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Adapting Synchronizers Adapting Synchronizers to the Effects of to the Effects of On Chip Variability On Chip Variability Jun Zhou, David Kinniment Kinniment, Gordon Russell , Gordon Russell Jun Zhou, David and Alex Yakovlev Yakovlev and


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SLIDE 1

Adapting Synchronizers Adapting Synchronizers to the Effects of to the Effects of On Chip Variability On Chip Variability

Jun Zhou, David Jun Zhou, David Kinniment Kinniment, Gordon Russell , Gordon Russell and Alex and Alex Yakovlev Yakovlev

Microelectronics System Design Group Microelectronics System Design Group Newcastle University Newcastle University

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SLIDE 2

Overview Overview

  • On

On-

  • chip Variability

chip Variability

  • Effects of On

Effects of On-

  • chip Variability on

chip Variability on Synchronizer Performance Synchronizer Performance

  • Proposed Adaptation Schemes

Proposed Adaptation Schemes

  • Conclusions

Conclusions

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SLIDE 3

On On-

  • chip Variability

chip Variability

  • Process Variation:

Process Variation: V Vth

th, L

, Leff

eff, W

, Weff

eff

  • Voltage Variation

Voltage Variation

  • Temperature Variation

Temperature Variation

  • Non

Non-

  • uniform Power Supply Distribution

uniform Power Supply Distribution

  • Switching Activity

Switching Activity

  • IR drop

IR drop

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SLIDE 4

Overview Overview

  • On

On-

  • chip Variability

chip Variability

  • Effects of On

Effects of On-

  • chip Variability on

chip Variability on Synchronizer Performance Synchronizer Performance

  • Proposed Adaptation Schemes

Proposed Adaptation Schemes

  • Conclusions

Conclusions

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SLIDE 5

What is Synchronizer? What is Synchronizer?

C1 C2 C3 C4 Sync Sync Sync Sync Sync Sync Sync Sync C1 C1 C1 C1

Network On Chip

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SLIDE 6

Why Synchronizer? Why Synchronizer?

The synchronization time here is one clock cycle.

FF

CLK DATA Q DATA CLK Q

Metastability

FF

CLK DATA

FF

Q

1 1 Metastability Two Flip-flop Synchronizer

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SLIDE 7

Synchronization Time Constant Synchronization Time Constant τ τ & Synchronization time & Synchronization time

Synchronizer Time Constant Synchronizer Time Constant τ τ determines the resolution speed of determines the resolution speed of metastability in Synchronizers. metastability in Synchronizers. Normally a synchronization time Normally a synchronization time

  • f 30 to 40
  • f 30 to 40 τ

τ is required to give a 4 is required to give a 4-

  • month Mean Time Between

month Mean Time Between Failures (MTBF) Failures (MTBF).

τ 1

Input Time Input Time Output Time

Input Time Input Time vs vs Output Time Output Time

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SLIDE 8

Effects of On Effects of On-

  • chip Variability on

chip Variability on Synchronizer Performance Synchronizer Performance

Process Variation Process Variation

180nm 180nm 90nm 90nm 45nm 45nm

σ of τ

4% 4% 8% 8% 16% 16%

  • M. Garg et al., ISCAS 2005, May 2005 & International Technology Roadmap for

Semiconductors 2005

Vdd Vdd (V) (V) 1.1 1.1 1.0 1.0 0.9 0.9 0.8 0.8 0.7 0.7 0.6 0.6 0.5 0.5 0.4 0.4 τ (ps) at 27ºC 12.19 13.67 15.46 19.64 30.71 60.55 159.45 525.82 τ (ps) at - 25ºC 10.24 12.06 14.28 18.66 36.33 97.81 338.43 1403.76

