Serial chain test of new quad modules September 08, 2017 Aleksandra - - PowerPoint PPT Presentation

Serial chain test of new quad modules

September 08, 2017 Aleksandra Dimitrievska, Katherine Dunne, Maurice Garcia-Sciveres, Timon Heim, Simone Pagan Griso

Introduction

Previous Katie’s presentation:

https://indico.physics.lbl.gov/indico/event/552/contribution/1/material/slides/0.pdf

While we wait that RD53A arrives, perform tests on the FE-I4 quad modules. There are 5 quad modules from which 2 are without bump bonded connection to the sensor (dummy).

Student Instrumentation Meeting Katie Dunne 3 Data Acquisition System

42 mm 36 mm

Quad Module Design

Digital Regulator Analog Regulator Vin Vout

Why do we want to test serial power chain? baseline for ATLAS and CMS pixel detectors at HL-LHC efficient cable usage

1

Serial power testing

The plan for serial power testing: connect two dummy quad modules (without the sensor) in series test the noise occupancy as a function of threshold on one quad module (QM2) when the other one (QM1) is in

• nominal state
• noisy state (low threshold)

QM1 QM2 Vin

Result: half of one quad module (QM1) is dead: FEA and FEC What happened?

2

Serial power testing

What happened? while the noise scans were performed on the QM2 with very low threshold, QM1 received bigger voltage drop New plan for serial power testing: use the half dead module (QM1) and connect it in series with a resistor and capacitor (mimic the other module) measure the voltage drop on the load during the noise scans with low threshold on QM1

QM1 RC Vin

3

Measurement of the voltage drop

Different scans when only QM1 is powered digital, analog, tuning, and noise and threshold scans with decreasing the threshold

4

Measurement of the voltage drop

Different scans when only QM1 is powered tuning

time 5520 5530 5540 5550 5560 10 × voltage 0.5 1 1.5 2 2.5 3 3.5 4

dd B

V

da B

V

in B

V

dd D

V

da D

V

in D

V

in

V

5

Measurement of the voltage drop

Different scans when only QM1 is powered analog scan

time 5574 5574.2 5574.4 5574.6 5574.8 5575 5575.2 5575.4 5575.6 10 × voltage 0.5 1 1.5 2 2.5 3 3.5 4

dd B

V

da B

V

in B

V

dd D

V

da D

V

in D

V

in

V

6

Measurement of the voltage drop

Different scans when only QM1 is powered threshold scan

time 5590 5595 5600 5605 5610 10 × voltage 0.5 1 1.5 2 2.5 3 3.5 4

dd B

V

da B

V

in B

V

dd D

V

da D

V

in D

V

in

V

7

Measurement of the voltage drop

Different scans when only QM1 is powered noise scan with 100kHz frequency and trigger count 1 (nominal state)

time 5616 5617 5618 5619 5620 10 × voltage 0.5 1 1.5 2 2.5 3 3.5 4

dd B

V

da B

V

in B

V

dd D

V

da D

V

in D

V

in

V

8

Measurement of the voltage drop

Different scans when only QM1 is powered noise scans with different frequency (100, 10, 1 kHz) and trigger count (1, 2, 3) (noisy state)

time 5850 5860 5870 5880 5890 5900 5910 5920 10 × voltage 0.5 1 1.5 2 2.5 3 3.5 4

dd B

V

da B

V

in B

V

dd D

V

da D

V

in D

V

in

V

9

Measurement of the voltage drop

Different scans with serial power QM1 and RC noise and threshold scans with low threshold

10

Measurement of the voltage drop

Different scans with serial power QM1 and RC noise scans with different frequency (100, 10, 1 kHz) and trigger count (1, 2, 3) (noisy state)

time 6380639064006410642064306440645064606470 10 × voltage 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

dd B

V

da B

V

in B

V

dd D

V

da D

V

in D

V

R

V

in

V

11

Noise occupancy as a function of threshold

• nly QM1

QM1 and RC

threshold 500 1000 1500 2000 2500 3000 #noisy pixels 500 1000 1500 2000 2500 3000 3500 4000 FEB FED threshold 500 1000 1500 2000 2500 3000 #noisy pixels 500 1000 1500 2000 2500 3000 3500 4000 FEB FED

12