Silicon photonics:
a new technology platform to enable a new technology platform to enable low cost and high performance photonics photonics
L P i
- L. Pavesi
- L. Pavesi
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Silicon photonics: a new technology platform to enable a new - - PowerPoint PPT Presentation
Silicon photonics: a new technology platform to enable a new technology platform to enable low cost and high performance photonics photonics L P L. Pavesi i L. Pavesi 18-11-10 Outline Outline Silicon Photonics Silicon Photonics
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29 January 1969
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vs Silicon Photonics
Silicon Photonics LD,PD, microrings, Silicon LD,PD, microrings, …. CMOS
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Enormous ($ billions) CMOS infrastructure, process learning, and capacity
Potential to integrate multiple optical devices
To benefit from this optical w afers
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e t
s opt ca a e s m ust run alongside existing product. CMOS PHOTONI CS
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18 18 8 . 18 22
− − − −
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R.A. Soref and B.R. Bennett, IEEE JQE 23, 123 (1987)
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Silicon does not absorb IR well
Silicon does not absorb IR well Use hybrid approach Use hybrid approach U SiG i d G U SiG i d G Use SiGe or strained Ge Use SiGe or strained Ge Use damaged silicon Use damaged silicon
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IEF-LETI
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This requires This requires
Spotsize conversion structures
Lateral coupling Vertical coupling
φ fiber air h g r e φ d
x z y
t i 3
t i 10
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Optical Fiber Multiplexor 25 modulators at 40Gb/ s 25 hybrid lasers 25 hybrid lasers
A future integrated 1 Tb/ s optical link
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46
A future integrated 1 Tb/ s optical link
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Silicon Photonic Link 50Gb 50Gbps Multichip approach Driver 45 nm CMOS Photonic 90 nm CMOS
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10 μm
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50 nm
Eg
c-Si
Eg
c-Si
Bulk Silicon: Indirect band-gap Nanocrystalline-Si: Direct-gap due to QCE Indirect band gap inefficient light emitter g p Q Strong visible light emission
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Purcel effect
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Purcel effect
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CEIVER RANSC CON TR all SILI
CMOS capacitor based on Si-NC gate
THE
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25/02/2010 59 Marconi, Anopchenko
Forward Bias Reverse Bias
CEIVER RANSC
Poly p-type
CON TR
Si substrate n-type Al
all SILI THE
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1
(2 nm SiO2 / 3 nm SRO) 2)
1
Graded energy gap (2 nm SiO2 / 4 nm SRO)
(μW / cm
2
0.1
wer density
0.1 0.2 ficiency (%)
0.01
ptical pow
10
10
10
1
0.0 Power eff Current density (mA / cm
2)
Active n-type poly- silicon p-type silicon +
10
10
1 10
1
O Current density (mA / cm
2)
Current density (mA / cm )
Active Si-NC silicon ∼100 nm silicon wafer
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Current density (mA / cm )
Forward Bias Reverse Bias
CEIVER RANSC
Poly p type
CON TR
Si substrate n-type Al Poly p-type
all SILI
Al
THE
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25/02/2010
TTL in TTL in TTL out TTL out
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25/02/2010 63 Marconi
( )( )
1 2 1 1 cos T ξ ξ ϕ = − − − Δ
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n2= (1.54x10-16) cm2/W [3,4]
n2= (4.5x10-14) cm2/W [3,4]
n2= (1.59x10-13) cm2/W [5]
n2= (2 ÷ 8x10-13) cm2/W [present work]
[3] Handbook of Nonlinear Optics [4] Adair R. et al., Physical Review B, 39, 3337, (February 1989). [5] M. Dinu et al., Applied Physics Letters, 82, 2954 (2003).
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[ ] , pp y , , ( )
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Photon electron energy conversion 32.9% Unabsorbed energy loss 18.7% Heat loss 46.8% Other losses 1.6%
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Secondary carrier Secondary carrier generation
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Ryan, Anopchenko, Marconi – APP FBK
Silicon nanocrystals
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Ryan, Anopchenko, Marconi – APP FBK
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Ryan, Anopchenko, Marconi – APP FBK
0.8 1.0 TSRO RSRO A 0.3 ) ncement (b) PDS-2 0.6 al function ASRO 0.2 nsivity (A/W) ciency enha PR PR 0.2 0.4 Optica 0.1 Photorespon uantum effic PRARC ΔηINT 400 500 600 700 0.0 Wavelength (nm) 0.0 P Internal qu
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A maximum enhancement of the internal quantum efficiency of 14%
Secondary carrier Secondary carrier generation
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Ryan, Anopchenko, Marconi – APP FBK - Minhaz
Al (1%Si) 500 nm SiO2 (TEOS) 120 nm Al (1%Si) 500 nm Si Si-
rich Oxide 50 nm LPCVD Si3N4 50 nm n-type Poly-Si 30 nm LOCOS 500 nm LOCOS 500 nm P-type Si substrate Al (1%Si) 500 nm Al (1%Si) 500 nm
Device area = 320 μm X 320 μm
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Device area = 320 μm X 320 μm
Ryan, Anopchenko, Marconi – APP FBK - Minhaz
Al (1%Si) 500 nm SiO2 (TEOS) 120 nm Al (1%Si) 500 nm Si Si-
rich Oxide 50 nm LPCVD Si3N4 50 nm n-type Poly-Si 30 nm LOCOS 500 nm LOCOS 500 nm P-type Si substrate Al (1%Si) 500 nm absorption Al (1%Si) 500 nm
Device area = 320 μm X 320 μm
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Device area = 320 μm X 320 μm
Ryan, Anopchenko, Marconi – APP FBK - Minhaz
Al (1%Si) 500 nm SiO2 (TEOS) 120 nm Al (1%Si) 500 nm Si Si-
rich Oxide 50 nm LPCVD Si3N4 50 nm n-type Poly-Si 30 nm LOCOS 500 nm LOCOS 500 nm multiplication P-type Si substrate Al (1%Si) 500 nm absorption Al (1%Si) 500 nm
Device area = 320 μm X 320 μm
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Device area = 320 μm X 320 μm
Ryan, Anopchenko, Marconi – APP FBK - Minhaz
1 0
0 0 0.5 1.0
L - ID) (m
> 1200 nm
1 0
0.0
2 0
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1 0
0 0 0.5 1.0 Voc= 500 mV
L - ID) (m
> 1200 nm
1 0
0.0
633 nm
2 0
488 nm
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1 0
0 0 0.5 1.0 Voc= 500 mV
L - ID) (m
> 1200 nm
1 0
0.0
633 nm + 1200 nm
2 0
488 nm + 1200 nm
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1 0
0 0 0.5 1.0 Voc= 500 mV
L - ID) (m
> 1200 nm
1 0
0.0
633 nm + 1200 nm
10 %
2 0
488 nm + 1200 nm
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Secondary carrier generation ge e at o
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Ryan, Anopchenko, Marconi – APP FBK - Minhaz
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