
conduction band valence band EC EV x x = = 0, , surface tr trap states
Surface recombination
SLIDE 16
Total recombination rate p-type
W
SLIDE 17
Total recombination rate p-type
W
SLIDE 18
Total recombination rate p-type
W
SLIDE 19 Generation and recombination in thermal equilibrium
- Thermal generation equals thermal
recombination
SLIDE 20 Generation and recombination in thermal equilibrium
- Thermal generation equals thermal
recombination for any mechanism
SLIDE 21
Recombination rates in thermal equilibrium SRH Radiative Auger Surface
SLIDE 22
Recombination rates in thermal equilibrium SRH Radiative Auger Surface
SLIDE 23
Recombination parameter J0 SRH Radiative Auger Surface
SLIDE 24
Recombination parameter J0 SRH Radiative Auger Surface
SLIDE 25
Recombination parameter J0 SRH Radiative Auger Surface
SLIDE 26
Recombination parameter J0 SRH Radiative Auger Surface
SLIDE 27 Application J0 in analysis
Ag Ag Al
p++ p++
p-type sc Si n+ SiNx c-Si (200 – 300 μm)
SLIDE 28 Application J0 in analysis
Ag Ag Al
p++ p++
p-type sc Si n+ SiNx c-Si (200 – 300 μm)
J0,d
SLIDE 29 Application J0 in analysis
Ag Ag Al
p++ p++
p-type sc Si n+ SiNx c-Si (200 – 300 μm)
J0,d J0,Auger J0,SR
SRH
SLIDE 30 Application J0 in analysis
Ag Ag Al
p++ p++
p-type sc Si n+ SiNx c-Si (200 – 300 μm)
J0,d J0,Auger J0,s,fron
J0,SR
SRH
SLIDE 31 Summary
- Voc is related to saturation current density J0
SLIDE 32 Summary
- Voc is related to saturation current density J0
- Voc is related to lifetime recombination
processes
SLIDE 33 Summary
- Voc is related to saturation current density J0
- Voc is related to lifetime recombination
processes
- Recombination processes can be expressed in J0