Probe Station based Test System for diced HCC chip Weekly progress - - PowerPoint PPT Presentation

▶
probe station based test
SMART_READER_LITE
LIVE PREVIEW

Probe Station based Test System for diced HCC chip Weekly progress - - PowerPoint PPT Presentation

Jun 07, 2023 167 likes •510 views

7/24/2015 Presentation Probe Station based Test System for diced HCC chip Weekly progress meeting for students working on instrumentation Simon Grossrieder, Niklaus Lehmann Supervisor : Carl Haber 7/24/2015 HCC Tester Table of contents

slide-1
SLIDE 1

Presentation Probe Station based Test System for diced HCC chip

7/24/2015

Simon Grossrieder, Niklaus Lehmann Supervisor : Carl Haber

Weekly progress meeting for students working on instrumentation

slide-2
SLIDE 2

Table of contents

  • Project Description
  • HCC chip
  • Probe Station
  • Chip fixture
  • Alignment using Image Processing
  • Test procedure on MicroZed board
  • Next steps

Simon Grossrieder

2

7/24/2015 HCC Tester

slide-3
SLIDE 3

Project Description

  • First series of HCC chips have to be tested
  • Not on a complete wafer, but already diced

Test system aligning the chips automatically Test procedure applied by a MicroZed board

Simon Grossrieder

3

7/24/2015 HCC Tester

slide-4
SLIDE 4

HCC chip

EOSC <-> HCC <-> ABC130

  • Generates and distributes Clocksignals
  • Masks and forwards commands and data packages

https://documents.epfl.ch/users/n/nl/nlehmann/www/SelfSeededTrigger_MasterThesis/References/AffolderEtAl_SystemElectro nicsForTheATLASUpgradedStripDetector.pdf

Simon Grossrieder

4

7/24/2015 HCC Tester

slide-5
SLIDE 5

Probe Station

  • Alessi REL-2500 with ECS-02 Controller

Simon Grossrieder

5

7/24/2015 HCC Tester

slide-6
SLIDE 6

Simon Grossrieder

6

7/24/2015 HCC Tester

slide-7
SLIDE 7

Simon Grossrieder

6

7/24/2015 HCC Tester

slide-8
SLIDE 8

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller

slide-9
SLIDE 9

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Host Application

slide-10
SLIDE 10

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Chuck (movable x/y direction) Host Application

slide-11
SLIDE 11

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Chuck (movable x/y direction) Chipholder for diced chips Host Application

slide-12
SLIDE 12

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Chuck (movable x/y direction) Probecard (movable z direction) Chipholder for diced chips Host Application

slide-13
SLIDE 13

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Chuck (movable x/y direction) Probecard (movable z direction) Camera Chipholder for diced chips Host Application

slide-14
SLIDE 14

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Chuck (movable x/y direction) Probecard (movable z direction) Camera Chipholder for diced chips MicroZed board Host Application

slide-15
SLIDE 15

Simon Grossrieder

6

7/24/2015 HCC Tester

ECS02 Controller Chuck (movable x/y direction) Probecard (movable z direction) Camera Chipholder for diced chips MicroZed board Active board Host Application

slide-16
SLIDE 16

Chip fixture

Issues:

Simon Grossrieder

7

7/24/2015 HCC Tester

slide-17
SLIDE 17

Chip fixture

Issues:

  • To keep chips aligned  avoid rotations of the

chuck

  • To hold the chips on their position using a vacuum

Simon Grossrieder

7

7/24/2015 HCC Tester

slide-18
SLIDE 18

Chip fixture

Issues:

  • To keep chips aligned  avoid rotations of the

chuck

  • To hold the chips on their position using a vacuum

 Aluminum plate with chip slots on top and vacuum channels on the bottom

Simon Grossrieder

7

7/24/2015 HCC Tester

slide-19
SLIDE 19

Chip fixture

Issues:

  • To keep chips aligned  avoid rotations of the

chuck

  • To hold the chips on their position using a vacuum

 Aluminum plate with chip slots on top and vacuum channels on the bottom

Simon Grossrieder

7

7/24/2015 HCC Tester

slide-20
SLIDE 20

Alignment using Image Processing

Goal:

  • Fast and efficient test procedure that aligns

automatically the chips to the probes.

Simon Grossrieder

8

7/24/2015 HCC Tester

slide-21
SLIDE 21

Alignment using Image Processing

Goal:

  • Fast and efficient test procedure that aligns

automatically the chips to the probes.

1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test)

Simon Grossrieder

8

7/24/2015 HCC Tester

slide-22
SLIDE 22

Alignment using Image Processing

Goal:

  • Fast and efficient test procedure that aligns

automatically the chips to the probes.

1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before

Simon Grossrieder

8

7/24/2015 HCC Tester

slide-23
SLIDE 23

Alignment using Image Processing

Goal:

  • Fast and efficient test procedure that aligns

automatically the chips to the probes.

1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 3. Test if there is a chip

Simon Grossrieder

8

7/24/2015 HCC Tester

slide-24
SLIDE 24

Alignment using Image Processing

Goal:

  • Fast and efficient test procedure that aligns

automatically the chips to the probes.

1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 3. Test if there is a chip 4. Measure position of the chip relative to the probes  move

Simon Grossrieder

8

7/24/2015 HCC Tester

slide-25
SLIDE 25

Alignment using Image Processing

Goal:

  • Fast and efficient test procedure that aligns

automatically the chips to the probes.

1. Find the chipholder and set a new reference point (position of the chipholder varies slightly on each run of the test) 2. Goes to the next chip slot, that the user selected before 3. Test if there is a chip 4. Measure position of the chip relative to the probes  move 5. Adjustments by measuring several pads and probes

Simon Grossrieder

8

7/24/2015 HCC Tester

slide-26
SLIDE 26

Alignment using Image Processing

  • Find Chipholder and set reference point

Simon Grossrieder

9

7/24/2015 HCC Tester

slide-27
SLIDE 27

Alignment using Image Processing

  • Measure position of the chip and the probes

Simon Grossrieder

10

7/24/2015 HCC Tester

slide-28
SLIDE 28

Alignment using Image Processing

  • Adjustments after first move

Simon Grossrieder

11

7/24/2015 HCC Tester

slide-29
SLIDE 29

Simon Grossrieder

12

7/24/2015 HCC Tester

slide-30
SLIDE 30

Test Procedure on the MicroZed board

  • MicroZed board holding a Xilinx ZYNQ7020

– Provides processor and programmable logic

Simon Grossrieder

13

7/24/2015 HCC Tester

slide-31
SLIDE 31

Test Procedure on the MicroZed board

  • Basic Test: chip works/ chip doesn’t work
  • Tasks for Test procedure:

– Adapt Phase shifts of the Clock and Data Lines – Configure HCC DUT – Send Test Vectors and read back the results  verify – Report results

Simon Grossrieder

14

7/24/2015 HCC Tester

slide-32
SLIDE 32

Next steps

  • Finish Test procedure within ZYNQ processor

Simon Grossrieder

15

7/24/2015 HCC Tester

slide-33
SLIDE 33

Simon Grossrieder

16

7/24/2015 HCC Tester