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Pico-second resolution timing measurements Chiara Nociforo GSI - - PowerPoint PPT Presentation

Pico-second resolution timing measurements Chiara Nociforo GSI Helmholtzzentrum fr Schwerionenforschung Darmstadt - Germany NUSPIN 2017 GSI 2017 June 26-29 Contents Introduction to the Super-FRS at FAIR: RIB production and


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SLIDE 1

Pico-second resolution timing measurements

Chiara Nociforo

GSI Helmholtzzentrum für Schwerionenforschung Darmstadt - Germany

NUSPIN 2017 – GSI – 2017 June 26-29

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SLIDE 2
  • Introduction to the Super-FRS at FAIR:

RIB production and separation method

  • In-flight particle identification (PID) of relativistic heavy ions at

Super-FRS: ToF requirements & developments

  • In-beam tests of focal plane ToF detector prototypes:
  • diamond (pcCVD) & silicon material properties
  • electronics role
  • irradiation and damages

Contents

  • C. Nociforo, NUSPIN 2017
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SLIDE 3

GSI today Future facility

Super-FRS

Primary Beams 5x1011 238U28+ (pulsed) 3.5x1011 238U28+ (DC) @1.5 GeV/u factor 100 in intensity

  • ver present

The NUSTAR facility at FAIR

Secondary Beams broad range of RIBs up to 1-2 GeV/u up to factor 10000 in intensity over present

  • C. Nociforo, NUSPIN 2017
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SLIDE 4

2 3

In-flight PID

atomic number Z ≠ Q charge state mass number, TKE kinetic energy

Detectors

ToF = L βc ( )

KE

/ , / 1 /

u u

Z dE dx Z A Q m A m A Q Q T A Bρ β γβ γ ← − = = = − = f ( )

  • C. Nociforo, NUSPIN 2017

Bρ – ToF – ∆E method

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SLIDE 5

Super-FRS layout

Intensity 1011/s

  • C. Nociforo, NUSPIN 2017

Tracking detectors Tracking detectors

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SLIDE 6

Super-FRS layout

Intensity 1011/s

  • C. Nociforo, NUSPIN 2017

ToF detector (stop) ToF detector (start)

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SLIDE 7

Super-FRS layout

Intensity 1011/s

  • C. Nociforo, NUSPIN 2017

∆ ∆ ∆ ∆E detector

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SLIDE 8

Requirements on A/q separation

  • Clean full isotope identification on event-by-event basis

235U 236U 237U

yields not scaled

Monte Carlo simulations (MOCADI) σ σ σ σx = 0.5 mm, σ σ σ σt = 20 ps

σToF = 30 ps

  • C. Nociforo, NUSPIN 2017

β = 0.8, L = 55 m

σA/A = 0.7‰

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SLIDE 9

ToF detector requirements

  • C. Nociforo, NUSPIN 2017
  • homogeneous and large-area material (total 70000 mm2)
  • start/stop fast (triggering) signals

→ ToF silicon/diamond strip detectors arranged in planar geometry

− total channels (strips): 1400 chs − timing resolution (full): σt < 35 ps, σt = 20 ps for U − rate capability: 0.5 kHz/mm2 , < 15 kHz/strip − activity: < 1 kGy/year − FEE-sensor distance: > 550 mm − readout: FPGA, e-link interface − full remote control − timestamping

50x50 mm2 Si strip prototype

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SLIDE 10

Si samples matched to Si-strip capacity

(ρ= 10 kOhm cm)

digital waveform sampled

(2GHz bandwidth scope)

time jitter ~ 20 ps

σt= 28 ps 25 ps 500 ps

Silicon time properties

197Au @750MeV/u 238U @350MeV/u

by V. Eremin (St. Petersburg)

  • C. Nociforo, NUSPIN 2017
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SLIDE 11

rise time=223ps σt~24ps

  • digital waveform sampled

(20 GS/s scope)

  • small charge collection Q=2.46pC

pcCVD -DD 10x10x0.2 1 mm3

Diamond time properties

238U @350MeV/u

by GSI-DL

  • C. Nociforo, NUSPIN 2017
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SLIDE 12

ToF measurements at FRS

  • 16-strip design: (1x18) mm2 each (0.15

mm gap), C = 4.3 pF/strip

  • metallization: 50nm/100nm (Cr/Au) by

photolithography (GSI-DL)

  • PADI7 4x4chs

+5V THR BIAS

  • F. Schirru et al., J. Phys. D: Appl. Phys. 49 (2016) 215105
  • C. Nociforo, NUSPIN 2017

σ σ σ σTOF = 45.1 ± 1.4 ps σ σ σ σTOF = 45.1 ± 1.4 ps

V = -200 V THR = -5 V V = -200 V THR = -5 V

Beam profile

  • n diamonds

197Au@900MeV/u

2 x pcCVD -DD 20x20x0.3 mm3

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SLIDE 13

ToF measurements at FRS

  • 16-strip design: (1x18) mm2 each (0.15

mm gap), C = 4.3 pF/strip

  • metallization: 50nm/100nm (Cr/Au) by

photolithography (GSI-DL)

  • PADI7 4x4chs

+5V THR BIAS

  • F. Schirru et al., J. Phys. D: Appl. Phys. 49 (2016) 215105
  • C. Nociforo, NUSPIN 2017

V = -200 V THR = -5 V V = -200 V THR = -5 V

197Au@900MeV/u

2 x pcCVD -DD 20x20x0.3 mm3

  • no rate dependence observed
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SLIDE 14