Voltage & Temperature Variation Voltage & Temperature Variation

Simulation results of Jamb latch at 90nm

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SLIDE 9

Overview Overview

  • On

On-

  • chip Variability

chip Variability

  • Effects of On

Effects of On-

  • chip Variability on

chip Variability on Synchronizer Performance Synchronizer Performance

  • Proposed Adaptation Schemes

Proposed Adaptation Schemes

  • Conclusions

Conclusions

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SLIDE 10

Synchronizer Selection Scheme Synchronizer Selection Scheme

Problem

Technology: 90nm Mean Value of τ: 11 ps Standard Deviation of τ: 8% In the worst case we have to allow for a τ of 3.09 σ or 13.72 ps to ensure that the probability of a synchronizer having τ worse than this is 0.001. For a 100-synchronizer system with 5 GHz clock and data a synchronization time

  • f 40 τ is required to give a 4-month system MTBF. In this case the

synchronization time of all synchronizers on the chip has to be increased by:

ps 77 . 108 40 ) 11 72 . 13 ( = × −

This will add to the delay of all synchronizers on the chip and therefore affect the system performance.

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SLIDE 11

Synchronizer Selection Scheme Synchronizer Selection Scheme

Solution 1

Increase the transistors size in the synchronizer to say 4 times its original value. We simply assume that this will reduce the standard deviation of τ from 8% to: % 4 4 % 8 = = σ Now in stead of 108 ps, the synchronization time of all the synchronizers

  • n the chip only need to be increased by:

ps 4 . 54 40 ) 11 36 . 12 ( = × −

Improvement: 54 ps

Disadvantage:

  • 1. Power Consumption is also increased by 4 times.
  • 2. Increasing transistors size can not reduce all kinds of process variations,

so the actual standard deviation of τ after increasing is more than 4%.

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SLIDE 12

Synchronizer Selection Scheme Synchronizer Selection Scheme

Solution 2 (Synchronizer Selection Scheme)

Make 4 standard size synchronizers, measure their τ on chip, and select the best one. The probability of one synchronizer having τ worse than 11.81 ps is 17.8%, but the probability of all four synchronizers having τ worse than this is 0.1784, or 0.001. In this sense, now the synchronization time of all synchronizers on the chip

  • nly need to be increased by:

ps 4 . 32 40 ) 11 81 . 11 ( = × −

Improvement: 76 ps --- 22 ps better than Solution 1 (54 ps).

In addition, after the selection, all the other synchronizers are powered down, as is the measurement circuitry. Power during operation is therefore the same as for a single synchronizer.

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SLIDE 13

Synchronization Time Synchronization Time Adjustment Scheme Adjustment Scheme

Problem

Process Variation 25% worse value of τ Voltage Variation & Temperature Variation 25% worse value of τ In order to achieve the required MTBF, all the synchronizer times on the chip need to be extended to over 1.5 times their original values. However, the actual amount of the variations for some of the synchronizers on the chip may be less than the worst case. So the extended synchronization time may be wasted.

Solution: Adjust the synchronization time of each synchronizer on the

chip according to the actual process, voltage, temperature and data rate variations to improve the system performance on the condition that the required MTBF is still met.

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SLIDE 14

On On-

  • chip Measurement

chip Measurement

  • f Failure Rates
  • f Failure Rates

Both Scheme are based on the on-chip measurement of failure rates.

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SLIDE 15

Calculation of Calculation of τ τ and MTBF from and MTBF from Failure Rates Failure Rates

Calculate τ

τ 1 3

* 1 3

T T

e MTBF MTBF

= Calculate MTBF

2 _ 1 _ ln 1 2 Rate Failure Rate Failure T T − = τ

τ 1 3

* ) ( _ 1 _ * _ 3 3

T T

e known

  • utput

Counter period Clock

  • utput

Counter MTBF

=

τ 1 2

1 2

T T

e MTBF MTBF

=

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SLIDE 16

FPGA Implementation FPGA Implementation

To assess their feasibility, the two adaptation schemes proposed have been implemented using Xilinx’s FPGA Spartan 3. Synchronizer Selection Scheme Synchronizer Selection Scheme Synchronization Time Adjustment Scheme Synchronization Time Adjustment Scheme

