PVMD Arno Smets Delft University of Technology Learning objectives - - PowerPoint PPT Presentation

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PVMD Arno Smets Delft University of Technology Learning objectives - - PowerPoint PPT Presentation

Mar 05, 2024 686 likes •840 views

Yablonovitch limit PVMD Arno Smets Delft University of Technology Learning objectives How is absorption enhancement limit derived What assumptions underlie this limit Absorption enhancement in a c-Si solar cell Enhancement by

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PVMD

Delft University of Technology

Yablonovitch limit

Arno Smets

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Learning objectives

  • How is absorption enhancement limit derived
  • What assumptions underlie this limit
  • Absorption enhancement in a c-Si solar cell
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Enhancement by texturing

Air Silicon

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Enhancement by texturing

Air Silicon

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Enhancement by texturing

L R Air Silicon

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Enhancement by texturing

L R R Air Silicon

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Enhancement by texturing and back reflector

Air Silicon

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Enhancement by texturing and back reflector

Air Silicon

L* R*

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Enhancement by texturing and back reflector

L* R* R*

Air Silicon

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Assumptions theoretical limit

Assumptions: Anti reflection coating

(implementing surface nano-texture)

Scattering at textured interfaces

(decoupling front- and backside texture morphologies)

Back reflector

(replacing metallic back reflector with dielectric back reflector)

  • Rfront =0
  • Rback =1
  • Lambertian

scattering

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0.0 0.2 0.4 0.6 0.8 1.0 DBR Ag 600 800 1000 1200 400 TDBR AAg

JPH TDBR = 0.54 mA/cm

2

JPH AAg = 0.40 mA/cm

2

ASi Wavelength (nm)

Enhancement c-Si solar cell

Bulk c-Si

Thermal SiO2

2 µm Front nano-texture 20 μm 2 µm

Back micro-texture

1.28 μm DBR

  • A. Ingenito, O. Isabella, M. Zeman, ACS Photonics , 1, 270−278 (2014) TU Delft

600 800 1000 1200 400

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Enhancement c-Si solar cell in practice

190 µm

  • A. Ingenito, O. Isabella, M. Zeman, SOLMAT 123, 17-29, 2014. (TU Delft)

Wavelength [nm]

400 500 600 700 800 900 1000 1100 1200

R, Absorptance, Losses [-]

0.0 0.2 0.4 0.6 0.8 1.0 R (3.60 mA/cm2) Emitter (3.81 mA/cm2) Al-BSF (0.06 mA/cm2) Si-Al (4.31 mA/cm2) Bulk (32.65 mA/cm2) Simulated EQE (34.68 mA/cm2) Measured EQE (34.71 mA/cm2)

Wavelength (nm) R, Absorptance, Losses (-)

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Wavelength [nm]

400 500 600 700 800 900 1000 1100 1200

R, Absorptance, Losses [-]

0.0 0.2 0.4 0.6 0.8 1.0 R (3.60 mA/cm2) Emitter (3.81 mA/cm2) Al-BSF (0.06 mA/cm2) Si-Al (4.31 mA/cm2) Bulk (32.65 mA/cm2) Simulated EQE (34.68 mA/cm2) Measured EQE (34.71 mA/cm2)

Wavelength (nm) R, Absorptance, Losses (-) L R R Air Silicon

Assumptions:

  • Rfront

=0

  • Lambertian scattering
  • Rback

=1

L* R* R* Air Silicon