Infiltration of CNT-M Microstructures using CVD and ALD Presented - - PowerPoint PPT Presentation

infiltration of cnt m microstructures using cvd and ald
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Infiltration of CNT-M Microstructures using CVD and ALD Presented - - PowerPoint PPT Presentation

Brigham Young University Infiltration of CNT-M Microstructures using CVD and ALD Presented by: Collin Brown, Jason Kyle Anderson October 31st, 2013 Brigham Young University Acknowledgments Jason Kyle Anderson for his help in getting the


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October 31st, 2013

Infiltration of CNT-M Microstructures using CVD and ALD

Presented by: Collin Brown, Jason Kyle Anderson

Brigham Young University

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Acknowledgments Jason Kyle Anderson for his help in getting the system to work Dr's David Allred, Richard Vanfleet, and Robert Davis for their help and direction in this project BYU Environment for Mentoring Grant (MEG) Richard Hansen for his work on CNT-M David McKenna for constructing the CVD system Brigham Young University

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Outline

✤Purpose of Deposition Techniques ✤Overview of CNT-M ✤Theory of Deposition ✤Chemical Vapor Deposition (CVD) ✤Atomic Layer Deposition (ALD) ✤Conversion of CVD system to ALD ✤Initial Results ✤Initial Characterization with SEM, TEM, and XEDS

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Purpose

✤ Create mechanical and electrical components on a

micro scale - NEMS/MEMS

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Why does this matter?

(1) http://www.ducksters.com/games/ wii-sports-bowling.php (2 )

High sensitivity inertial sensors X-ray collimator

Brigham Young University

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Traditional Fabrication Method

Etching- Chemically or mechanically removing selective parts of a solid metal

(3) Brigham Young University

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Limitations of Chemical Etching

✤Limited selection of materials -

Tungsten, Gold, Silicon, Aluminum

✤Poor aspect ratio (height to width) ✤(~5:1) aspect ratio due to gas

transportation limits

(4 ) Brigham Young University

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New Method for NEMS/MEMS

✤Carbon Nanotube Templated Micro-fabrication (CNT-

M)

✤Easily Controlled ✤High Aspect Ratio (200:1) ✤features >500 microns tall by 2-3 microns across ✤Electrically conductive

Brigham Young University

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Silicon Wafer Photoresist Mask Hot Ethylene

Brigham Young University CNT-M Process

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Chemical Vapor Deposition (CVD)

✤ When used to infiltrate a CNT, called Chemical Vapor Infiltration (CVI) ✤ Flow reactants into chamber constantly, usually at high temperature ✤ Heat the solid precursor so it will volatilize ✤ Flow an inert gas to carry the precursor to the sample ✤ Problems ✤ Uneven Infiltration ✤ Capping

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Carbon Nanotube Forest Infiltrated with Mo(CO)6 by Richard Hansen

After infiltration Before infiltration (6) Forest - 1% Carbon Brigham Young University

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Brigham Young University

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Brigham Young University

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Brigham Young University

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Brigham Young University

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Atomic Layer Deposition (ALD)

✤Propose to try with Tungsten in nanotube forests, so

Atomic Layer Infiltration (AFI)

✤Self-limiting layer by layer ✤Hope to achieve: ✤uniform material properties ✤eliminate crusts

Brigham Young University

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Tungsten ALD with WF6

✤Gaseous form of WF6 self-limits deposition ✤Flow H2, monatomic Hydrogen from Plasma, or Silane ( SiH4 ) ✤H reduces WF6 leaving a layer of W ✤HF gas molecules created

Vacuum Chamber

Sample

H2 WF6 WF6 W HF Brigham Young University Ar

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Converting the System

✤Modified from CVD ✤Hooked in gas lines for WF6 ✤Seal cabinet,install cabinet exhaust system, and insert

sensors and filters for HF.

✤ Automate LabviewTM program to cycle valves for ALD

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Initial Results

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Plasma - RF generated

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Latest Deposition - Pseudo ALD

✤ Constant H (40 sccm) - from a Hydrogen Plasma ✤ 5 seconds of WF6 (0.0142 l at 5 psi, about 2.0 x 10-4

mole)

✤ 120 cycles ✤ 235 degrees C - sample temperature ✤ Ozone treated 1 of the samples for 20 min, for better

nucleation

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Ozone treatment vs No Ozone treatment

✤ 7

Brigham Young University Ozone Treatment No Ozone Treatment

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Top of Sample Side of Sample Brigham Young University

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Top of Sample - Break in Lower Left Image of Fresh Surface from Break Brigham Young University

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No obvious difference between chemical makeup of small or large stuff

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✤ scattered peaks have a lattice spacing too large for BCC tungsten ✤ may be an A15 compound, something like Beta-Tungsten

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Future Plans

✤ Optimize procedure (Intervals, flow rates, etc.) ✤ Silane vs. Hydrogen ✤ Ozone treatment vs. No Ozone treatment vs. In Situ Ozone treatment ✤ Annealing ✤ Characterization by SEM & TEM cross sectioning, Also X-ray characterization at ALS, FIB ✤ Capping ✤ Grain size uniformity ✤ Electrical conductivity ✤ Mechanical Properties

Brigham Young University

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Sources

  • 1. http://www.memx.com/
  • 2. Johnson, R. Colin. “MEMS finds niche in space exploration.” EE Times, Sep 2007.

<http://www.eetasia.com/ART_8800479803_1034362_NT_ca7d6a67.HTM>.

  • 3. http://www.finestengraving.com/services.htm
  • 4. Oxford Instruments. “Plasma Technology.” Accessed March 7, 2013.

<http://www.oxfordplasma.de/process/arde.htm>.

  • 5. Kellen Moulton, Nicholas B. Morrill, Adam M. Konneker, Brian D. Jensen, Richard R. Vanfleet, David D.

Allred, and Robert C. Davis. “Effect of Iron Catalyst Thickness on Vertically Aligned Carbon Nanotube Forest Straightness for CNT-MEMS.” Journal of Micromechanics and Microengineering 22 (5) 055044. May 2012 and references cited therein.

  • 6. Hansen, Richard Scott. "Mechanical and Electrical Properties of Carbon-Nanotube-Templated Metallic

Microstructures." Senior Thesis. June 2012.

Brigham Young University