Dielectric loaded cavity report Huy Phan McDaniel College - PowerPoint PPT Presentation

Dielectric loaded cavity report Huy Phan McDaniel College Fermilab

Objective • Test out various dielectric materials used for cavity insert by simulation • Measure expected quality factor and RF of test cavity using different insert. • Examine dielectric heating and thermal expansion for insert in test cavity

Sample cavity

Insert properties • Alumina (L=2cm) • 97.6%, tan δ = 0.003, ε = 9, d = 1.40462cm • f = 536.88MHz, Q = 10145.1 • 94%, tan δ = 0.00062, ε = 9, d = 1.536cm • f = 528.75MHz, Q = 5821.42 • 96%, tan δ = 0.00044, ε = 9.2, d = 2.11074cm • f = 490.6MHZ, Q = 5018.09 • 99.5%, tan δ = 0.00014, ε = 9.3, d = 2.5323cm • f = 461.13MHz, Q = 8834.86 • 97.6%, tan δ = 0.0003, ε = 9, d = 0.8128cm • f = 564.85MHz, Q = 1544.4

• MCT ( ε = 35, tube, d out =1.03cm, d in =0.6cm, L =7cm)

• MCT ( ε = 20, tube, L = 4.94cm, d out =2.93cm, d in =0.54cm,f = 347.87MHz)

• Alumina( ε = 9.7, tube, L = 7cm, d out =2.4cm, d in =1.03cm, f = 482.96MHz)

• Forsterite( ε = 6.64, tube, L = 10cm, d out =0.9cm, d in =0.7cm, f = 574.97MHz)

• Corderite( ε = 4.6, tube, L = 2.8cm, d out =1.5cm, d in =0.55cm, f = 560.09MHz)

Simulation for alumina insert • Insert: alumina, rod, diameter = 2cm, length = 2cm

Alumina insert with different purity and loss tangent (L = 2cm, d = 2cm) tan δ \ ε 8.6 8.7 8.8 8.9 9 9.1 9.2 9.3 9.4 9.5 0.0001 12581.9 12530.4 12479.6 12429.4 12379.8 12330.9 12282.5 12234.8 12187.7 12141.1 0.0002 9190.61 9140.95 9092.07 9043.97 8996.63 8950.01 8904.12 8858.93 8814.43 8770.6 0.0003 7239.34 7194.78 7150.99 7107.97 7065.7 7024.15 6983.3 6943.15 6903.67 6864.84 0.0004 5971.52 5931.85 5892.9 5854.68 5817.17 5780.33 5744.16 5708.63 5673.73 5639.45 0.0005 5081.59 5046.09 5011.26 4977.11 4943.62 4910.75 4878.5 4846.85 4815.77 4785.27 0.0006 4422.51 4390.49 4359.09 4328.33 4298.17 4268.59 4239.58 4211.13 4183.2 4155.81 0.0007 3914.76 3885.65 3857.12 3829.18 3801.8 3774.96 3748.64 3722.83 3697.52 3672.69

• Currently working on • Heating and thermal expansion of insert in test cavity • Cooling method for overheating. • Future work • Dielectric sample test with actual cavity