Functional interfaces with conjugated organic materials: energy level tuning and "soft" metallic contacts
Norbert Koch
Emmy Noether-Nachwuchsgruppe "Supramolecular Systems" Institut für Physik Humboldt-Universität zu Berlin
Functional interfaces with conjugated organic materials: energy - - PowerPoint PPT Presentation
Functional interfaces with conjugated organic materials: energy level tuning and "soft" metallic contacts Norbert Koch Emmy Noether-Nachwuchsgruppe "Supramolecular Systems" Institut fr Physik Humboldt-Universitt zu
Emmy Noether-Nachwuchsgruppe "Supramolecular Systems" Institut für Physik Humboldt-Universität zu Berlin
conjugated molecules (semiconductors) and electrodes (conductors)
with strong electron acceptors/donors
Conclusion
+ (-)
NC COM E E Source Drain Gate Gate insulator
Organic channel
VDS VG
CN CN F F F F NC NC
S S S S S S
B
2
hn
interface-formation? Molecular Electronics": Interface-Only Devices!
Injection-limited current:
1 IE h,1 EF 2 IE h,2 EF Evac Evac
if Schottky-Mott limit (vacuum level alignment) applies: charge injection barriers can be predicted from materials parameters:
i substrate work function IE ionization energy h,i hole injection barrier EF Fermi level Evac vacuum level
e h
e
ionization energy = h – (Ekin,HOMO – Ekin,SECO) work function = h – (Ekin,EF – Ekin,SECO) hole injection barrier = Ekin,EF – Ekin,HOMO core-levels: type of interaction
kin,HOMO kin,EF
in ultrahigh vacuum (p < 10-9 mbar)
(stepwise) in situ
ex situ
Substrate
Organic
sample spectrometer
3 2 1
(2) (1)
MT(Å) 110 50 16 8 4 2
e= 45°
intensity (arb. units) binding energy (eV)
Estimated from Au (5.40 eV) and IEPEN (5.1 eV): est = IEPEN- Au = - 0.3 eV Measured: exp = 0.6 eV
PEN= 0.60 eV ID = 0.95 eV (change of )
0.60
Evac EF
Koch, Vollmer, Duhm, Sakamoto, Suzuki, Adv. Mater. 19 (2007) 112
i substrate work function IE ionization energy
EF Fermi level Evac vacuum level Ishii, Sugiyama, Ito, Seki, Adv. Mater. 11 (1999) 605 Koch, ChemPhysChem 8 (2007) 1438
e h
metal surface potential changes as (linear) function of acceptor coverage due to metaladsorbate charge transfer (CT). CT creates localized dipoles
predictable tuning of HIB for any subsequent organic layer by up to 1.4 eV
Koch, Duhm, Rabe, Vollmer, Johnson, Phys. Rev. Lett. 95 (2005) 237601
+ + +
1
HIB reduction and increase small
+ + + + + +
2
HIB reduction and increase large
+ + +
HIB reduction and increase small
+ + + + + +
HIB reduction and increase large
hole injection barrier height HIB
max
acceptor coverage 0 ML HIB
min
O O F F F F F F F F
CN NC NC CN
CN CN F F F F NC NC
F4TCNQ tetrafluoro-tetracyano- quinodimethane TCAQ FAQ
for ... effective diel. const.
vac
(HOMO) (LUMO)
N neutral molecule insulating/semiconducting nP "negative Polaron" (anion) metallic nBP "negative Bipolaron" (dianion) insulating/semiconducting
(LUMO+1)
5 10 15 4.8 5.0 5.2 5.4 5.6 5.8 UPS DFT
eV Å)
LUMO of F4TCNQ becomes filled located below EF: non-metallic
Estimation of : 2 electrons transferred from Cu to F4TCNQ 2.5 Å F4TCNQ-Cu(111) bonding distance
CN CN F F F F NC NC
* Zojer & Brédas groups, TU-Graz/GA-Tech
CN CN F F F F NC NC
x z y x
3.6 (3.3) 2.1 (2.7) 0.0 (0.0)
X-ray standing waves (XSW) Density functional theory (DFT)* Bonding distances from Cu: Theory Experiment F: 3.6 Å F: 3.3 Å N: 2.1 Å N: 2.7 Å
F4TCNQ conformation is changed due to adsorption on Cu:
F4TCNQ on Cu(111): non-planar non-planarity induces dipole that decreases !
