Happy birthday PL Imaging!
SPREE Seminar – 15 December 2016
Happy birthday PL Imaging! SPREE Seminar 15 December 2016 Contents - - PowerPoint PPT Presentation
Happy birthday PL Imaging! SPREE Seminar 15 December 2016 Contents The importance of good upbringing Born in AUS, a healthy baby! Baby step, finding your place in the world. Now an adolescent, knowing it all. -
SPREE Seminar – 15 December 2016
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Green, 19th European Photovoltaic Solar Energy Conference, Paris, France, June 2004.
1E12 1E13 1E14 10 20 30 40 50 60 70
Effective Lifetime / s Excess Carrier Concentrationn / cm
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100 200 300 400 500 50W PC with sub band gap illumination PL 250W PC Apparent Lifetime / s Excess Carrier Concentration / cm
“Hi Martin, Rob and I plan to expand our experimental work on QSS-PL to PL imaging. We would need ~ $ 50,000 to set up a proof of concept system. TT” “Hi Thorsten, that sounds promising, I am happy to support characterisation work at UNSW, pls get the account number from Jenny on Monday. More funding available for this if required. MAG”
Mid 2005: First PL imaging prototype in EE building, LG 24.
group for routine daily process monitoring 2005: Qualitative PL imaging
2006: Calibrated minority carrier lifetime images Carrier Density Image (CDI) PL imaging
imaging of silicon wafers, Appl.Phys.Lett. 89, 044107 (2006).
Rob Thorsten 26 Jul 2006 9.00am LG24 UNSW Australia The first PL image 1 Mpixel 1s
(Resolution) (Acquisition time)
2006: c-Si workshop, Denver EL image PL image PL image with current extraction
Why do Rs variations within a cell show up in luminescence images?
voltage
extraction Low PL intensity High relative PL intensity
2007: Quantitative Rs imaging
What the heck …?” “Voltage independent carriers”
2016: Voltage independent carriers
continuity equation:
Mattias Juhl, manuscript submittted
Applied voltage in the dark Illumination with lexc=1100nm Illumination with lexc=1100nm, external SC
Excess carrier profile under illumination at SC is present at all bias conditions
2016: Voltage independent carriers
Poster by Mattias Juhl at this workshop! First order correction by subtracting PLsc from PL at other bias conditions.
From 2007:
ISAS/JAXA…
Late 2007:
2006)
industry.
2011: Line scanning PL imaging
2011: Line scanning PL imaging
As cut wafer inspection
automatic image processing. Dislocations Impure edges
As cut wafer inspection
As cut wafer inspection
2009: Brick inspection
0.1 1 10 100 1000
Brick d=200 m Wafer
non-linear.
2007: PL Intensity ratio (PLIR) method
Diffusion Lengths of Silicon Solar Cells from Luminescence Images, J.Appl.Phys. 101, 123110 (2007).
depending on the depth from the surface!
2009: Brick inspection
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2011: Bulk lifetime imaging from PLIR
2011: Bulk lifetime imaging from PLIR
Spring meeting 2016, Phoenix, USA, March 2016
LG25 in the TETB building New playground for the PL group…
2006: c-Si workshop, Denver EL image PL image PL image with current extraction
Solar cell with local Rs issues Enhanced contact resistance Some broken fingers
Line can PL imaging on cells
Griddler1 simulation
1 J. Wong
Metallization Patterns, 39th IEEE Photovoltaic Specialists Conference, Tampa, USA (2013). All Griddler ddler simulati ations
by Iskra Zafir irovs vska
Line scan PL imaging on cells
Griddler1 simulation
1 J. Wong
Metallization Patterns, 39th IEEE Photovoltaic Specialists Conference, Tampa, USA (2013). All Griddler ddler simulati ations
by Iskra Zafir irovs vska
Line can PL imaging on cells
Note: this simulations represents just one snapshot in time from the line scanning PL imaging acquisition series.
Line can PL imaging on cells
Line can PL imaging on cells
Line can PL imaging on cells
Line can PL imaging on cells
Line can PL imaging on cells Inline PL image Automatic Image algorithms iLS-C3 PL module
PL imaging on modules
I.Zafirovska, J.Weber, O.Kunz, T.Trupke, Module inspection using line scanning photoluminescence imaging, presented at EU PVSEC, Munich, June 2016.
Prototype of line scanning PL imaging system
Prototype of line scanning PL imaging system
Prototype of line scanning PL imaging system
Superior image quality Fast Contactless – on the fly acquisition Quantitative analysis Cracks Finger breaks Defect analysis … PL images under various operating conditions Outdoor PL imaging
Line can PL imaging on modules
The mother of lifetime systems: TIDLS
Courtes esy of
iri
Temperature dependent lifetime
Courtes esy of
lory Jensen
Temperature dependent PL imaging
mirror device (DMD) for illumination
non-uniform illumination
applications!
Courtes esy of
iri
0.25 eV 0.22 eV EC -
Front detection PL, application to fully metalised cells
87, 093503 (2005).
PL imaging on Perovskites
Ziv Hameiri, Arman M. Soufiani et al., Photoluminescence and electroluminescence imaging of perovskite solar cells, Prog.Photov. 23, 1697 (2015).
Front detection PL, application to fully metalized cells
Courtes esy of
rell, PhD candid didat ate at at UNSW
Front detection PL, application to fully metalized cells
Courtes esy of
rell, PhD candid didate at at UNSW
Co Cour urtesy of
rell, PhD PhD candida didate at at UNSW
PL imaging with non-uniform illumination
mirror device (DMD) for illumination
non-uniform illumination
Courtes esy of
idate at at UNSW
PL imaging with variable illumination wavelengths
different illumination wavelengths.
Courtes esy of
utho hol, PhD candid didat ate at at UNSW