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Characterization of Parylene-C Thin Films as an Encapsulation for Neural Interfaces Hsu, Jui-Mei 1 ; Kammer, Sascha 2 ; Jung, Erik 3 ; Rieth, Loren 4 ; Normann, Richard 5 ; Solzbacher, Florian 1,4,5 1 Materials Science and Engineering - University


slide-1
SLIDE 1
  • L. Rieth

Characterization of Parylene-C Thin Films as an Encapsulation for Neural Interfaces

Hsu, Jui-Mei1; Kammer, Sascha2; Jung, Erik3; Rieth, Loren4; Normann, Richard5; Solzbacher, Florian1,4,5

1 Materials Science and Engineering - University of Utah 2 IBMT - Fraunhofer Institute 3 IZM - Fraunhofer Institute 4 Electrical and Computer Engineering - University of Utah 5 Bioengineering - University of Utah

slide-2
SLIDE 2

Characterization of Parylene-C 2

  • L. Rieth

Microsystems Group

Wireless Biomedical Devices Gas sensors on microhotplates Materials for harsh environment electronis Neuroprosthetics Glucose monitoring Harsh-environment MEMS and electronics

slide-3
SLIDE 3

Characterization of Parylene-C 3

  • L. Rieth

Introduction

slide-4
SLIDE 4

Characterization of Parylene-C 4

  • L. Rieth

Introduction

  • Wireless Neural Interface Devices

– Record or stimulate neural action potentials – AuSn flip-chip integration – Inductive power and forward telemetry

  • 5 mm width; electroplated Au on polyimide; 2.67 MHz

– INI3 custom signal processor

  • 1000x gain; tuned to neural frequencies; < 10 mW power; FSK

transmitter

– Utah Electrode Array (UEA)

  • 10 x 10 array of electrodes; central and peripheral nervous

system designs

– Encapsulation

  • Electrical isolation; conformality; hermetic; biocompatibility
slide-5
SLIDE 5

Characterization of Parylene-C 5

  • L. Rieth

Introduction

  • Neuroprosthetics device research:

– Encapsulation: Parylene-C; a-SiC:H; silicone – Electrode metallization

  • IrOx by reactive sputter deposition or

“activation” of metallic Ir

  • Improve charge injection

– Wafer level processing

  • Electrode etching
  • Tip deinsulation

– Flip-chip integration

  • UEA to ASIC integration
  • Hermetic seals
  • Lid concept

– Thin film pancake coils

  • Optimized designs
  • Maximum power transfer

– GLP/GMP fabrication

  • 1.E+07
  • 5.E+06

0.E+00 5.E+06 1.E+07 2.E+07

  • 1
  • 0.5

0.5 1 V vs Ag/AgCl (V)

Sputtered Activated

slide-6
SLIDE 6

Characterization of Parylene-C 6

  • L. Rieth

Introduction

  • Revolutionizing Prosthetics

– Develop a bionic arm – Wireless neural interface devices implanted in peripheral nerves – Read and decode muscle control signals to control the robotic limb – Stimulate neural signals for sensory feedback

  • Temperature; force; slip
  • Requires wireless stimulating neural interface
  • Ability to code sensor output for nervous

system

– Neural interface must be robustly packaged for practical use

slide-7
SLIDE 7

Characterization of Parylene-C 7

  • L. Rieth

Introduction

  • Microfabrication lab

– ~ 6000 ft2 facility with both cleanroom and lab space – Photolithography – Film deposition (PVD; CVD; Epitaxy) – Micromachining – RIE and DRIE – Diffusion doping – Annealing furnaces

  • Surface analysis lab

– Kratos Axis UltraDLD XPS/AES – Optical Profilometer – AFM – VASE – FEI field-emission ESEM

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SLIDE 8

Characterization of Parylene-C 8

  • L. Rieth

Experimental Methods

  • Parylene-C Deposition:

– Substrates: c-Si; borosilicate glass (BSG) – Adhesion promoter: Silquest A-174 – Chemical Vapor Deposition - Gorham Process – Constant vaporizer pressure: ~0.03 g/min – Dimer pyrolysis: 670 °C – Room temperature substrates – Film thickness: ~3 µm

  • < -70˚C

~ 25˚C 550–690˚C 120–170˚C < 10mTorr

CH2 H2C

n

Cl

slide-9
SLIDE 9

Characterization of Parylene-C 9

  • L. Rieth

Experimental Methods

  • Film characterization methods

– Adhesion testing - Tape test ASTM D3359B

  • 10 x 10 grid of cuts in Parylene film (1 mm pitch)
  • Scotch tape (#810 by 3M)

– Heat treatments

  • Steam sterilization compatibility (120 °C with

100% relative humidity (RH))

  • Accelerated aging (85 °C at 85% RH)
  • Soldering compatibility (~ 350 °C soldering

iron)

– X-ray diffraction - crystallinity – Electrical and stability testing

  • Leakage current - 5 VDC in 37 °C saline
  • Electrochemical Impedance Spectroscopy

0B 1B 2B 3B 4B 5B Score >65% 35-65% 15-35% 5-15% 0-5% 0% % Removed

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SLIDE 10

Characterization of Parylene-C 10

  • L. Rieth

Results

  • Adhesion testing

– All films have 5B adhesion before heat treatments – Procedures: A - cut before heat treatment; B - cut after HT – Soldering compatibility:

  • 350 °C soldering iron
  • 10 second contact to multiple bond pads
  • 4-5B

5B 5B 5B

  • BSG

0B 3B 0B 5B 0B 2-4B 0-3B 5B 4-5B 5B 5B 5B c-Si B A B A B A B A B A B A Procedure

3 ± 0.3 µm

150 °C 100% RH 2 hours 120 °C 100% RH 2 hours 150 °C 20 minutes 120 °C 20 minutes 85 °C 20 minutes 75 °C 20 min Test Condition Film Thickness

slide-11
SLIDE 11

Characterization of Parylene-C 11

  • L. Rieth

Discussion

  • Parylene adhesion:

– Wireless neural interface device and other current and future applications require robust adhesion to heterogenous materials (Si, glass, noble and other metals, etc) – Heat treatments including steam sterilization and soldering can degrade film adhesion depending on substrate material – Geometry/morphology of coatings affects their adhesion – Smaller domains are more able to tolerate heat treatments – Thermal Coefficients of Expansion:

  • Si: 2.6×10-6 /K (2.6 ppm/K)
  • Parylene-C: 35×10-6 /K (35 ppm/K)

– Profilometry: film stress

  • 1 MPa for as deposited films
  • 10 MPa after annealing at 120 °C for 20 minutes
  • All residual film stresses are very small

– Interfacial bonds broken to relieve thermal mismatch stress

slide-12
SLIDE 12

Characterization of Parylene-C 12

  • L. Rieth

X-ray diffraction

10 12 14 16 18 20

2 θ θ θ θ

85 C + 120 C 120 C 20 min 85 C 85% RH as deposited

Bragg-Brentano geometry with Cu Kα radiation

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SLIDE 13

Characterization of Parylene-C 13

  • L. Rieth

X-ray diffraction

  • Peak parameters

– Changes in peak position from out-of-plane stress – Full-width at half-maximum (FWHM) for crystallinity – Peak intensity for approx. volume fraction of crystalline material

0.64 6.083 14.54 85 °C / 85% RH days 150 °C 20 min Annealed / accelerated 0.64 6.083 14.55 150 °C 20 min Annealed 1.03 6.141 14.41 85 °C / 85% RH days Accelerated 1.94 6.200 14.27

  • As deposited

FWHM (° 2θ) d-spacing (Å) Peak Position (° 2θ) Heat Treatment Condition

slide-14
SLIDE 14

Characterization of Parylene-C 14

  • L. Rieth

X-ray diffraction: Discussion

  • Affect of heat-treatments on Parylene microstructure:

