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Software Reliability Modeling Steven J Zeil Old Dominion Univ. - - PowerPoint PPT Presentation

Recap Historical Perspective and Implementation Exponential Failure Time Models Other Finite Failure Models Infinite Failure Mo Software Reliability Modeling Steven J Zeil Old Dominion Univ. Spring 2012 1 Recap Historical Perspective and


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Recap Historical Perspective and Implementation Exponential Failure Time Models Other Finite Failure Models Infinite Failure Mo

Software Reliability Modeling

Steven J Zeil

Old Dominion Univ.

Spring 2012

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Recap Historical Perspective and Implementation Exponential Failure Time Models Other Finite Failure Models Infinite Failure Mo

Software Reliability and System Reliability

1

Recap

2

Historical Perspective and Implementation

3

Exponential Failure Time Models Jelinski-Moranda De-eutrophication Model Goel and Okumoto NHPP Model Schneidewind’s Model Musa’s Basic Execution Time Model Hyperexponential Model

4

Other Finite Failure Models

5

Infinite Failure Models

6

Bayesian Models

7

Pre-Implementation Models

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Reliability Function

Denote the probability that the time to failure T is in some interval (t, t + ∆t) as P(t ≤ T ≤ t + ∆t) F(t) = P(0 ≤ T ≤ t) = t f (x)dx The reliability function is the probability of success at time t (i.e., the prob. that the time to failure exceeds t) R(t) = P(T > t) = 1 − F(t) = ∞

t

f (x)dx

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Failure Rate

The failure rate is the probability that a failure per unit time

  • ccurs in the interval [t, t + ∆t], given that a failure has not
  • ccurred before t.

Failure rate ≡ P(t ≤ T < t + ∆t|T > t) ∆t = P(t ≤ T < t + ∆t) (∆t)P(T > t) = F(t + ∆t) − F(t) (∆t)R(t) Failure rate measurable easier to understand than the prob. density function

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Hazard Rate

The hazard rate is defined as the limit of the failure rate as the interval ∆t approaches zero. z(t) = lim

∆t→0

F(t + ∆t) − F(t) (∆t)R(t) = f (t) Rt The hazard rate is an instantaneous rate of failure at time t, given that the system survives up to t. z(t)dt represents the probability that a system of age t will fail in the small interval t to t + dt.

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Failure Intensity Function

R(t) = exp

t z(x)dx

  • r, differentiating

f (t) = z(t) exp

t z(x)dx

  • 6
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Relating Reliability to Failure Rate (2)

Alternatively, Let te be time required to execute one test case. t = kte Assume that there is a finite limit for p/te as te becomes vanishingly small λ = lim

te→0

p te This is the failure intensity function.

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Reliability and the Failure Intensity

R(t) = lim

te→0(1 − p(te))t/te = exp(−λt)

which is the exponential distribution

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Data

Models typically employ failures per time period, or time between failures Conversion between the two is possible, with some caveats.

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Faults and Failures

In this chapter, no distinction is made between faults and failures. They are assumed to be 1-to-1. Implies that we fix all faults before they have a chance to cause a 2nd failure. Let M(t) be a random variable denoting the number of failures (faults) experienced by time t. Let µ(t) be the mean value function of M(t).

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 11

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite infinite

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite infinite

3 Type: distribution of the number of failures experienced by

time t

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite infinite

3 Type: distribution of the number of failures experienced by

time t

Poisson

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite infinite

3 Type: distribution of the number of failures experienced by

time t

Poisson binomial

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite infinite

3 Type: distribution of the number of failures experienced by

time t

Poisson binomial

4 Class (finite failure models only): Functional form of the

failure intensity as a function of time

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Model Classification Scheme

Musa & Okumoto classify models according to

1 Time domain: wall clock versus execution time 2 Category: total number of failures over infinite time

What is limt→∞ µ(t)?

finite infinite

3 Type: distribution of the number of failures experienced by

time t

Poisson binomial

4 Class (finite failure models only): Functional form of the

failure intensity as a function of time

5 Family (infinite failure models only): Functional form of the

failure intensity as a function of expected number of failures experienced

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Poisson Processes

The Poisson distribution describes the probability of a given number of events occurring in a fixed interval given that events

