The application of nuclear methods RBS, PIXE in studies of subsurface - - PowerPoint PPT Presentation

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The application of nuclear methods RBS, PIXE in studies of subsurface - - PowerPoint PPT Presentation

May 16, 2023 12 likes •196 views

The application of nuclear methods RBS, PIXE in studies of subsurface layers of the solid state The application of nuclear methods in the study of multilayer systems Michalina Choszcz Faculty of Technical Physics and Mathematics Gdask

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The application of nuclear methods RBS, PIXE in studies of subsurface layers of the solid state The application of nuclear methods in the study of multilayer systems

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Michalina Choszcz

Faculty of Technical Physics and Mathematics Gdańsk University of Technology

Maciej Mikosza

Faculty of Fundamental Problems of Technics Wrocław University of Technology

SUPERVISOR: dr Mirosław Kulik

Frank Laboratory of Neutron Physics JINR Dubna

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 Van de Graaff accelerator  Rutherford Backscattering Spectrometry

(RBS)

 Elastic Recoil Detection (ERD)  Nuclear ReactionsAnalysis (NRA)

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http://neutron.ujf.cas.cz/vdg/graaff-principle.html

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https://www.hzdr.de/db/Cms?pOid=29856&pNid=3537

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http://gui-matrixlab.blogspot.ru/2012/10/rbs-rutherford-backscattering.html

= + = +

k=

  • Θ – scattering angle
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minerva.union.edu/labrakes/RBS%20Physics%20300%20S12.ppt

Partial RBS spectrum:

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200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000 1100

Yield(counts) channel simulated experimental Osurface Sisubstrate Silayers Tisurface and layers

E=2297.00keV

 =135

E(channel)=offset+energy per channel*channel Yield=σ(θ,E) D Nt dΩ

σ(θ,E) – Rutherford cross-section D – number of incident ions Nt – concentration of target nucleons dΩ – solid angle of the detector

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500 1000 1500 2000 2500 2000 4000 6000 8000 10000 12000 14000 16000

Yield(counts) Energy (keV) simulated experimental Csurface Osurface Sisubstrate Alsurface Cusurface

E = 2297.00keV

° °

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Yield(counts) Energy (keV) simulated experimental Cusurface

We find small amount of Cu atoms

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https://www.hzdr.de/db/Cms?pOid=29856&pNid=3537

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http://america.pink/elastic-recoil-detection_1398816.html

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500 1000 1500 2000 2500 500 1000 1500 2000 2500 3000 3500 4000 4500 5000

Yield(counts) Energy (keV) simulated experimental Osurface and layer Sisubstrate Ag Insurface

E 2297.00 keV

° °

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Yield (counts) Energy (keV) simulated experimental Hsurface and layers D E = 2297.00 keV

° °

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https://www.hzdr.de/db/Cms?pOid=29856&pNid=3537

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1000 1500 2000 2500 5000 10000 15000 20000 25000

Yield (counts) Energy(keV) simulated experimental Osurface Sisubstrate and layers Tilayers and surface

EkeV

° °

Depth Profile:

All the simulations were performed using SIMNRA developed by Matej Mayer

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 Using RBS we can determine concentration

and depth distribution of elements in the material

 We can use ERD to obtain concentration of H

  • r D in the material

 We can use NRA to detect light elments

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