Two-Dimensional van der Waals Materials Based Nonvolatile Memory Field-Effect Transistors
Do Kyung Hwang Center for Opto-Electronic Materials and Devices, Korea Institute of Science and Technology (KIST) dkhwang@kist.re.kr
Two-Dimensional van der Waals Materials Based Nonvolatile Memory - - PowerPoint PPT Presentation
Two-Dimensional van der Waals Materials Based Nonvolatile Memory Field-Effect Transistors Do Kyung Hwang Center for Opto-Electronic Materials and Devices, Korea Institute of Science and Technology (KIST) dkhwang@kist.re.kr 2-D van der Waals
Do Kyung Hwang Center for Opto-Electronic Materials and Devices, Korea Institute of Science and Technology (KIST) dkhwang@kist.re.kr
2
M X Ti, Hf, Zr S, Se, Te V, Nb, Ta Mo, W Tc, Re Pd, Pt
Why 2D vdWs Nanosheets ?
8, 497 (2013)
5, 9934 (2011)
MoS2 FeFETs BP FeFETs
VD
Load RExt (10 MΩ)
VIN VOUT BFM 02
inverter circuit
Au top gate
P(VDF-TrFE) (220 nm)
MoS2 nanoflake Graphene Source Graphene Drain
SiO2 (285 nm) / p+-Si
C C F F H H
C C F F F H
70 30
P(VDF-TrFE) copolymer
15 um
Gr Gr Au/Ti Au/Ti
MoS2 (W/L: ~ 0.5)
4
x-axis y-axis
5um
Gr1 Gr2
MoS2 Au /Ti Au /Ti
SiO2/p+Si
(a) (b)
E0 qХMoS2
(= 4.0eV)
EC EF EV
0.3eV
qФGr (= 4.5eV) i qФMoS2
(= 4.3eV)
E0 EC EF EV
i n
qФSB,Gr < EC-EF+∆qФ
∆qФ = qФGr-qФMoS2 qФMoS2
(= 4.3eV)
qФGr
(= 4.5eV)
10 20 30 40 50 10
10
10
10
10
10
10
10
10
10
10
Gate Voltage (V) Drain Current (A)
Au/Ti SD electrode Graphene SD electrode
0.0 0.5 1.0
5 10 15
5 10 15
Drain Voltage (V) Drain Current (µA)
Au/Ti SD electrode Graphene SD electrode
VD (V) ID(µA)
VD = 1V VG = -50~50, 10V step IG
(a) (c)
0.0 0.5 1.0
5 10 15 20
5 10 15 20
Drain Voltage (V) Drain Current (µA)
Au/Ti SD electrode Graphene SD electrode
10 20 30 40 50 10
10
10
10
10
10
10
10
10
10
10
Au/Ti SD electrode Graphene SD electrode
Gate Voltage (V) Drain Current (A)
ID(µA) VD (V)
(b) (d)
VD = 1V VG = -50~50, 10V step IG
Graphene S/D electrode: superior ohmic or ON/OFF current behavior to those of Au/Ti due to modulated work function according to applied gate bias
5
Au top gate
P(VDF-TrFE) (220 nm)
MoS2 nanoflake Graphene Source Graphene Drain
SiO2 (285 nm) / p+-Si
[ ]
C C F F H H
[ ]
C C F F F H
70 30
P(VDF-TrFE) copolymer
15 um
Gr Gr Au/Ti Au/Ti
MoS2 (W/L: ~ 0.5)
1 2 3 4 5 6 7 8 9 10 10
10
10
10
10
10
Drain Current (A)
Time (min)
Erase Program
0V
1s Read
Floating gate
1s +20V 0V Read
Floating gate
VD=0.1 V
10 20 30 40 50 60 10
10
10
10
10 20
ID (A)
Time (s)
VG Pulse (V)
Erase Program VD=0.1 V
+ 18.7V, 1 s (Program)
0 V, 4 s (read)
10 20 10
10
10
10
10
10
10
10
10
10
10
Linear Mobility (cm
2V
Drain Current (A)
Gate Voltage (V)
30 60 90 120 150 180 210
VD=1.0 V
175 cm2/Vs
Erase Program
1s +20V 0V 0V
1s
MoS2 FeFET : Highest mobility of 175 cm2/V s , memory window > 15 V, proper dynamic and retention properties
6
10 20 10
10
10
10
10
VG (V)
VD = -0.1 V
Program Erase 1s +20V 0V 0V
1s
VG VD
1 10 100 1000 10
10
10
10
10
Time (s)
0V
1s Read
Floating gate
VD = -0.1 V
1s +20V 0V Read Program Erase
Floating gate
10 20 20 40 60 80 100 120 140
µ
lin (cm 2V
VG (V)
VD = -0.1 V BFM 01
131 cm2V-1s-1
Memory window : 15 V Memory on-off : 106 Mobility : 131 cm2/Vs
7
VDD
Load RExt (10 MΩ)
VIN VOUT BFM 02
W/L: ~0.55 W/L: ~1.06 3rd BP flake MoS2 flake Common gate
VDD = -0.1 V
VIN VOUT VDD
RExt 10 MΩ BFM 02
Program Erase 1s +20V 0V 0V
1s
BFM 02
15 V
1 10 100 1000 0.00 0.02 0.04 0.06 0.08 0.10 0.12
Time (s)
0V
1s Read
Floating gate
Program Erase 1s +20V 0V Read
Floating gate
VDD = -0.1 V BFM 02
10 20 10
10
10
10
10
10
VBG=0 V VBG=5 V VBG=10 V VBG=15 V VBG=20 V
Abs(ID) (A) VTG (V)
VD = ±0.1 V
BFM 03 MFM 03
10 20 0.00 0.02 0.04 0.06 0.08 0.10 0.12
VOUT (V) VIN (V)
Program Erase 1s +20V 0V 0V
1s
VBG=20 V, VDD = 0.1 V
VDD VOUT BFM 03 MFM VBG GND VIN100 200 300 400 0.00 0.02 0.04 0.06 0.08 0.10 0.12 Time (s)
VOUT (V)
0V
1s Read
VIN : Floating
Program Erase 1s +20V 0V Read
VIN : Floating
VBG=20 V, VDD = 0.1 V
2 4 6 8 10 Height (nm) 0.0 0.4 0.8 1.2 1.6 2.0 4 8 12 16 Distance (µm) Height (nm)
~ 7.2 nm ~ 12.5 nm
BP MoS2
8
We demonstrate the high performance MoS2 based nonvolatile memory transistors
High performance, clear memory window, proper dynamic and retention properties Papers: Y. T. Lee et al. Small 10, 2356 (2014) and J. Korean Phys. Soc Inpress (2015)
We also demonstrate few-layered BP-based nonvolatile memory transistors and more advanced memory circuits.
Unit device, resistive-load inverter, and CMOS inverter combined with MoS2 Paper: Y. T. Lee et al. ACS Nano DOI: 10.1021/acsnano.5b04592 (2015)