  • ccur at a fixed rate and are independent of the time since the last

event. f (k; λ) = λke−λ k! Divide time range 0 . . . t into a sequence of observation points t0, t1, . . . tn with t0 = 0 and tn = t. Let fi denote the # of failures occurring in ti−1 . . . ti. If the fi are independent Poisson variables, we have a Poisson process. E [fi] = µ(ti) − µ(ti−1)

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Reliability of a Poisson Process

Let ∆t be any non-negative value such that ti−1 + ∆t < ti. The the prob that the software will run reliably for another ∆t given that it has not yet failed at ti − 1 is R(∆t|t) = P(fi = 0|t) = exp

t+∆t

t

λ(x)dx

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Poisson Process and Single Faults

z(∆t|ti−1) = λ(ti−1 + ∆t) µ(t) = αFa(t) where α is the number of faults (as t → ∞) and Fa(t) is the cumulative distribution of the time to failure of a single fault a. λ(t) = αfa(t)

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Binomial Processes

Assume N is the fixed, total number of faults in the system Faults are removed immediately upon detection and new faults are never added If Ta is a reandom variable denoting the time to failure of fault a, the Ta’s are i.i.d. The Fa(t), fa(t), and za(t) are identical for all faults in this class. λ(t) = Nfa(t) µ(t) = NFa(t) N in binomial process is similar to α in the Poisson with a single type of fault.

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Exponential Failure Time Models

Models in which the failure intensity function λ(t) is exponential.

1

Recap

2

Historical Perspective and Implementation

3

Exponential Failure Time Models Jelinski-Moranda De-eutrophication Model Goel and Okumoto NHPP Model Schneidewind’s Model Musa’s Basic Execution Time Model Hyperexponential Model

4

Other Finite Failure Models

5

Infinite Failure Models

6

Bayesian Models

7

Pre-Implementation Models

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Jelinski-Moranda De-eutrophication Model

Binomial model. Time between failures is exponentially distributed with a parameter proportional to the number of remaining faults. If we start with N faults and have removed i − 1 of them, the mean time between failures is 1/φ(N − (i − 1)).

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Assumptions

1 Rate of fault detection is proportional to the # of faults in

the software Assumptions 4-6 are standard assumptions for reliability modeling.

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Assumptions

1 Rate of fault detection is proportional to the # of faults in

the software

2 Rate of fault detection is constant in the interval between

failures Assumptions 4-6 are standard assumptions for reliability modeling.

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Assumptions

1 Rate of fault detection is proportional to the # of faults in

the software

2 Rate of fault detection is constant in the interval between

failures

3 Faults are corrected instantly without introducing new faults

Assumptions 4-6 are standard assumptions for reliability modeling.

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Assumptions

1 Rate of fault detection is proportional to the # of faults in

the software

2 Rate of fault detection is constant in the interval between

failures

3 Faults are corrected instantly without introducing new faults 4 Testing is representative of operation

Assumptions 4-6 are standard assumptions for reliability modeling.

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Assumptions

1 Rate of fault detection is proportional to the # of faults in

the software

2 Rate of fault detection is constant in the interval between

failures

3 Faults are corrected instantly without introducing new faults 4 Testing is representative of operation 5 Every fault has same chance of being encountered within a

severity class Assumptions 4-6 are standard assumptions for reliability modeling.

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Assumptions

1 Rate of fault detection is proportional to the # of faults in

the software

2 Rate of fault detection is constant in the interval between

failures

3 Faults are corrected instantly without introducing new faults 4 Testing is representative of operation 5 Every fault has same chance of being encountered within a

severity class

6 Failures are independent.

Assumptions 4-6 are standard assumptions for reliability modeling.

