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Instrumentation and Measurements (XRD) Dr. Christophe Fontugne - PowerPoint PPT Presentation

Instrumentation and Measurements (XRD) Dr. Christophe Fontugne R&D Instrument manager MAUD 2018 November 26, 2018 The world leader in serving science Proprietary & Confidential Sum m ary Presentation of ThermoFisher X-ray part (very


  1. Instrumentation and Measurements (XRD) Dr. Christophe Fontugne R&D Instrument manager MAUD 2018 November 26, 2018 The world leader in serving science Proprietary & Confidential

  2. Sum m ary Presentation of ThermoFisher X-ray part (very quick) Interaction X-ray and matter (no maths, good for digestion) XRD basics Powder Thin Layer Stress Texture XRD setup : Some important parameters defining an instrument Some real XRD examples : Dynamic studies on Equinox 100 Combined XRD/XRF on Equinox 100 Phase transition at (not very) high temperature on Equinox 3000 Texture/Stress Combination on Equinox 6000 Proprietary & Confidential 2

  3. 70,000 5,000 $1B $24B employees R&D scientists/engineers invested in R&D in revenues The world leader in serving science Proprietary & Confidential 3

  4. Our leading scientific products, services and workflow solutions The world leader in serving science Analytical precision and Inspiring meaningful Accelerating discovery One-stop access for Instrument and diagnostic excellence genetic analysis research scientific products enterprise services Proprietary & Confidential 4

  5. We take pride in our Mission We enable our customers to make the world healthier, cleaner and safer Proprietary & Confidential 5

  6. Our customer value proposition Technology Digital science based capabilities partnership Production R&D Companion outsourcing optimization diagnostics development We help our customers accelerate Laboratory Supply chain Customer flow and management innovation and enhance efficiency productivity , underpinned by quality . Clinical trial Exclusive & manufacturing tools and applications services Compliance Outsourced to defined enterprise standards services Assurance of supply quality and resilience Proprietary & Confidential 6

  7. Unsurpassed and evolving portfolio mix BioProduction Genetic ImmunoDiagnostics Clinical Oncology Analysis Electron Lab Lab Microscopy Equipment Consumables API Formulation Clinical Mass Reproductive Microbiology Diagnostics Spectrometry Health Chemical Laboratory Chromatography Scientific Supplies Human Cell Analysis Transplant Analysis Chemicals Manufacturing Identification Clinical Trial Pathology Cell Culture Diagnostics Lab Equipment, Healthcare Life Sciences Applied Markets Chemicals and Scientific Pharma and Biotech Supplies Channel Enterprise-Wide Services and Digital Science Solutions Proprietary & Confidential 7

  8. Thermo Scientific XRF and XRD Product Portfolio : Strong And Complementary Technologies (>4000 customers ) Stand-alone Integrated XRF EDXRF WDXRF Powder XRD and XRD ARL QUANT’X Top performance ARL PERFORM’X bench-top EDXRF High performance ARL 9900 Series sequential XRF Integrated XRF-XRD ARL EQUINOX Series from benchtop XRD to advanced research XRD ARL OPTIM’X: Surprising performance in WDXRF XRD: Analysis of structure, XRF: Elemental analysis crystallography phases or compounds Proprietary & Confidential 8

  9. Therm o Fisher Scientific – I nel Brand Therm o Fisher Scientific – XRD research Z.A. C.D. 405 45410 ARTENAY , France T + 33 (0)2 3880 4545 F + 33 (0)2 3880 0814 Key figures Creation : 1974 of INEL SAS INEL integrates Thermo Fisher in Feb. 2016 Staff 2015 : 20 employees 80% technically qualified (PhD, Engineers and technicians) Staff seniority average: 10 years Resources All technical and human resources are situated in our headquarter in France : • Research & Development, technical assistance • Informatics tools development & assistance • Mechanical parts design & metrology • X-Ray diffraction systems assembling • Installation & After Sales Services for instrumentation • Components and electronic cards design & integration Proprietary & Confidential 9 9

  10. Wave-matter interaction e - λ When a photon does encounter an atomic particle, it transfers energy to the particle. The energy may be reemitted back the way it came (reflected), scattered in a different direction or transmitted forward into the material. Proprietary & Confidential 10

  11. I nteraction w ave-m atter The energy of photons used for optical spectroscopic measurements of various quanta EHz : exahertz (10 18 ) - ZHz : zettahertz (10 21 ) - YHz : yottahertz (10 24 ) Proprietary & Confidential 11 11

