CRYOGENIC AND RADIATION-HARD ASIC FOR INTERFACING LARGE FORMAT - - PowerPoint PPT Presentation
CRYOGENIC AND RADIATION-HARD ASIC FOR INTERFACING LARGE FORMAT - - PowerPoint PPT Presentation
ICSO 2014 Tenerife CRYOGENIC AND RADIATION-HARD ASIC FOR INTERFACING LARGE FORMAT NIR/SWIR DETECTOR ARRAYS P.Gao, B.Dupont, B.Dierickx, E.Mueller, G.Verbruggen , S.Gielis, R.Valvekens, About us Image sensors and periphery ASICs Founded
About us
- Image sensors and periphery ASICs
- Founded 2006
- Mechelen, Belgium
- 17 p (10 designers)
2
Supplier of Custom designed Beyond “State of the Art” CMOS Image sensors and ASIC for
Space, Scientific, Industrial and Medical applications
Outline
- Motivation
- Architecture and building block design
- Design for Radiation hardness and Cryogenic
temperature
- Test results
- Conclusions & future work
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Outline
- Motivation
- Architecture and building block design
- Design for Radiation hardness and Cryogenic
temperature
- Test results
- Conclusions & future work
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To operate an IR imagers Digital domain
Digital control core Memory & Clock Data Communication
Analog domain
Signal conditioning Analog to digital converter Regulated power supply Bias voltage/current references
Why an ASIC ?
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The ASIC
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This development aims at providing the community with a IR imager accompany ASIC
- Tailored to imagers (especially IR sensor)
– Easy to control – Simple to intergrade
- Taking in consideration multiple IR detector manufacturers
specificities
- Wide operating temperature range (77k – room T)
- Able to drive multi-sensor/array systems
- Radiation hard
– 1Mrad TID – 60MeVcm2 /mg SEU
ASIC for LF NIR/SWIR detector array
Outline
- Motivation
- Architecture and building block design
- Design for Radiation hardness and Cryogenic
temperature
- Test results
- Conclusions& future work
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Architecture
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Analog section
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Supply
- LDO
– Programmable output
- 1,3…3.4V
– Stability: PM>60° – Output current 0-100mA
- Bandgap
– 1.2V – 77K-300K
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Conversion channel
- One ADC addressed 4 analog inputs in prototype ASIC
- CDS
– Bypassable
- Preamplifier (PA)
– Programmable gain from 0-30dB in 6dB step – Offset cancellation (8-bit) – Single to differential
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ADC
- 16-bit, 100kHz, fully differential SAR ADC
– Hybrid feedback DAC – Low offset comparator auto zero
- A calibration scheme is implemented
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Digital section
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Specifications
11/2/2014 14 Digital domain Master clock 0 – 200 MHz System level protocol 2 – 200 Mbit/s Space Wire ROIC digital control 32 ROIC monitoring and trigger inputs 8 Scheduler time granularity 10M updates/s Sequence nesting depth 8 ROIC programming channel 1 SPI ASIC for LF NIR/SWIR detector array
Outline
- Motivation
- Architecture and building block design
- Design for Radiation hardness and Cryogenic
temperature
- Test results
- Conclusions& future work
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Radiation hardness: digital
- Synthetized digital logic
–DARE lib (IMEC & ESA)
- 0.18 um CMOS 1P6M
- Digital cell with TID, SEU, SEL tolerance
- Allows custom mixed-signal design
–Redundancy
- Hamming Codes
- Parity check
- Safe FSMs
–Watchdog Timers
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Radiation hardness: analog
DARE has a limited subset of analog component. Caeleste developed its own radhard cells
- Analog and High Voltage logic standard cells
- Full custom tactical cells
– Analog & mixed mode – TID & TnID hardness – SEL hardness – SEU hardness without TR – <20% increased Cin and power – <50% area increase
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Normal Caeleste mixed mode Caeleste RH
Design for low temperature
- Synthetized digital logic:
– A derating of speed, power, etc. of the library – SRAM
- Analog custom design:
– Active component modeling – Component selection
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Cryogenic digital design
The DARE library has never been used at 77K before
- Faster but risk for set-up and hold time violation.
