CMOS-oriented EDA Infrastructure Xiang Qiu, Malgorzata - - PowerPoint PPT Presentation
CMOS-oriented EDA Infrastructure Xiang Qiu, Malgorzata - - PowerPoint PPT Presentation
Designing VeSFET-based ICs with CMOS-oriented EDA Infrastructure Xiang Qiu, Malgorzata Marek-Sadowska University of California, Santa Barbara Wojciech Maly Carnegie Mellon University Outline Introduction Chain Canvas Standard cell
Outline
Introduction Chain Canvas Standard cell based physical design flow Chain Canvas Vs. Basic Canvas Conclusions
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Introduction
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Semiconductor markets are dominated by
ASICs: high NRE cost, high performance, high volume. FPGAs: low NRE cost, low performance, small volume
Medium volume?
VeSFET-based ASICs may fill the gap between ASICs and
- FPGAs. [1][2]
New technology huge efforts on design automation infrastructure. Can we re-use CMOS EDA infrastructure for VeSFET- based designs?
We focus on physical design flow in this talk.
[1] W. Maly, et. al, “Complementary Vertical Slit Field Effect Transistors,” CMU, CSSI Tech-Report , 2008. [2] Y.-W. Lin, M. Marek-Sadowska, W. Maly, A. Pfitzner, and D. Kasprowicz, “Is there always performance overhead for regular canvas?” in Proceedings of ICCD’08, pp. 557-562, 2008.
Vertical Slit Field Effect Transistor
3D twin-gate transistor[1]
easy fabrication with SOI-like process
Excellent electrical characteristics[2]
huge Ion/Ioff: 1e9 low DIBL: 13mV/V near ideal subthreshold swing: 65mV/decade low gate capacitance
r=50nm h=200nm tox=4nm Nsub= 4e17/cm3
[1]. W. Maly, et. al, “Complementary Vertical Slit Field Effect Transistors,” CMU, CSSI Tech-Report , 2008. [2]. W. Maly, et. al, “Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration,” in Proc. of MIXDES’11, pp.145-150, 2011.
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VeSFET Structure[1]
65nm VeSFET
VeSFET based-IC Paradigm
Regular layout patterns
Canvases: geometrically identical VeSFETs arrays
The same radius r and height h
Circuits are customized by interconnects
Strictly parallel wires Diagonal (45- or 135-degree) wires
Advanced layout style: pillar sharing
A A A A B B B B VDD GND O O O VDD n1 n1
2-input NAND basic canvas 5 shared pillars
Chain Canvases
Transistors are rotated by 45 degrees Each pillar is shared by two transistors
Transistors are chained 2X transistor density
The same interconnect design rules
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Transistor Isolation
Some contacted transistors are unwanted. Isolation
Physical Electrical
Apply cut-off voltage Short drain and source
Wasted area!
7 A 1 2 B 3 4 T1 T2 X/X 3 2 Tp
DP X X B A B A 1 1 1
T1 T2 Tp A A B B X X 1 2 3
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A A B B 1 2 3
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Static CMOS-like Standard Cell Generation
CMOS-like layout patterns
aligned gate pillars connected by wires aligned poly gates shared drain/source pillars diffusion abutment
CMOS cell generation algorithms can be reused.
8 A B O gnd vdd A A A B B B O O vdd vdd gnd gnd gnd gnd vdd vdd vdd 2-input NAND
Static CMOS-like Standard Cell Generation
Transistor isolation Diffusion break Sizing by transistor duplication
Transistor size
=> effective transistor density
Vs. Basic Canvas cells
easier cell generation shorter wires
CMOS diffusion break VeSFET transistor isolation A B O O vdd vdd gnd A B O gnd A B A B O vdd vdd A B vdd vdd vdd gnd gnd gnd 9 2-input NANDX2
Similar to CMOS standard cell placement. Neighboring rows share power/ground lines. Power/ground lines are also for transistor isolation.
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Row-based Standard Cell Placement
N/FN S/FS shared power line shared ground line shared ground line
Inter-cell Routing
Two disjoint routing grids
Vias aligned with pillars: D/S pillars cannot connect to G pillars
by only H/V wires
Jumper wires: diagonal wires bridging D/S- and G-grids.
Most inter-cell nets have both D/S pins and G pins.
Routing each single net
- n both grids may need
multi layers of jumper wires
Route each net on only
- ne grid, only one layer
- f jumper wires
Greedy net partitioning
Balance routing demands Balance pin density.
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Jumper wires
Cell Level Comparison
Design INV, BUF, NAND2, NOR2, AOI21, OAI21 on both canvases Design 1X, 2X, 4X cells for each logic More pillar sharing more area saving
Greater gate size More gate inputs
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CELL Basic Canvas Chain Canvas 1X 2X 4X 1X 2X 4X INV 8 16 32 12 18 30 BUF 16 32 64 18 30 54 NAND2 16 32 64 18 30 54 NOR2 16 32 64 18 30 54 AOI21 24 48 96 24 40 72 OAI21 24 48 96 24 40 72 AVG 1 1 1 1.15 0.93 0.83
Table 1. # of pillars occupied by cells mapped on BC and CC
Cell Level Comparison (Cont.)
Chain canvas
shorter wires fewer vias gate size , improvement
0.2 0.4 0.6 0.8 1 1.2 1X 2X 4X basic canvas chain canvas Average intra-cell wire length 0.2 0.4 0.6 0.8 1 1.2 1X 2X 4X basic canvas chain canvas Average intra-cell via count 13
Cell Level Comparison (Cont.)
Performance and power comparison
Smaller parasitic RC for CC-based cells. Determine the frequency and power delay product (PDP) of a 5-
stage ring oscillator.
0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1X 2X 4X basic canvas chain canvas Average RO frequency Average RO PDP 0.2 0.4 0.6 0.8 1 1.2 1X 2X 4X basic canvas chain canvas 14
Circuit Level Comparison
LGSynth91 benchmarks with thousands of gates
Mapped with a library of 6 1X cells(INV, BUF, NAND2, NOR2,
AOI21, OAI21).
CC-G: G-grid only routing CC-G/DS: nets evenly spread on both grids.
0.6 0.7 0.8 0.9 1 1.1 1.2 area wire length # VIAs BC CC-G CC-G/DS 1 2 3 4 5 6 7 8 # metal layers 15
Circuit Level Comparison (Cont.)
Static timing analysis
non-linear delay model for each cell. parasitic inter-cell interconnect RC extracted by Star-RC.
Power estimation
Total interconnect capacitance
0.6 0.65 0.7 0.75 0.8 0.85 0.9 0.95 1 longest path delay total interconnect capacitance BC CC-G CC-G/DS 16
Conclusions
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We propose chain canvases,
CMOS ASIC EDA infrastructure re-usable. 2X transistor density. Transistor isolation reduces transistor utilization. Transistor utilization improves as gate size increases.
Chain canvases Vs. Basic Canvases
Easier cell generation better routability smaller parasitic capacitance better performance lower power consumption slightly greater footprint area using unit size gates
Q & A
Thank you!
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