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Adding Temporal Redundancy to Delay Insensitive Codes to Mitigate Single Event Effects Julian Pontes (FACIN-PUCRS) Pascal Vivet (CEA-LETI) Ney Calazans (FACIN-PUCRS) FACIN-PUCRS(Brazil) & LETI-CEA (France) Motivation Advanced Tech Nodes


  1. Adding Temporal Redundancy to Delay Insensitive Codes to Mitigate Single Event Effects Julian Pontes (FACIN-PUCRS) Pascal Vivet (CEA-LETI) Ney Calazans (FACIN-PUCRS) FACIN-PUCRS(Brazil) & LETI-CEA (France)

  2. Motivation • Advanced Tech Nodes Constraints – Signal Integrity and Process Variation • Solved at design time – Soft Errors • Not treated in standard flow • Soft Errors in Asynchronous – Timing Deviations • Almost immune except for forks – A bit flip in control may stall handshake ASYNC’ 12 Lyngby 2

  3. Our Objective “Take advantage of m -of-n DI Codes to add temporal redundancy, allowing to detect and (eventually) correct soft errors” ASYNC’ 12 Lyngby 3

  4. Outline • Related Work • SEE in QDI Pipelines Analysis • TRDIC Proposal • SEE Validation - Flow and Environment • Results • Conclusions and Ongoing Work ASYNC’ 12 Lyngby 4

  5. Related Work Asynchronous Design Hardening Techniques • Asynchronous x Synchronous (Asyncs are more robust!) – Bastos et al. (Microeletronics Reliability-2010) – Rahbaran and Steininger (IEEE Trans. on Dep. & Sec. Comp.-2009) • Standard-cell level (Resizing to improve roibustness) – Bastos et al. (IOLTS-2010) • Logic-level redundancy – Jang and Martin (ASYNC-2005) (Double-check, spatial redundancy) – Monet, Renaudin and Leveugle (IOLTS-05 ) (High area overhead or improved filtering capability) • Pipeline level (Various design techniques against glitches) – Bainbridge and Salisbury (ASYNC-2009) (no error correction, though) • New Delay Insensitive Codes (Hard to DI, due to validity det) – Agyekum and Nowick (DATE-2011) ASYNC’ 12 Lyngby 5

  6. Outline • Related Work • SEE in QDI Pipelines Analysis • TRDIC Proposal • SEE Validation - Flow and Environment • Results • Conclusions and Ongoing Work ASYNC’ 12 Lyngby 6

  7. SEE Physical Impact *       / / t t ( ) ( ) I t I e e 0 • Collection Time Constant of the Junction • Time Constant for Initially Establishing the Ion Track * - IBM experiments in soft fails in computer electronics(1978-1994) – 1996 ASYNC’ 12 Lyngby 7

  8. SEE in QDI Pipelines • QDI logic is almost immune to delay variations – Except for isochronic forks • Bit flip may cause – Stall in handshake protocol Ack In – Erroneous or invalid data DI0 DO0 C C C • Final effect depends on Output Data – Victim cell  Input Data DI1 DO1 C C C • Mostly C-elements – The 4-phase protocol step DI2 DO2 C C C affected • To understand  deeper DI3 DO3 C C C look into C-element behavior Ack Out ASYNC’ 12 Lyngby 8

  9. SEE in C-elements SEU 100 101 SET C 000 110 111 001 SEU 010 011 SET Charge to cause SEE (normalized to state 111) States  000 010 011 100 101 111 Charge  0.720 0.088 0.120 0.097 0.100 1.000 • C-element driving a capacitance of 8.1fF • Single Event Transients – States 000 and 111 are driving nodes • Single Event Upsets – Floating Nodes (the rest) – much less charge required ASYNC’ 12 Lyngby 9

  10. SEE in QDI Pipelines Individual Detection Detection Tree A0 A1 C B0 B1 Valid C C0 C1 C Ack D0 In D1 DI0 DO0 • Detection based on C- C C C element trees are almost Output Data Input Data DI1 DO1 C C C immune to soft errors – The last C-element in the DI2 DO2 C C C tree is dangerous • Protocol SEE and timing DI3 DO3 C C C analysis consider – data link errors only Ack Out ASYNC’ 12 Lyngby 10

  11. 1-of-n Pipeline Ack Spacer Ack Timing Data Delay Data Delay Delay Delay Delay Input Spacer Data Spacer Data Ack In Ack DI0 DO0 C C C In DI1 DO1 C C C SEU ↑ SET ↑ Possible DI2 DO2 SEU ↑ SET ↑ SEU ↑ C C C SEE SET ↓ SEU ↓ DI3 DO3 C C C ICD ICD Output VCD or Or UD VCD Data Ack ES US Out VCD = Valid Corrupted Data ICD = Invalid Corrupted Data US = Unexpected Spacer ES = Early Spacer UD = Unexpected Data Data link always in an excited state • 1-bit distance between data and spacer ASYNC’ 12 Lyngby 11

  12. m-of-n QDI Pipeline (m>1) Worst Case Data Delay Worst Case Spacer Delay Timing Best Case Ack Best Case Ack Data Skew Spacer Skew Data Delay Delay Spacer Delay Delay Input Spacer ID ID* Data Data Ack SEU ↑ SEU ↑ SEU ↑ SEU ↓ SEU ↓ Possible SET ↑ SEE SET ↓ SET ↓ SET ↑ SET ↑ ICD Output ID VCD ICD or ID ES ID or Individual Data A2 A1 A0 ID Detection • Encoding has SEE filtering C properties valid C • Detection is more complex  2-of-3 C example besides • Higher code density (for 1<m<(n-1)) ASYNC’ 12 Lyngby 12

