Th The Effect of f Contact Roller Topography on Cleanability in - - PowerPoint PPT Presentation
Th The Effect of f Contact Roller Topography on Cleanability in in Roll-to to-Roll l Manufacture Student: Dan Miszewski-Wall Supervisor: Professor Liam Blunt Project Brief Quantitatively evaluate the cleanability of several Teknek
Th The Effect of f Contact Roller Topography on Cleanability in in Roll-to to-Roll l Manufacture
Student: Dan Miszewski-Wall Supervisor: Professor Liam Blunt
Teknek contact rollers with respect to contact roller surface topography.
surface topographies on PET film.
surface topography to cleanability.
surface topography and cleanability.
Surface Cleanliness, Cleanliness Methods & Particle Adhesion
production as any defects (e.g. dust particles) may lead to reductions in product yield.
functionality is not hindered as a function of contamination” (Hovestad, 2015).
(a) (b) (c) Negative Effects of Contamination Within R2R Manufacture (Teknek, 2015)
method.
contamination.
(a) (b) Cleaning Mechanisms; (a) Momentum Transfer (b) Organic Removal (Kohli & Mittal, 2008) TNO R2R Lab Pilot Scale CO2 Cleaning (Hovestad, 2015)
Web Direction Left to Right
methods with minimal environmental impact.
particle adhesive forces.
Teknek Contact Roller Cleaning Mechanism
Efficiency of R2R Cleaning Methods (Teknek, 2015) Teknek Contact Roller (Ope Journal, 2014)
cause a particle to adhere to a surface are van der Waals and electrostatic interactions (Kohli & Mittal, 2008).
Der Waals
attractive intermolecular forces acting between electrically neutral particles.
materials of opposing charges are attracted to each other.
Adhesion Forces as a Function of Particle Diameter (Hamilton, 2012)
(a) (b)
(a) Van der Waals & (b) Electrostatic Attraction Interaction Illustrations (Mattson, 2014)
particle adhesion.
when the particle size matches the surface asperities.
Adhesion as a Function of Contact Area (Hamilton, 2012)
Contact Cleaning Trials & Contact Roller Surface Characterisation
Surface Contamination Measurement
Standardised Sample Size Specimen Fixture Design
35mm Photography Frame Specimen Holder Lego Specimen Fixture
Keyence – Light Settings Keyence – Data Capture
Keyence Observation of Paper Fibre & Human Hair Sample Measurement at 50x Magnification
Surface Contamination Measurement
Natural Contamination Polystyrene Micro Particles
Natural Contamination Collected From A Clean Room Office; Representative Of R2R Environment Uniformly Sized Polystyrene Micro Particles Were Used To Artificially Model Surface Contamination
*U *Use sed as Mod
tamination In n NanoMend Proje ject
Three cleaning trials performed in total using a single pass of each contact roller;
Teknek Handheld Contact Roller
(a) Ioniser Blow Gun (b) Teknek Hand Contact Roller (c) Teknek FastPad (d) PET Film Sample
a d c b
includes software enabling scientific image analysis.
by Keyence.
ImageJ Post-Processing to Analysis Phase (ImageJ, 2016)
Natural Contamination Polystyrene Micro Particles
ImageJ Automatic Particle Analysis ImageJ PointPicker Analysis Tool
Alicona InfiniteFocus Contact Roller Measurement Contact Roller Surface Measurement in SurfStand
1000 2000 3000 4000 5000 6000
PANEL FILM NANO ULTRA UTF
Defect Density (um2) Contact Roller Variant
Defect Density After Single Roller Pass
Natural Contamination Natural Contamination Anti-Static
0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100% PANEL FILM NANO ULTRA UTF
Polystyrene Micro Particle Reduction (%) Contact Roller Variant
Polystyrene Micro Particle Reduction After Single Roller Pass
Two Subgroups Identified; 1.
el & Film ilm
Low Average Surface Roughness (Sa) Sm Smooth surface Low Developed Interfacial Ratio (Sdr) Low surface area Negative Skewness (Ssk) Valley dominated surface Low RMS Surface Slope (Sdq) Low degree of surface slopes Low Auto-Correlation Length (Sal) Finely spaced surface textures Low Shore Hardness Sof Soft material
2.
ltra & UTF
High Average Surface Roughness (Sa) Roug
High Developed Interfacial Ratio (Sdr) Large surface area Positive Skewness (Ssk) Peak dominated surface High RMS Surface Slope (Sdq) High degree of surface slopes High Auto-Correlation Length (Sal) Widely spaced surface textures High Shore Hardness Har ard material
Cl Cleanin ing Tri rial Co Contact Roll
Cleanabil ilit ity Ra Rankin ing 1 (Bes (Best) 2 3 4 5 (W (Wor
1.