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Data Requirements

Elapsed times between failures xi or times of failures ti such that xi = ti − ti−1

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Model Form

Xi are independent random variables with exponential distribution with mean 1/φ(N − (i − 1)) = 1/z(Xi|Ti−1) f ((Xi|Ti−1) = z(Xi|Ti−1) exp(−z(Xi|Ti−1)Xi) = φ(N − (N − 1)) exp(−φ(N − (i − 1))Xi) µ(t) = N(1 − exp(−φt)) λ(t) = Nφ exp(−φt)

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Estimation and Prediction

ˆ φ and ˆ N are obtained numerically from the Xi. After removing n faults: ˆ MTTF = 1/ˆ φ(ˆ N − n)

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Non-Homogeneous Poisson Process Model

Somewhat similar to Jelinski-Moranda, but focus is on number of failures observed in a time interval, rather than times between failures.

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) Expected number of failures over ∆t is proportional to the expected number of undetected faults.

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) Expected number of failures over ∆t is proportional to the expected number of undetected faults.

2 Finite failure model 23

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) Expected number of failures over ∆t is proportional to the expected number of undetected faults.

2 Finite failure model 3 The number of faults fi in each time interval are independent. 23

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Data Requirements

fault counts fi in each time interval completion time ti of each time interval

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Model Form

µ(t) = N(1 − e−bt) λ(t) = Nbe−bt = Nfa(t) Each fi is an indep. Poisson random variable with mean µ(ti) − µ(ti−1. Therefore the joint density of the fi’s is

n

  • i=1

(µ(ti) − µ(ti−1))fi exp(µ(ti) − µ(ti−1)) fi!

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Estimation and Prediction

ˆ b and ˆ N are obtained numerically from the fi and ti Expected # of faults in (n + 1)st interval is ˆ N

  • e−ˆ

btn − e−ˆ btn+1

  • ˆ

MTTF = 1/ˆ φ(ˆ N − n) Possible to predict the additional testing time required to achieve a reliability R over an observation time O.

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Schneidewind’s Model

Really a “meta-model” that addresses data aging: Model 1: Use all fault counts from n periods Model 2: Use fault counts only from the last s periods Model 3: Add fault counts from the last s periods, preceded by a single count n−s

i=1 fi over a time period tn−s − t0.

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Musa’s Basic Execution Time Model

One of the more heavily used Uses execution time de-couples the failure intensity function from properties of individual faults

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) = β0 [1 − exp(−β1t)], β0, β1 > 0

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) = β0 [1 − exp(−β1t)], β0, β1 > 0

2 Finite failure model

lim

t→∞ (β0 [1 − exp(−β1t)]) = β0

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) = β0 [1 − exp(−β1t)], β0, β1 > 0

2 Finite failure model

lim

t→∞ (β0 [1 − exp(−β1t)]) = β0

3 The execution times between failures are exponentially

distributed (with a constant hazard rate)

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Assumptions

In addition to the standard assumptions

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) = β0 [1 − exp(−β1t)], β0, β1 > 0

2 Finite failure model

lim

t→∞ (β0 [1 − exp(−β1t)]) = β0

3 The execution times between failures are exponentially

distributed (with a constant hazard rate)

4 Resources available for testing are constant over the total

time of observation

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Data Requirements

Elapsed times between failures xi or times of failures ti such that xi = ti − ti−1 Other factors support a conversion to/from calendar time

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Model Form

µ(t) = β0 [1 − exp(−β1t)] , β0, β1 > 0 λ(t) = β0β1 exp(−β1t) β0 is the limiting number of faults Large β1 give a rapid decrease in λ

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Hyperexponential Model

Musa & Goel Different portions of the software fail at different rates (still exponentially distributed) Leads to a sum of exponential growth curves

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Assumptions

Assume you have K subsystems. Within each subsystem

1 The rate of fault detection is proportional to the current fault

content And, within the entire program:

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Assumptions

Assume you have K subsystems. Within each subsystem

1 The rate of fault detection is proportional to the current fault

content

2 The fault detection rate remains constant between failures

And, within the entire program:

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Assumptions

Assume you have K subsystems. Within each subsystem

1 The rate of fault detection is proportional to the current fault

content

2 The fault detection rate remains constant between failures 3 Faults are corrected perfectly and instantly

And, within the entire program:

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Assumptions

Assume you have K subsystems. Within each subsystem

1 The rate of fault detection is proportional to the current fault

content

2 The fault detection rate remains constant between failures 3 Faults are corrected perfectly and instantly

And, within the entire program:

1 M(t), the cumulative failures by time t, follows a Poisson

process with mean µ(t) = N K

i=1 pi [1 − exp(−βit)], where

0 < βi < 1, 0 < pi < 1, , K

i=1 pi = 1

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Data Requirements

Fault counts fi in each of the testing intervals Completion time ti of each test period

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Model Form

µ(t) = N

K

  • i=1

pi [1 − exp(−βit)] λ(t) = N

K

  • i=1

piβi exp(−βit) β0 is the limiting number of faults Large β1 give a rapid decrease in λ

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Model Form

Let N∗

i = Npi. Then obtain parameter estimates in each class.

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Other Finite Failure Models

Weibull distribution is used in hardware reliability because it can accommodate increasing as well as decreasing failure rates S-Shaped model uses a gamma distribution to suggest that growth in µ(t) eventually slows rather than continually increasing exponentially

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Infinite Failure Models

1

Recap

2

Historical Perspective and Implementation

3

Exponential Failure Time Models Jelinski-Moranda De-eutrophication Model Goel and Okumoto NHPP Model Schneidewind’s Model Musa’s Basic Execution Time Model Hyperexponential Model

4

Other Finite Failure Models

5

Infinite Failure Models

6

Bayesian Models

7

Pre-Implementation Models

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Duane’s Model

Originally a hardware model Cumulative failure rate versus cumulative testing time, plotted

  • n log-log scales, appears linear

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Assumptions

Standard assumptions plus M(t) follows a Poisson process with µ(t) = αtβ

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Data Requirements

Elapsed times between failures xi or times of failures ti such that xi = ti − ti−1

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Model Form

µ(t) = αtβ Let T be cumulative observation time: µ(T) T = αT β T = expected number of failures by time T total testing time Hence Y = ln µ(T) T

  • = ln(α) + (β − 1) ln(T)

(linear on a log-log scale)

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Estimation and Prediction

ˆ β = n n−1

i=1 ln(tn/ti)

ˆ α = n t

ˆ β n

ˆ MTTF = tn/(n ˆ β)

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Geometric Model

Moranda Variation of Jelinski-Moranda where the mean function decreases in a geometric rather than arithmetic sequence Early fixes faults have larger impact than later fixes

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Assumptions

Standard assumptions plus fault detection rate forms a geometric progression but is constant between detections z(t) = Dφi−1, 0 < φ < 1, ti−i ≤ t < ti There is an infinite number of total faults. Time between failures is exponentially distributed

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Data Requirements

Elapsed times between failures xi or times of failures ti such that xi = ti − ti−1

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Model Form

E [Xi] = 1 z(ti−1) = 1 Dφi−1

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Musa-Okumoto logarithmic Poisson

Expected number of failures over time is a logarithmic function Particularly useful when the operation use will be highly non-uniform

Early fixes have much more impact than later ones

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Assumptions

Standard assumptions plus Failure intensity decreases exponentially with expected number of failures λ(t) = λ0 exp(−θµ(t)) θ > 0 is a decay rate parameter. M(t) follows a Poisson process

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Data Requirements

Elapsed times between failures xi or times of failures ti such that xi = ti − ti−1

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Model Form

µ(t) = ln(λ0θt + 1)/θ lambda(t) = λ0 λ0θt + 1

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Bayesian Models

1

Recap

2

Historical Perspective and Implementation

3

Exponential Failure Time Models Jelinski-Moranda De-eutrophication Model Goel and Okumoto NHPP Model Schneidewind’s Model Musa’s Basic Execution Time Model Hyperexponential Model

4

Other Finite Failure Models

5

Infinite Failure Models

6

Bayesian Models

7

Pre-Implementation Models

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Littlewood-Verrall Model

Assumptions Xi are independent exponentially distributed with parameters ξi The ξi are indep. random variables with a gamma distribution parameterized by α and φ(i). φ(i) is an increasing function of i. Software is tested in a manner representative of usage The assumption of decreasing failure rates in ample data is explicit here, but implicit in the other models.

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Pre-Implementation Models

Rome Laboratory metrics

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