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SLIDE 17

FPGA Implementation FPGA Implementation

On On-

  • chip Overhead

chip Overhead Off Off-

  • chip Overhead

chip Overhead Synchronizer Synchronizer Selection Scheme Selection Scheme 9 9 flipflops flipflops and 6 gates per and 6 gates per synchronizer synchronizer 34 34 flipflops flipflops and 110 and 110 gates gates Synchronization Synchronization Time adjustment Time adjustment Scheme Scheme 33 33 flipflops flipflops and 104 gates and 104 gates per synchronizer per synchronizer 436 436 flipflops flipflops and 732 and 732 gates gates

Synchronizer Selection Scheme has a small on-chip and off-chip overhead, and it can be put entirely on chip. Synchronization Time Adjustment Scheme has a relatively large overhead. When used to deal with process variation, infrequent voltage variation or temperature variation, the major part of it can be put off chip. When used to track frequent voltage variation or data rate variation, it has to be put on chip entirely. However, there are some ways to reduce the

  • verhead such as making trade off between the calculation accuracy of MTBF and the

Haedware overhead, or direct mapping failure rates to MTBF.

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SLIDE 18

Overview Overview

  • On

On-

  • chip Variability

chip Variability

  • Effects of On

Effects of On-

  • chip Variability on

chip Variability on Synchronizer Performance Synchronizer Performance

  • Proposed Adaptation Schemes

Proposed Adaptation Schemes

  • Conclusions

Conclusions

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SLIDE 19

Conclusions Conclusions

Two adaptation schemes have been proposed to reduce the effects of on-chip variability on synchronizers. To assess their feasibility, the two schemes have b e e n i m p l e m e n t e d u s i n g X i l i n x ’ s F P G A S p a r t a n 3 . Synchronizer Selection Scheme is used to mitigate the effects of process variation by selecting the best synchronizer from a bunch of redundant

  • synchronizers. It has a small overhead and can be put entirely on chip. It only

needs to operate once when setting up the chip. After selection all the redundant synchronizers can be powered down as is measurement circuitr so the power consumption during operation is the same as for a single synchronizer. Synchronization Time Adjustment Scheme is used to improve the system performance by reducing the overdesigned synchronization time according to the actual on-chip variability on the condition that the required MTBF is still met. It has a relatively large overhead. When used to deal with process variation, infrequent voltage variation or temperature variation, the major part of it can be put off chip. When used to track frequent voltage variation or data rate variation, it has to be put on chip entirely. However, it is possible to reduce the overhead such as reducing the calculation accuracy of MTBF or direct mapping failure rates to MTBF.

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SLIDE 20

Thanks! Thanks!

Questions?

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SLIDE 21

Calculation of Calculation of τ τ and MTBF from and MTBF from Failure Rates Failure Rates

Calculate τ

2 _ 1 _ ln 1 2 2 _ 1 _ 1 2

1 2 1 2

Rate Failure Rate Failure T T e Rate Failure Rate Failure e MTBF MTBF f f T e MTBF

T T T T d c w t

− = ∴ = ∴ = ∴ =

− −

τ

τ τ τ

Q

τ

τ τ τ τ

1 3 * ) _ 3 ln( , _ 3 * _ 1 ln * _ 3 _ 3 * _ 1 * ) ( _ 1 _ * _ 3 3 * 1 3

1 3 1 3 1 3 1 3

T T Y X e e e

  • utput

Counter Y period Clock MTBF

  • utput

Counter X Let e

  • utput

Counter period Clock MTBF

  • utput

Counter e known

  • utput

Counter period Clock

  • utput

Counter MTBF e MTBF MTBF

T T Y X T T T T T T

− + = ∴ = ∴ = = = ∴ = ∴ =

− − − −

Q

Calculate MTBF