Natural l Co Contamin inatio ion ULTRA NANO UTF PANEL FILM 2.
Natural l Co Contamin inatio ion (An (Anti-Static ic) NANO FILM PANEL ULTRA UTF 3.
Micro Par artic icle les ULTRA NANO FILM UTF PANEL
* Cleaning Trials 1 & 2 ranked by Defect Density Reduction %. Cleaning Trial 3 ranked by Particle Count Reduction %
Cleaning Trial Contact Roller Cleanability Ranking 1 (Best) 2 3 4 5 (Worst) 1. Natural Contamination ULTRA NANO UTF PANEL FILM 2. Natural Contamination (Anti-Static) NANO FILM PANEL ULTRA UTF 3. Polystyrene Micro Particles ULTRA NANO FILM UTF PANEL
particle and roller, thus increasing particle removal effectiveness.
may serve to mechanically shear the adhered particle from the surface.
may explain its comparatively inferior cleanability.
Cleaning Trial Contact Roller Cleanability Ranking 1 (Best) 2 3 4 5 (Worst) 1. Natural Contamination ULTRA NANO UTF PANEL FILM 2. Natural Contamination (Anti-Static) NANO FILM PANEL ULTRA UTF 3. Polystyrene Micro Particles ULTRA NANO FILM UTF PANEL
highest cleanability when electrostatic forces are present.
Able to deform around adhered particles, increasing the contact area, thus increasing particle removal effectiveness.
Cleaning Trial Contact Roller Cleanability Ranking 1 (Best) 2 3 4 5 (Worst) 1. Natural Contamination ULTRA NANO UTF PANEL FILM 1. Natural Contamination (Anti-Static) NANO FILM PANEL ULTRA UTF 3. Polystyrene Micro Particles ULTRA NANO FILM UTF PANEL
and both Ultra and Nano demonstrated the highest cleanability.
at overcoming electrostatic adhesion forces.
effectiveness by mechanically shearing adhered particles from the surface.
trials.
topographies are required for optimum cleaning of specific applications.
cleaning for all applications, rather certain topographies are suited to specific applications.
In Process Surface Metrology for High Value Manufacturing
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Prof Liam Blunt Project Co-ordinator NanoMend Project/University of huddersfield
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Needs multiple sensors gives roll coverage BUT :-
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Theme FP7 NPM 2011.1.4-2 Development of nano-scale detection and control techniques for large area substrates Title “Nano-scale Defect Detection Cleaning and Repair for Large Area Substrates” GA No. 280581 Collaborative Project 14 Partners 6 countries Project Costs €10.45M EC Funding €7.25M Co-ordinator University of Huddersfield Jan 2012 - Dec 2016 www.nanomend.eu
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Flexible Photo Voltaics Coated Paper Products
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Flexible Solar modules Multi stage production 500mm width, 1-10m/min
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Inspection and Local Cleaning 1m/min up to 800m/min
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Defects within these films reduce the yield, performance and life time of the products that incorporate them:
O2 transmission for food shelf life or 20 year useful life span for flexible PV
need to be scrapped before they reach the market where targets are 99% yield
films (e.g. reducing amount of polymer used on coated paper)
Reducing the proportion of defects will make a range of products more competitive.
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
Developed at NPL 3x10-5g/m2/day Proof of Concept system CPI
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
removal systems can be integrated into manufacturing lines of:
Pilot lines and Proof of Concept Demonstrator
This project has received funding from the European Union’s Seventh Framework Programme for research, technological development and demonstration under grant agreement no 280581
WSI development - evolution during the project
Lab-based system at Hud IBSPE development for web hander Proof of concept system at CPI Development of improved web winder at CPI with calibration in line (NPL) Arrina (IBSPE)
DEFECT CLASSIFICATION Barrier CPI
Inwardly directed defect Outwardly directed defect Differing appearance to surroundings Surface relief
Classification based on Rebiggiani “On polishability of tool steels” 2013 - defects in polishing of tool steels PhD Thesis Halmstad Sweden.
Surface relief/Roughness Hole Pinhole/pit
Particulate Debris Peaks/Raising Delamination
Particulate debris Cracking
The NanoMend project has received funding from the European Community’s Seventh Framework Program (FP7/2007-2013) UNDER Grant Agreement No. 280581
TNO Eindhoven
1. Expand Dataset To Provide Benchmark To Compare New Formulations Against.
A. The effect of multiple roller passes versus a single roller pass on cleanability. B. The effect of rotation speed during contact roller application on cleanability. C. The effect of force during contact roller application on cleanability.
2. Build Pilot Scale R2R Rig In Clean Room
A. Representative R2R manufacturing environment for future experimentation. B. In Process Visual System C. Global Vs Local
3. To Be Discussed