SLIDE 14 By analysing the diffraction pattern with SAED technique, rhombohedral structures were identified, with lattice parameters: a = 0.25221 nm and c = 4.3245 nm (ASTM pattern: 79-1473), corresponding to diamond.
0,34 nm 0,28 nm 0,24 nm 0,24 nm 0,34 nm
HRTEM picture of DLC film deposited by TVA method
The DLC films were investigated using HRTEM (High Resolution Transmission Electron Microscopy) and SAED (Selected Area Electron Diffraction) methods.
SAED picture
The films were adherent to the Si substrate and determined improved mechanical properties (especially the fracture toughness) of the Si tips.
CARBON SILICON
SEM picture of an implantable Si tip covered with DLC film
From HRTEM analysis, interference beams could be observed, given by the nanostructured particles of diamond and graphite from the amorphous carbon film. The arrows shows the interplanar distances corresponding to crystalline structures.
DLC CHARACTERIZATION