– Processes < 85 °C

  • XRD indicates small changes in microstructure over relatively

long periods

  • Microstructure changes would need to be considered for

demanding applications

  • Glass transition temperature typically 30 to 85 °C

– Processes ≥ 120 °C

  • Crystallization occurs
  • d-spacings decrease
  • Consistent with out-of-plane compressive stress or film

densification

  • In-plane tensile stress measured by wafer-bow
  • Overall stress state is consistent with densification induced

stress

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SLIDE 15

Characterization of Parylene-C 15

  • L. Rieth

Electrical Characterization

  • Leakage current testing:

– 5 VDC bias on samples in test vials – 3 days of testing dry - establish surface leakage – 3 months of testing in 37 °C saline solution - in vitro testing

1.E-16 1.E-14 1.E-12 1.E-10 1.E-08 1.E-06

20 40 60 80 100 120 140 160 Time in Days

Failure Acceptable

slide-16
SLIDE 16

Characterization of Parylene-C 16

  • L. Rieth

Electrical Characterization

  • Impedance Spectroscopy:

– Sensitive to changes in encapsulation thickness – Desire pure capacitive behavior – Most action potentials ~ 1 kHz

1.E+01 1.E+02 1.E+03 1.E+04 1.E+05 1.E+06 1.E+07 1.E+08 1.E+09 1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05

Frequency (Hz) Impedance (ohm)

  • 100
  • 90
  • 80
  • 70
  • 60
  • 50
  • 40
  • 30
  • 20
  • 10

Phase Day 1-Z Day 16-Z Day 185-Z Day 1-P Day 16-P Day 185-P

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SLIDE 17

Characterization of Parylene-C 17

  • L. Rieth

Discussion

  • Electrical properties of Parylene-C

– Stable and large resistance for dry testing

  • Suggests no surface conduction/leakage modes activated

– Resistance decreases with immersion in saline

  • Lower resistance due to small film thickness
  • Failure due to pinholes typically causes leakage currents > 10-7 A
  • Results indicate films are continuous over the test structures

– Resistance and impedance large and stable

  • Suggests no degradation via loss of material (etching)
  • Minimal ion or water infiltration is indicated
  • No failure modes such as electrochemical corrosion, dissolution,

etc are detected

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SLIDE 18

Characterization of Parylene-C 18

  • L. Rieth

Patterning

  • Use oxygen plasma to etch Parylene-C

– Compared capacitively coupled and inductively coupled plasma reactive ion etch systems

  • Capacitive system - Oxford 80 plus - 200 W - 0.28 µm/min
  • Inductive system - March Plasmod - 150 W - 0.35 to 0.58 µm/min
slide-19
SLIDE 19

Characterization of Parylene-C 19

  • L. Rieth

Conclusions

  • Parylene-C is a useful material for microsystems

– Established track record of biocompatibility; conformal coating; few pinholes; – Adhesion is critical and must be controlled for systems made

  • f heterogenous materials

– Thermal treatments (e.g. soldering, steam sterilization, etc) can degrade film adhesion; process flows and alternatives need to be considered – The thermal degradation mechanism is hypothesized to involve breaking of interfacial bond to relieve strain – Parylene crystallization is rate is significant at > 120 °C – Long-term stable in saline solution under 5 V bias; no electrochemical reactions, etc – Can be effectively patterned using RIE with some control on the etch anisotropy

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SLIDE 20

Characterization of Parylene-C 20

  • L. Rieth

Future Work and Acknowledgements

  • Investigate adhesion to more materials to investigate

encapsulation of heterogenous devices

  • Surface treatments and adhesion promoters

– Better understanding of the chemistry on both interfaces – Functionalization of Parylene

  • Integrating Parylene into the packaging chain

– Effects on adhesion of other materials (e.g. silicone potting, acrylic resin, etc) – Adhesion and stability on other materials (e.g. a-SiC:H, metals and metal oxides, etc

  • Acknowledgements

– NIH/NINDS Chronic Microelectrode Recording Array

  • HHSN265200423621C

– DARPA Revolutionizing Prosthetics

  • 908164