Serial chain test of new quad modules September 08, 2017 Aleksandra - PowerPoint PPT Presentation

Serial chain test of new quad modules September 08, 2017 Aleksandra Dimitrievska , Katherine Dunne, Maurice Garcia-Sciveres, Timon Heim, Simone Pagan Griso

Introduction Quad Module Design Data Previous Katie’s presentation: Acquisition System https://indico.physics.lbl.gov/indico/event/552/contribution/1/material/slides/0.pdf � While we wait that RD53A arrives, perform tests on the FE-I4 quad modules. � There are 5 quad modules from which 2 are without bump bonded connection to the sensor (dummy). Digital Analog Regulator Regulator Vout Vin 36 mm 42 mm Student Instrumentation Meeting Katie Dunne 3 Why do we want to test serial power chain? � baseline for ATLAS and CMS pixel detectors at HL-LHC � efficient cable usage 1

Serial power testing The plan for serial power testing: � connect two dummy quad modules (without the sensor) in series � test the noise occupancy as a function of threshold on one quad module (QM2) when the other one (QM1) is in ◦ nominal state ◦ noisy state (low threshold) QM1 V in QM2 Result: � half of one quad module (QM1) is dead: FEA and FEC What happened? 2

Serial power testing What happened? � while the noise scans were performed on the QM2 with very low threshold, QM1 received bigger voltage drop New plan for serial power testing: � use the half dead module (QM1) and connect it in series with a resistor and capacitor (mimic the other module) � measure the voltage drop on the load during the noise scans with low threshold on QM1 QM1 V in RC 3

Measurement of the voltage drop Different scans when only QM1 is powered � digital, analog, tuning, and noise and threshold scans with decreasing the threshold 4

Measurement of the voltage drop Different scans when only QM1 is powered � tuning 4 voltage B B B V V V dd da in 3.5 D D D V V V dd da in 3 V in 2.5 2 1.5 1 0.5 × 10 0 5520 5530 5540 5550 5560 time 5

Measurement of the voltage drop Different scans when only QM1 is powered � analog scan 4 voltage B B B V V V dd da in 3.5 D D D V V V dd da in 3 V in 2.5 2 1.5 1 0.5 × 10 0 5574 5574.2 5574.4 5574.6 5574.8 5575 5575.2 5575.4 5575.6 time 6

Measurement of the voltage drop Different scans when only QM1 is powered � threshold scan 4 voltage B B B V V V dd da in 3.5 D D D V V V dd da in 3 V in 2.5 2 1.5 1 0.5 × 10 0 5590 5595 5600 5605 5610 time 7

Measurement of the voltage drop Different scans when only QM1 is powered � noise scan with 100kHz frequency and trigger count 1 (nominal state) 4 voltage B B B V V V dd da in 3.5 D D D V V V dd da in 3 V in 2.5 2 1.5 1 0.5 × 10 0 5616 5617 5618 5619 5620 time 8

Measurement of the voltage drop Different scans when only QM1 is powered � noise scans with different frequency (100, 10, 1 kHz) and trigger count (1, 2, 3) (noisy state) 4 voltage B B B V V V dd da in 3.5 D D D V V V dd da in 3 V in 2.5 2 1.5 1 0.5 × 10 0 5850 5860 5870 5880 5890 5900 5910 5920 time 9

Measurement of the voltage drop Different scans with serial power QM1 and RC � noise and threshold scans with low threshold 10

Measurement of the voltage drop Different scans with serial power QM1 and RC � noise scans with different frequency (100, 10, 1 kHz) and trigger count (1, 2, 3) (noisy state) 5 voltage 4.5 4 B B B V V V 3.5 dd da in D D D V V V 3 dd da in V V R in 2.5 2 1.5 1 0.5 × 10 0 6380639064006410642064306440645064606470 time 11

Noise occupancy as a function of threshold only QM1 QM1 and RC 4000 4000 #noisy pixels #noisy pixels FEB FEB 3500 3500 FED FED 3000 3000 2500 2500 2000 2000 1500 1500 1000 1000 500 500 0 0 0 500 1000 1500 2000 2500 3000 0 500 1000 1500 2000 2500 3000 threshold threshold 12