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7/24/2015 Presentation Probe Station based Test System for diced HCC chip Weekly progress meeting for students working on instrumentation Simon Grossrieder, Niklaus Lehmann Supervisor : Carl Haber 7/24/2015 HCC Tester Table of contents

  1. 7/24/2015 Presentation Probe Station based Test System for diced HCC chip Weekly progress meeting for students working on instrumentation Simon Grossrieder, Niklaus Lehmann Supervisor : Carl Haber

  2. 7/24/2015 HCC Tester Table of contents  Project Description  HCC chip  Probe Station  Chip fixture  Alignment using Image Processing  Test procedure on MicroZed board  Next steps 2 Simon Grossrieder

  3. 7/24/2015 HCC Tester Project Description  First series of HCC chips have to be tested  Not on a complete wafer, but already diced  Test system aligning the chips automatically  Test procedure applied by a MicroZed board 3 Simon Grossrieder

  4. 7/24/2015 HCC Tester HCC chip EOSC <-> HCC <-> ABC130  Generates and distributes Clocksignals  Masks and forwards commands and data packages https://documents.epfl.ch/users/n/nl/nlehmann/www/SelfSeededTrigger_MasterThesis/References/AffolderEtAl_SystemElectro nicsForTheATLASUpgradedStripDetector.pdf 4 Simon Grossrieder

  5. 7/24/2015 HCC Tester Probe Station  Alessi REL-2500 with ECS-02 Controller 5 Simon Grossrieder

  6. 7/24/2015 HCC Tester 6 Simon Grossrieder

  7. 7/24/2015 HCC Tester 6 Simon Grossrieder

  8. 7/24/2015 HCC Tester ECS02 Controller 6 Simon Grossrieder

  9. 7/24/2015 HCC Tester ECS02 Controller Host Application 6 Simon Grossrieder

  10. 7/24/2015 HCC Tester ECS02 Controller Host Application Chuck (movable x/y direction) 6 Simon Grossrieder

  11. 7/24/2015 HCC Tester ECS02 Controller Host Application Chuck (movable x/y direction) Chipholder for diced chips 6 Simon Grossrieder

  12. 7/24/2015 HCC Tester ECS02 Controller Host Application Probecard (movable z direction) Chuck (movable x/y direction) Chipholder for diced chips 6 Simon Grossrieder

  13. 7/24/2015 HCC Tester Camera ECS02 Controller Host Application Probecard (movable z direction) Chuck (movable x/y direction) Chipholder for diced chips 6 Simon Grossrieder

  14. 7/24/2015 HCC Tester Camera ECS02 Controller Host Application Probecard (movable z direction) Chuck (movable x/y direction) MicroZed board Chipholder for diced chips 6 Simon Grossrieder

  15. 7/24/2015 HCC Tester Camera ECS02 Controller Host Application Probecard (movable z direction) Chuck (movable x/y direction) MicroZed board Chipholder for diced chips Active board 6 Simon Grossrieder

  16. 7/24/2015 HCC Tester Chip fixture Issues: 7 Simon Grossrieder

  17. 7/24/2015 HCC Tester Chip fixture Issues:  To keep chips aligned  avoid rotations of the chuck  To hold the chips on their position using a vacuum 7 Simon Grossrieder

  18. 7/24/2015 HCC Tester Chip fixture Issues:  To keep chips aligned  avoid rotations of the chuck  To hold the chips on their position using a vacuum  Aluminum plate with chip slots on top and vacuum channels on the bottom 7 Simon Grossrieder

  19. 7/24/2015 HCC Tester Chip fixture Issues:  To keep chips aligned  avoid rotations of the chuck  To hold the chips on their position using a vacuum  Aluminum plate with chip slots on top and vacuum channels on the bottom 7 Simon Grossrieder

  20. 7/24/2015 HCC Tester Alignment using Image Processing Goal:  Fast and efficient test procedure that aligns automatically the chips to the probes. 8 Simon Grossrieder

  21. 7/24/2015 HCC Tester Alignment using Image Processing Goal:  Fast and efficient test procedure that aligns automatically the chips to the probes. 1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 8 Simon Grossrieder

  22. 7/24/2015 HCC Tester Alignment using Image Processing Goal:  Fast and efficient test procedure that aligns automatically the chips to the probes. 1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 8 Simon Grossrieder

  23. 7/24/2015 HCC Tester Alignment using Image Processing Goal:  Fast and efficient test procedure that aligns automatically the chips to the probes. 1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 3. Test if there is a chip 8 Simon Grossrieder

  24. 7/24/2015 HCC Tester Alignment using Image Processing Goal:  Fast and efficient test procedure that aligns automatically the chips to the probes. 1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 3. Test if there is a chip 4. Measure position of the chip relative to the probes  move 8 Simon Grossrieder

  25. 7/24/2015 HCC Tester Alignment using Image Processing Goal:  Fast and efficient test procedure that aligns automatically the chips to the probes. 1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 3. Test if there is a chip 4. Measure position of the chip relative to the probes  move 5. Adjustments by measuring several pads and probes 8 Simon Grossrieder

  26. 7/24/2015 HCC Tester Alignment using Image Processing  Find Chipholder and set reference point 9 Simon Grossrieder

  27. 7/24/2015 HCC Tester Alignment using Image Processing  Measure position of the chip and the probes 10 Simon Grossrieder

  28. 7/24/2015 HCC Tester Alignment using Image Processing  Adjustments after first move 11 Simon Grossrieder

  29. 7/24/2015 HCC Tester 12 Simon Grossrieder

  30. 7/24/2015 HCC Tester Test Procedure on the MicroZed board  MicroZed board holding a Xilinx ZYNQ7020 – Provides processor and programmable logic 13 Simon Grossrieder

  31. 7/24/2015 HCC Tester Test Procedure on the MicroZed board  Basic Test: chip works/ chip doesn’t work  Tasks for Test procedure: – Adapt Phase shifts of the Clock and Data Lines – Configure HCC DUT – Send Test Vectors and read back the results  verify – Report results 14 Simon Grossrieder

  32. 7/24/2015 HCC Tester Next steps  Finish Test procedure within ZYNQ processor 15 Simon Grossrieder

  33. 7/24/2015 HCC Tester 16 Simon Grossrieder

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