Fault Detective Test Analyzer 2004 Board Test Workshop Doug Manley - - PowerPoint PPT Presentation

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Fault Detective Test Analyzer 2004 Board Test Workshop Doug Manley - - PowerPoint PPT Presentation

Fault Detective Test Analyzer 2004 Board Test Workshop Doug Manley Loveland, CO Gray Fault Detective Captures Test Paths and characteristic Component Characteristics s untested, green tested Present Nois Ope Present Nois Ope e Test


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SLIDE 1

Fault Detective Test Analyzer

2004 Board Test Workshop

Doug Manley Loveland, CO

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SLIDE 2

Test Optimization Software 8/19/2004 Agilent Confidential Page 2

Fault Detective Captures Test Paths and Component Characteristics

amplifier relay capacitor

Gai n Gai n

Flatnes s Flatnes s

Disto rtion Disto rtion Nois e Nois e

Ope n Ope n

Clos e Clos e

Present , works correctl y Present , works correctl y

amplifier relay capacitor

Gai n Gai n

Flatnes s Flatnes s

Disto rtion Disto rtion Nois e Nois e

Ope n Ope n

Clos e Clos e

Present , works correctl y Present , works correctl y

Flatnes s is unique

Test 1 path PASS Test 2 path FAIL Diagnosis: Amp: 94%, Relay: 5%, Capacitor: 1% Test Coverage: Capacitor: 95%, Relay 50%, Amp 40%

Gray characteristic s untested, green tested

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SLIDE 3

Test Optimization Software 8/19/2004 Agilent Confidential Page 3

Test Analyzer Helps You Compare the Effectiveness of Alternate Test Strategies

Internal Test External Test

From 73% to 84% Fault Detection

From 18% to 53% Diagnostic Accuracy From 3.3 to 1.5 Repair Attempts

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SLIDE 4

Test Optimization Software 8/19/2004 Agilent Confidential Page 4

And More Improvements Possible

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SLIDE 5

Test Optimization Software 8/19/2004 Agilent Confidential Page 5

Understanding the DNA of a Test Process

Type

  • Ref. Designator

Part No. Pins Score Grade Score Grade Score Grade Digital LIB u21 1 144 100% HIGH 100% HIGH 100% HIGH Other LIB u17 2 80 38% LOW 76% POOR 82% LOW Digital LIB u11 3 48 86% HIGH 86% LOW 86% LOW Mixed LIB u1 4 28 95% HIGH 95% MED 95% MED Other LIB u2 5 28 98% HIGH 98% HIGH 98% HIGH Other LIB u6 6 28 100% HIGH 100% HIGH 100% HIGH Connector cn1 7 27 0% NO 76% POOR 82% LOW Digital LIB u14 8 6 0% NO 76% POOR 82% LOW Capacitor c118 9 2 93% HIGH 93% MED 93% MED Capacitor c119 10 2 100% HIGH 100% HIGH 100% HIGH Bypass c12 11 2 0% NO 76% POOR 82% LOW Bypass c120 12 2 0% NO 76% POOR 82% LOW Capacitor c121 13 2 90% HIGH 90% MED 90% MED Capacitor c122 14 2 0% NO 76% POOR 76% POOR Capacitor c123 15 2 0% NO 76% POOR 76% POOR Capacitor c124 16 2 100% HIGH 100% HIGH 100% HIGH Capacitor c125 17 2 98% HIGH 98% HIGH 98% HIGH Bypass c126 18 2 0% NO 76% POOR 82% LOW Capacitor c129 19 2 0% NO 76% POOR 82% LOW Bypass c13 20 2 0% NO 76% POOR 82% LOW Bypass c130 21 2 0% NO 76% POOR 82% LOW Bypass c131 22 2 0% NO 76% POOR 82% LOW Bypass c132 223 2 0% NO 76% POOR 82% LOW Capacitor c147 24 2 0% NO 76% POOR 82% LOW Capacitor c15 25 2 0% NO 76% POOR 82% LOW Capacitor c150 26 2 100% HIGH 100% HIGH 100% HIGH Bypass c151 27 2 0% NO 76% POOR 82% LOW Capacitor c153 28 2 100% HIGH 100% HIGH 100% HIGH Capacitor c154 29 2 100% HIGH 100% HIGH 100% HIGH Capacitor c155 30 2 88% HIGH 88% LOW 88% LOW Capacitor c156 31 2 90% HIGH 90% MED 90% MED FT + AXI FT + AXI + AOI Component Functional Coverage

Potentia l “No Trouble Found”

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SLIDE 6

Test Optimization Software 8/19/2004 Agilent Confidential Page 6

Fault Detective Test Analyzer The Software Instrument That Predicts Test Suite Effectiveness