  13. SEE QDI Timing Analysis • Effect depends on the window where SEE happens • Adding timing constraints may eliminate possibility of Valid Corrupted Data (VCD), verifiable by STA • Stall probability depends on sender-receiver performance relationship ASYNC’ 12 Lyngby 13

  14. Outline • Related Work • SEE in QDI Pipelines Analysis • TRDIC Proposal • SEE Validation - Flow and Environment • Results • Conclusions and Ongoing Work ASYNC’ 12 Lyngby 14

  15. TRDIC: Temporal Redundancy in DI Codes • Principle – Convert 1-of-n code into 2-of-(n+1) code • A more robust code – Encode current data with 1-of-n Data 2-of-(n+1) TRDIC previous data Sender Encoder • It is as if we sent every datum twice QDI Data – Double check & correction Link at the receiver side Data TRDIC Receiver Decoder 2-of-(n+1) 1-of-n • Advantages – Increase SEE robustness by adding redundancy – Preserve performance by keeping token throughput – Good for intrachip communication architectures ASYNC’ 12 Lyngby 15

  16. TRDIC: Encoding Method Data[i-1] Data[i] Data[i] Data[i-1] 2-of-5 TRDIC Encoding 00011 00101 0001 0001 0010 0010 00110 0001 0100 0100 0100 01001 1000 1000 01010 01100 0001 0001 10001 0010 0010 0010 1000 10010 0100 0100 1000 1000 10100 11000 • Conversion done simply by ORing of consecutive codewords • MSB of TRDIC indicates if consecutive codewords are equal (1) or not (0) ASYNC’ 12 Lyngby 16

  17. TRDIC Converters 1-of-n Data 2-of-(n+1) TRDIC Sender Encoder QDI Data Link Data TRDIC Receiver Decoder 2-of-(n+1) 1-of-n ASYNC’ 12 Lyngby 17

  18. TRDIC Double-Check Decoder • Can solve just Invalid Corrupted Data (ICD) errors (2-stage trellis) – More common situation in 2-of-n codes • A more complex trellis-based decoder increases error detection and correction capabilities • Assume 0001 followed by 0010 • Encoder outputs 10001 (assumed) and next 00011 • Decoder obtains 0001. Next data must contain 00010. If not, error detected or corrected! Data Expected Data C C C C C D4 D3 D2 D1 D0 Decoded Data ASYNC’ 12 Lyngby 18

  19. TRDIC 3-stage Trellis Decoding 00110 01100 00011 0 1 00011 00011 00011 0 00101 00101 00101 2 1 00110 00110 00110 01001 01001 01001 3 01010 01010 01010 3 01100 01100 01100 10001 10001 10001 1 10010 10010 10010 2 10100 10100 10100 11000 11000 11000 ASYNC’ 12 Lyngby 19

  20. Outline • Related Work • SEE in QDI Pipelines Analysis • TRDIC Proposal • SEE Validation - Flow and Environment • Results • Conclusions and Ongoing Work ASYNC’ 12 Lyngby 20

  21. SEE Validation Flow [Pontes, Vivet , Calazans, DATE’12] An accurate SEE digital flow • Based on SEE Std. Cell characterization – For all cells, including C-elements • Pipeline Timing Annotation include SEE glitches & delays • Pipeline Attack using fault simulator • Using std-tools & formats (Verilog netlist, SDF back-annotation, liberty .lib format) ASYNC’ 12 Lyngby 21

  22. SEE Validation Environment • Design Flow SEE Characterization – Implementation using Fault Generator Environment SEE BUS[n:0] pseudo-synchronous technique (dummy rst clk) [Thonnart, Beigné, Vivet ASYNC’12] C – SEE Characterization & Data TestCase C Checker Simulation Environment C C – Attack on pipeline components • Study of various QDI pipelines – 1-of-4 – 2-of-5 – 2-of-5 TRDIC (without encoder/decoder) • Technology – STMicroelectronics, LP CMOS, 32nm ASYNC’ 12 Lyngby 22

  23. Outline • Related Work • SEE in QDI Pipelines Analysis • TRDIC Proposal • SEE Validation - Flow and Environment • Results • Conclusions and Ongoing Work ASYNC’ 12 Lyngby 23

  24. SEE Fault Simulation Results (1/2) • Failure x SEE Injection Rate – SEE Injection Charge = 175fC 3500 1-of-4 3000 2-of-5 Failures in Time (x1000 Failures/second) TRDIC 2-of-5 2500 2000 1500 1000 500 0 100 200 400 500 700 800 1000 Single Event Effect Interval (ns) ASYNC’ 12 Lyngby 24

  25. SEE Fault Simulation Results (2/2) • Failure x SEE Injection Charge – SEE Rate = 5*10 6 SEEs/second 700 600 Failure in Time(x1000 500 Failures/second) 1-of-4 400 2-of-5 TRDIC 2-of-5 300 200 100 0 30 50 70 100 130 160 175 190 210 500 800 1000 1500 Injected Charge (fC) ASYNC’ 12 Lyngby 25

  26. Results (16 stages, 32-bit WCHB pipeline) Area Asynchronous Cells Combinational Cells Total 1-of-4 1264/1919.7 482/1007.7 1746/2927.4 2-of-5 4080/6120.3 1280/2142.0 5226/8338.0 Power Leakage ( μW ) Dynamic ( μW ) Total ( μW ) 1-of-4 134.7 2578.8 2713.5 2-of-5 317.4 5335.4 5652.8 Performance Code Maximum Throughput (Gbits/sec) Latency (ns) 1-of-4 40.80 1.2125 2-of-5 32.52 1.3685 ASYNC’ 12 Lyngby 26

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