EE 213, Microscopic Nanocharacterization of Materials Class website: - - PowerPoint PPT Presentation

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ee 213 microscopic nanocharacterization of materials
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EE 213, Microscopic Nanocharacterization of Materials Class website: - - PowerPoint PPT Presentation

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EE 213, Microscopic Nanocharacterization of Materials Class website: https://ee213-winter16-01.courses.soe.ucsc.edu/ Time/place: Tu/Th 10-11:45am. Baskin 156 Mike Isaacson, Baskin 237 Email: msi@soe.ucsc.edu Tele: 831-459-3190 Admin. Asst.

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EE 213, Nanocharacteriza2on/M.Isaacson

EE 213, Microscopic Nanocharacterization of Materials

Class website: https://ee213-winter16-01.courses.soe.ucsc.edu/ Time/place: Tu/Th 10-11:45am. Baskin 156 Mike Isaacson, Baskin 237 Email: msi@soe.ucsc.edu Tele: 831-459-3190

  • Admin. Asst. Rachel Cordero: rcordero@soe.ucsc.edu, 831-459-2921
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EE 213, Nanocharacteriza2on/M.Isaacson

EE 213. Information. W2016

Grading:

  • Approx. 2-3 homework sets

1 final paper about 10 pages long 1 final presentation (15 minutes)

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EE 213, Nanocharacteriza2on/M.Isaacson

Microscopic Nanocharacterization of Materials. 1

TENTATIVE Introduction/Microcharacterization Electron Beam Excitation Methods SEM, STEM, TEM, EFEM, UFEM, etc. Ion Beam Excitation Methods PIXE, RBS, SIMS, HeIM Xray Excitation Methods Microscopy, Microprobe, PEM

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EE 213, Nanocharacteriza2on/M.Isaacson

Microscopic Nanocharacterization of Materials. 2

Photon Beam Excitation Methods Wide Field, Confocal, Two photon microscopy Superresolution Microscopy Lensless Microscopy Point Projection Xrays, Atom Probe Scanned Tip STM, AFM, NSOM, SCM, etc. Tomographic Methods Comparison of Various Techniques

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HOW WE VIEW THE WORLD?

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!!!Microscopy!Through!the!Centuries!

!

!!!d!=!constant!x!!λ/nsinΘ! !

! ! To#get#better#resolution:!

!

1)!Reduce!λ! !!!!!!!!!electrons,!Xrays,!etc.! ! !!!!!!!!!!!!!!!!!!!!!!!!!!!!!2)!Increase!nsinΘ! !!!!!!!better!lenses,!oil!

!

!!!!!!!!!3)!Decrease!constant! !!!!!!!!!!!!!!confocal! !

!!!!!!!4)!Take!away!lenses!

!!!!!!!!!!near!field/scanned!tip!

! !!!!!!!!!!!!!!!!!!!!!!!!!!!!!!5)!Find!the!center/computation!

!!!!!“super!resolution”!

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EE 213, Nanocharacteriza2on/M.Isaacson

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EE 213, Nanocharacteriza2on/M.Isaacson

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Ibn Al-Haytham, “Kitab al-Manazir” (Book

  • f Optics, abt. 1010). Translated into Latin

(1572) as “Opticae Thesaurus” Expanded drawing from Al-Haytham

From: www.islamic-study.org/optics.htm

Principles of the Camera Obscura

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EE 213, Nanocharacteriza2on/M.Isaacson

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Point Projection Microscopy: The Field Ion Microscope

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Field Ion Micrograph: Platinum Tip

  • E. W. Mueller, Science. 149,591 (1965)
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Near Field Scanning Optical Microscopy (Reflection)

aluminum on silicon Shear force NSOM

400nm

Cline and Isaacson, Ultramicroscopy

EE 213, Nanocharacteriza2on/M.Isaacson

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The Idea of Near Field Op2cal Imaging

From D. McMullan, Proc. RMS. 25(2).1990.p.130

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NSOM Instrument Constructed at Cornell

M.Isaacson, 8/3/10

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60 nm away 600 nm away

Effect of Distance on Spatial Resolution

600 nm

M.Isaacson, et.al. 1990

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There is nothing more deceiving than an image unless you know the rules of translation

Penrose triangle Kanizsa Triangle

EE 213, Nanocharacteriza2on/M.Isaacson

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EE 213, Nanocharacteriza2on/M.Isaacson

Zolner Illusion, 1860, astrophysicist

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10µm

Surface of Moon Rock from Apollo 11 Mission Using Field Emission SEM, (SE image)

  • M. Isaacson, D. Johnson and A.V. Crewe, 1969 EE 213, Nanocharacteriza2on/M.Isaacson
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What does the secondary electron image in the SEM mean?”

EE 213, Nanocharacteriza2on/M.Isaacson

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Nanostructure characterization wide variety of techniques:

(after Brodie)

EE 213, Nanocharacteriza2on/M.Isaacson

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HOW WE VIEW THE WORLD?

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$ ! !

!"#$%&

"#"$%&'()*+"%,$! &)-,)%,'+! #,*.%/!0&)1/!,'+/! 234!

!'()*&

)$'56%,$)#! &)-,)%,'+! )$'56%,$)#/! 6%"%.'6$'7"!

%'(+$&

("$.)+,$)#/! )%'(,$!8'&$"6! 2%1#56/!9:4!

!,-..&

$."(,$)#! ;'+!$'+-5$%)+$"/! <)+'!$."(,$)#! 6"+6'&!

$ ! ! $ ! !

!

,electrons

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EE 213, Nanocharacteriza2on/M.Isaacson

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EELS from nucleic acid bases

From: M. Isaacson, 1972 EE 213, Nanocharacteriza2on/M.Isaacson

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Nanodevices Require Atomic Characterization Scanning Transmission Electron Microscope

/ heavy atoms

EE 213, Nanocharacteriza2on/M.Isaacson

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Gold Atoms on 2nm thick amorphous carbon substrate STEM Annular Dark Field Signal, 30KeV

M.Isaacson, M.Ohtsuki, M. Utlaut, D.Kopf and A.V.Crewe, 1979

EE 213, Nanocharacteriza2on/M.Isaacson

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EE 213, Nanocharacteriza2on/M.Isaacson

For electrons

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100 nm Aluminum Film Self-Supported on Silicon Fingers

secondary electron image

  • M. Isaacson and K. Lin

SE only SE + SE(BSE)

EE 213, Nanocharacteriza2on/M.Isaacson

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S = NJσYF S = signal in counts/sec

N = # atoms in volume probed J = current density in probe (#/area/sec) σ = cross section for interaction (area) Y = yield of process to be detected F = efficiency of collection

EE 213, Nanocharacteriza2on/M.Isaacson

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