– Adapted models based on characterization at 218K
- SRAM has not been validated before
– Backup registers
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Cryogenic analog design
- MOSFET modeling
– Vth: increase – Mobility: increase – MOS switch: low Ron
- Passive components
– Highly doped non silicide poly Resistor for stability – MIM capacitors
- Rely on ratios not absolutely values
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Transistor Vt NMOS: 0.68-0.91 PMOS: 0.75-0.97
Outline
- Motivation
- Architecture and building blocks design
- Design for Radiation hardness and Cryogenic
temperature
- Test results
- Conclusions
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Test setup
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Digital Controller Analog test board Precision DAC board ASIC COB Base plate
Unified design for: RT board CT board RT board CT board
+ +
Bandgap and temperature sensor
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0,0 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 70 120 170 220 270 320
- utput voltage (V)
Temperature (K)
T-sensor measurement
T coefficient: 3mV/K
1,05 1,1 1,15 1,2 1,25 1,3 1,35 50 100 150 200 250 300 350
- utput valtage (V)
Temperature (K)
Bandgap measuement
T coefficient< 1mV/K
Reference and Biases 10-bit
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- 0,04
- 0,03
- 0,02
- 0,01
0,01 0,02 0,03 0,04 200 400 600 800 1000
DNL(LSB) Input code
BIAS0 DNL
- 0,4
- 0,2
0,2 0,4 0,6 200 400 600 800 1000
INL(LSB) Input code
BIAS0 INL
- On chip SC current source.
– R range 10k – 70k ohm
R monitor
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Measured output voltage with 2MHz clock
16-bit SAR ADC INL DNL
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- INL DNL problem :
–Root cause is a AC coupling in the
layout: 2 fF cross-coupling
M5 M4
ADC INL DNL
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- ADC INL DNL problem analysis
ADC INL DNL
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- ADC INL DNL @ 50KHz fs
Measurement summary
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Specs
Measurement result @ room T @ cryogenic T Supply voltage 3.5-3.6V Total current consumption 53mA 60.5mA Regulator PSRR > 40dB Regulator I out > 40mA Output impedance < 1Ω LDO output 1.3-3.4 V Analog rail to rail voltage 3.3 V Reference DAC INL 0.7LSB 1LSB Reference DAC DNL 0.06LSB 0.04LSB ADC noise 2.5LSB 2.1LSB ADC fs 50, 100, 200KHz ADC INL 78LSB (15LSB@50KHz) ADC DNL 76LSB (16LSB@50KHz) Monitor resistance range 10KΩ -70KΩ Number of digital outputs/ inputs 32 / 8 Digital output clock speed 0-10 MHz Serial interface speed 50KHz-50MHz SpaceWire bit rate 0-200 Mbps ASIC start-up time ≤50us Temperature range 77K-room T (Measured)
Outline
- Motivation
- Architecture and building
block design
- Design for Radiation hardness
and Cryogenic temperature
- Test results
- Conclusions& future work
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Conclusions
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- Prototype accompany ASIC for (IR) detector arrays which
provide all functionalities has been demonstrated
– ADC problem founded and will solve in next iteration
- Full function has been proven from cryogenic (77K) to
room temperature
– All Caeleste custom designed cells – Digital cells in DARE Lib. Including SRAM
- Highly flexible for ROICs
– Highly programmable sequencer – Wide programmability and large dynamic ranges in analog acquisition chain
- Beyond IR imagers
ASIC for LF NIR/SWIR detector array
Next steps ?
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- Larger ASIC with multiple channels (32 to 64)
- Faster ADCs is now developing at Caeleste (up to
12MS/s with reduced resolution)
- Irradiation testing
- More discussion with instrument builders and IR sensor
manufacturers for further enhancements
ASIC for LF NIR/SWIR detector array
Thank you!
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