EE 213, Microscopic Nanocharacterization of Materials Class website:

EE 213, Microscopic Nanocharacterization of Materials Class website: https://ee213-winter16-01.courses.soe.ucsc.edu/ Time/place: Tu/Th 10-11:45am. Baskin 156 Mike Isaacson, Baskin 237 Email: msi@soe.ucsc.edu Tele: 831-459-3190 Admin. Asst. Rachel Cordero: rcordero@soe.ucsc.edu, 831-459-2921 EE 213, Nanocharacteriza2on/M.Isaacson

EE 213. Information. W2016 Grading: Approx. 2-3 homework sets 1 final paper about 10 pages long 1 final presentation (15 minutes) EE 213, Nanocharacteriza2on/M.Isaacson

Microscopic Nanocharacterization of Materials. 1 TENTATIVE Introduction/Microcharacterization Electron Beam Excitation Methods SEM, STEM, TEM, EFEM, UFEM, etc. Ion Beam Excitation Methods PIXE, RBS, SIMS, HeIM Xray Excitation Methods Microscopy, Microprobe, PEM EE 213, Nanocharacteriza2on/M.Isaacson

Microscopic Nanocharacterization of Materials. 2 Photon Beam Excitation Methods Wide Field, Confocal, Two photon microscopy Superresolution Microscopy Lensless Microscopy Point Projection Xrays, Atom Probe Scanned Tip STM, AFM, NSOM, SCM, etc. Tomographic Methods Comparison of Various Techniques EE 213, Nanocharacteriza2on/M.Isaacson

HOW WE VIEW THE WORLD? !"#!"$ %&'("$ )*+&'!+'%"$ $ ! ! !"#$%& "#"$%&'()*+"%,$! #,*.%/!0&)1/!,'+/! &)-,)%,'+! 234! , electrons !'()*& )$'56%,$)#! )$'56%,$)#/! &)-,)%,'+! 6%"%.'6$'7"! %'(+$& ("$.)+,$)#/! 2%1#56/!9:4! )%'(,$!8'&$"6! $."(,$)#! ;'+!$'+-5$%)+$"/! !,-..& <)+'!$."(,$)#! 6"+6'&! $ ! ! $ ! ! !

!!!Microscopy!Through!the!Centuries! ! !!! d!=!constant!x!! λ /nsin Θ ! ! ! ! To#get#better#resolution: ! ! 1)!Reduce! λ ! !!!!!!!!!electrons,!Xrays,!etc.! ! !!!!!!!!!!!!!!!!!!!!!!!!!!!!!2)!Increase!nsin Θ ! !!!!!!!better!lenses,!oil! ! !!!!!!!!!3)!Decrease!constant! !!!!!!!!!!!!!!confocal! ! !!!!!!! 4)!Take!away!lenses! !!!!!!!!!!near!field/scanned!tip! ! !!!!!!!!!!!!!!!!!!!!!!!!!!!!!! 5)!Find!the!center/computation! !!!!!“super!resolution”!

EE 213, Nanocharacteriza2on/M.Isaacson

Principles of the Camera Obscura Ibn Al-Haytham, “ Kitab al-Manazir ” (Book of Optics, abt. 1010). Translated into Latin (1572) as “ Opticae Thesaurus ” Expanded drawing from Al-Haytham From: www.islamic-study.org/optics.htm

Point Projection Microscopy: The Field Ion Microscope

Field Ion Micrograph: Platinum Tip E. W. Mueller, Science . 149,591 (1965)

Near Field Scanning Optical Microscopy (Reflection) aluminum on silicon 400nm Shear force NSOM Cline and Isaacson, Ultramicroscopy EE 213, Nanocharacteriza2on/M.Isaacson

The Idea of Near Field Op2cal Imaging From D. McMullan, Proc. RMS. 25(2).1990.p.130

NSOM Instrument Constructed at Cornell M.Isaacson, 8/3/10

Effect of Distance on Spatial Resolution 60 nm away 600 nm away 600 nm M.Isaacson, et.al. 1990

There is nothing more deceiving than an image unless you know the rules of translation Penrose triangle Kanizsa Triangle EE 213, Nanocharacteriza2on/M.Isaacson

Zolner Illusion, 1860, astrophysicist EE 213, Nanocharacteriza2on/M.Isaacson

Surface of Moon Rock from Apollo 11 Mission Using Field Emission SEM, (SE image) 10 µ m M. Isaacson, D. Johnson and A.V. Crewe, 1969 EE 213, Nanocharacteriza2on/M.Isaacson

What does the secondary electron image in the SEM mean? ” EE 213, Nanocharacteriza2on/M.Isaacson

Nanostructure characterization wide variety of techniques: (after Brodie) EE 213, Nanocharacteriza2on/M.Isaacson

HOW WE VIEW THE WORLD? !"#!"$ %&'("$ )*+&'!+'%"$ $ ! ! !"#$%& "#"$%&'()*+"%,$! #,*.%/!0&)1/!,'+/! &)-,)%,'+! 234! , electrons !'()*& )$'56%,$)#! )$'56%,$)#/! &)-,)%,'+! 6%"%.'6$'7"! %'(+$& ("$.)+,$)#/! 2%1#56/!9:4! )%'(,$!8'&$"6! $."(,$)#! ;'+!$'+-5$%)+$"/! !,-..& <)+'!$."(,$)#! 6"+6'&! $ ! ! $ ! ! !

EELS from nucleic acid bases From: M. Isaacson, 1972 EE 213, Nanocharacteriza2on/M.Isaacson

Nanodevices Require Atomic Characterization / heavy atoms Scanning Transmission Electron Microscope EE 213, Nanocharacteriza2on/M.Isaacson

Gold Atoms on 2nm thick amorphous carbon substrate STEM Annular Dark Field Signal, 30KeV EE 213, Nanocharacteriza2on/M.Isaacson M.Isaacson, M.Ohtsuki, M. Utlaut, D.Kopf and A.V.Crewe, 1979

For electrons EE 213, Nanocharacteriza2on/M.Isaacson

100 nm Aluminum Film Self-Supported on Silicon Fingers secondary electron image SE only SE + SE(BSE) M. Isaacson and K. Lin EE 213, Nanocharacteriza2on/M.Isaacson

S = NJ σ YF S = signal in counts/sec N = # atoms in volume probed J = current density in probe (#/area/sec) σ = cross section for interaction (area) Y = yield of process to be detected F = efficiency of collection EE 213, Nanocharacteriza2on/M.Isaacson

EE 213, Microscopic Nanocharacterization of Materials Class website: - PowerPoint PPT Presentation

EE 213, Microscopic Nanocharacterization of Materials Class website: https://ee213-winter16-01.courses.soe.ucsc.edu/ Time/place: Tu/Th 10-11:45am. Baskin 156 Mike Isaacson, Baskin 237 Email: msi@soe.ucsc.edu Tele: 831-459-3190 Admin. Asst.

Beta Decay Beta Decay Microscopic picture Microscopic picture On a more fundamental level, beta

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