  12. W ave-m atter interaction X-rays Production : classically by excitation of external electronic level with electron beam Bragg's law λ = d sin 2 θ θ θ d Proprietary & Confidential 12 12

  13. X-Ray Diffraction basics (1/3) • Planes of atoms act like a diffraction grating • Constructive & destructive interference lead to peaks in scattered intensity • Values of λ & d determines 2 θ Bragg’s law : n λ = 2d sin θ • Where • n = order of radiation • λ = wavelength of radiation • 2d = latice spacing of crystallites in the powder sample for XRD • θ = Bragg angle Proprietary & Confidential 13

  14. X-Ray Diffraction basics (2/3) Peak position  d-spacings Peak intensity  nature and atomic positions in planes With XRD we measure distances... … nothing more Chemical composition Phases Structure ….. Proprietary & Confidential 14

  15. X-Ray Diffraction basics (3/3) Without a Database we can DATABASE not do much... Pattern DATABASE Source : wikimedia Halite (NaCl)... ... should give this pattern Proprietary & Confidential 15

  16. One important issue with XRD : isomorphism This is one real issue with XRD Pattern AgS 2 Sb has the same structure as NaCl !!! A complementary technique sensitive to chemistry is helpful (XRF…) Proprietary & Confidential 16

  17. THIN LAYER (GiXRD) Proprietary & Confidential 17

  18. What is called thin layer Issue 1 GiXRD (or thin layer) is used to see Issue 3 the first few nm to µm of sample surface…. To control Often quality of penetration signal is poor depth of X-Rays due to a lack of cristallinity Layer Substrate Issue 4 Issue 2 Sometimes detector Speed : if layer dynamic … Therefore at least motorized is really thin required is omega and Z are required (thin (few nm) really high layer attachement or Equinox 5000 (epitaxial or 6000) layers) Proprietary & Confidential 18

  19. Information obtained 1/2 • XRR (X-Ray Reflectometry) X-Ray Reflectivity curve X-Ray Reflectivity curve 5nm Nb layer 10nm Ni layer • Bump spacing : information on thickness • Bump decay : information on roughness (angstrom scale) • Thin is easy (less than 300 nm) thick is very difficult. Unique feature for a desktop instrument Proprietary & Confidential 19

  20. Information obtained 1 / 2 … continued Stack of 128 W/Si layers on Silicon substrate W = 1.1nm Si = 2.2nm Proprietary & Confidential 20

  21. Information 2/2… Diffraction of course 4µm Ni layer on Iron Ω increases Proprietary & Confidential 21

  22. What is Epitaxie? Thin layer but with nearly same structure as a single crystal. Au on TbPC2 Proprietary & Confidential 22

  23. STRESS Proprietary & Confidential 23

  24. What is (residual) stress • A simple cubic structure 2 θ d Is always Is always d the same the same d d Proprietary & Confidential 24

  25. Some violence…… Sample larger than before DEFORMATION Sample smaller than before Proprietary & Confidential 25

  26. …. At atomic level d d1 d d d2 d3 d1 < d < d2 & d3 d2 = d3 in case of uniaxial stress d changes implies that 2 theta changes Proprietary & Confidential 26

  27. Just for fun Texture measurement Using Precix robotic system Proprietary & Confidential 27

  28. TEXTURE Proprietary & Confidential 28

  29. What is called texture? Powder or random texture Preferred orientation / texture Texture means classically deviation from random texture Proprietary & Confidential 29

  30. Why do we have texture sometime Extrusion Cold rolling And many other things…. Geology Proprietary & Confidential 30

  31. Instrument Instrument is designed to retrieve the information we are looking for. It allows to measure and quantify physical parameters (length, weight, power, energy, time…) Proprietary & Confidential 31

  32. X-ray diffraction setup Elastic coherent interaction : reflectometrie : investigation on thin film for measuring thickness, roughness and density diffraction : investigation on phases absorption : imaging and radiography. Incoherent elastic interaction : diffusion by a rough surface or cristalline defects. => instrumental configuration adapted according to: Grazing - type of measurement Diffraction measurements - type of sample Powder, - accuracy of the result bulk 2D fibres, bulk Powder, 2D or 3D fibres, bulk Small angle measurements 2D Instrument Environment X-ray optic sample Detection Source Performances depends on the instrumental function Proprietary & Confidential 32

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