SLIDE 49 From: Brian C. O'Regan Sent: Friday, October 08, 2004 4:53 AM To: Baer, Donald R Subject: A quote from you. Hello, I think we haven't met yet, at least not in more than passing. But, I ran into this quote from an abstract of yours:
"Since nanomaterial systems often contain a relatively large amount of surface or interface area, it is natural to characterize them using tools designed to analyze surfaces and interfaces. In our work we have found that nanoparticles and other nanostructured materials can present a variety of obstacles to useful analysis." I couldn't agree more!
I am trying to design a useful (and hopefully "routine" ) tool kit for characterizing nanoparticle surfaces. I want to do some reasonably high throughput screening of particles from various sources, I want a student to be able to measure 5 or 6 characteristics on 6 or 8 materials without running the risk of meaningless results because of techniques that are very tricky to use, or beam lines with limited time available,
- etc. I imagine including some techniques for characterizing surface impurities when in
vacuum, but also some hopefully for interfaces in solid materials (e.g. devices like the kind I work on, solid state dye sensitized photovoltaic cells.). If you have any advice about novel techniques to look into , please drop me a hint.
Energy Research Center Netherlands