* Zojer & Brédas groups, TU-Graz/GA-Tech
H-9 L
Metal Molecule charge transfer: LUMO (-level) filled with 1.8 e Molecule Metal charge transfer: H-9 etc. (-levels) depleted of e
net CT: 0.6 e transferred to F4TCNQ
Including all effects: due to net charge transfer due to bent molecular conformation
total work function increase from theory: 0.7 eV
Romaner, Heimel, Brédas, Gerlach, Schreiber, Zegenhagen, Duhm, Koch, Zojer, Phys. Rev. Lett. 99 (2007) 256801
Orbital occupation analysis
8 9 10 11 12
intensity (arb. units)
kinetic energy (eV)
N N methyl viologen (MV0) 1,1'-dimethyl-1H,1'H-[4,4']bipyridinylidene
pristine Au 1 ML MV0/Au electron injection barriers lowered by: 0.8 eV for Alq3 0.7 eV for C60
Bröker, Blum, Frisch, Vollmer, Hofmann, Rieger, Müllen, Rabe, Zojer, Koch, Appl. Phys. Lett. 93 (2008) 243303
challenges in molecular electronics: lateral separation of individual molecules (reduce lateral cross-talk) metallic contact changes molecular electronic properties (molecule changes/loses its function)
scanning tunneling microscopy (STM) UPS (density of valence states) close packed C60 monolayer lattice constant molecular diameter 1 nm electronic cross-talk between neighboring molecules "bulk" C60: large energy gap (no DOVS close to EF) monolayer C60: gap-state near EF not a "semiconductor"
N N N N N N CN CN CN NC NC NC
hexa-azatriphenylene-hexanitrile (HATCN)
STM: monolayer HACTN/Ag(111) honeycomb structure w/ hole lattice constant 2 nm UPS (density of valence states) HATCN / Ag(111) is metallic partially filled LUMO cuts EF and extends into vacuum side
STM: lattice constant 2 nm C60 in hexagonal lattice individual C60 molecules (reduced cross-talk) UPS (density of valence states)
Using "soft molecular metal" as structural template, i.e., HATCN/Ag(111): metallic contact to individual C60 molecules function ("semiconductor") preserved at room temperature
C60 on HATCN / Ag(111) has bulk electronic structure
Glowatzki, Bröker, Blum, Hofmann, Rabe, Müllen, Zojer, Koch, Nano Lett. 8 (2008) 3825
rather complex multiple mechanisms; simple models do not apply.
(for adsorption on "clean" metals) + injection barrier tuning with acceptors/donors: concept transfer from UHV to even air feasible Using "soft molecular metal" as structural template: metallic contact to individual C60 molecule function ("semiconductor") preserved at room temperature
HU-Berlin Georg Heimel Jürgen P. Rabe
Financial Support:
BESSY Antje Vollmer Supramolecular Systems Ralf-Peter Blum Benjamin Bröker Steffen Duhm (now Chiba U) Johannes Frisch Fatemeh Ghani Hendrik Glowatzki Sven Käbisch Ingo Salzmann Raphael Schlesinger Rasmus Talviste Jörn-Oliver Vogel Shuwen Yu Jian Zhang TU-Graz Lorenz Romaner Egbert Zojer Georgia-Tech Jean-Luc Brédas Hasylab Robert L. Johnson
Andreas Elschner U Tübingen Alexander Gerlach Frank Schreiber ESRF Jörg Zegenhagen MPI-Polymer Res. Ralph Rieger Klaus Müllen