σDD2 ~ 35 ps σDD1 ~ 25 ps

S2-S4 Detector resolution

σDD contribution

Measured VFTX/PADI intrinsic time resolution: 15 ps (σ)

  • C. Nociforo, NUSPIN 2017

σDD = √ σToF

2 - σj 2 = √ (45.1)2 – (15)2 = 42.5 ps

PADI ASIC 180 nm CMOS

  • rise time < 500 ps
  • 30 fC <Q< 2000 fC
  • σtE < 15 ps
  • LVDS digital outputs
  • 350 MHz bandwidth
  • gain 250

VFTX (28 chs) VME FPGA TDC

  • LVDS inputs
  • 200 MHz clock (external &

internal)

  • σt < 10 ps

(M. Ciobanu et al., IEEE Transactions on Nuclear Science, vol.58, no. 4, p. 2073, Aug. 2011) (https://www.gsi.de/fileadmin/EE/Module/Dokumente/vftx1_8.pdf)

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SLIDE 15
  • detectors cooled ( T= -20°C) and overbiased

for good timing

  • ToF between one strip and small pad

measured by PADI6 + VFTX

σ σ σ σTOF = 18 ps σ σ σ σTOF = 18 ps after ToT correction

197Au@900MeV/u

pad 1x1x0.3 mm3

  • V. Eremin et al., NIM A 796 (2015) 158

PADI6

  • C. Nociforo, NUSPIN 2017

Silicon in-beam tests

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SLIDE 16

TDC architecture in 65 nm

  • C. Nociforo, NUSPIN 2017
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SLIDE 17
  • collimator Ø 2.5mm
  • SEM monitor Ø 100 mm
  • plastics SCI 100x100x0.25 mm3

Comparison diamond vs scintillator

Calibration of SEM monitor vs scCVD-DD 3.23x3.23x0.16 mm3 and pcCVD-DD 18x18x0.3 mm3 tested with broadband current sensitive amplifiers (DBA (P. Moritz, GSI), PA-20 (M. Jastrzab, IFJ Cracow)

12C@62MeV/u

  • C. Nociforo, NUSPIN 2017

/ 3

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SLIDE 18

Series of irradiation of 107 12C/mm2 s followed by data taking via digital scope (10 GS/s) at low rate to monitor the time resolution and CCE of pcCVD-DD (10x10x0.3 mm3) and scCVD-DD (2x2x0.09 mm3) Q4 Q2 Q1 Q3

12C@62MeV/u

  • discrepancy due to pile-up in diamond signals

Eloss ≈ 36 MeV (comparable to 40Ar@2GeV/u)

  • C. Nociforo, NUSPIN 2017

Irradiation tests at LNS-INFN, 2016

collimated beam

≈ 3.3 MGy

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SLIDE 19

Digital waveform analysis (pcCVD-DD)

  • no degradation of the signal observed at the end of the irradiation

12C@62MeV/u

  • C. Nociforo, NUSPIN 2017
  • C. Nociforo et al., EPJ Web Conf. 117 (2016) 10007

V = 300 V THR = -30 mV V = 300 V THR = -30 mV shared charge between Qi

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SLIDE 20

ToF: Q4 pcCVD-DD & scCVD-DD

Digital waveform analysis (pcCVD-DD)

12C@62MeV/u

  • C. Nociforo, NUSPIN 2017
  • C. Nociforo et al., EPJ Web Conf. 117 (2016) 10007

10 20 30 40 50 1000 2000 3000 4000 5000

Catania (Run 2) - pcCVD, +300 V, Quad 4 Normalized Counts ToF (100 ps) PT01N (0hr) PT18N (40hr) σ(PT01) = 68 ps σ(PT18) = 63 ps

  • no change in the measured ToF at the end of the irradiation

V = 300 V THR = -30 mV V = 300 V THR = -30 mV

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SLIDE 21

Digital waveform analysis (scCVD-DD)

200 400 600 800 1000 500 1000 1500 2000

Catania (Run 2) - scCVD, +100 V Normalized Counts Amplitude (mV) PT01N (0hr) PT18N (40hr)

20 40 60 80 100 120 140 160 180 200 220 200 400 600 800 1000 1200 1400

Catania (Run 2) - scCVD, +100 V Normalized Counts Slope (mV/100 ps) PT01N (0hr) PT18N (40hr) x scale to be multiplied by 10 and dimensions written as mV/ns

12C@62MeV/u

  • shift observed after about 12 hours of irradiation, kept constant until the end
  • C. Nociforo, NUSPIN 2017

V = 100 V Thr = -30 mV V = 100 V Thr = -30 mV

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SLIDE 22

Damage effects (scCVD-DD)

  • final amplitude distribution is well above threshold

LED thr

longer decay time and lower amplitude, appearing during irradiation

12C@62MeV/u

  • C. Nociforo, NUSPIN 2017

10 ns 50 mV

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SLIDE 23

Summary

To obtain a clean PID at Super-FRS:

  • ToF detectors with timing resolution σt ~ 20 ps are required

→ in-beam tests of silicon and diamond strip detectors 0.3 mm thick (197Au@900 MeV/u) show that by using pico-seconds electronics the required time performance is achievable → irradiation test results (12C@62MeV/u) indicate pcCVD diamonds as superior material for application in high radiation level environment.

  • C. Nociforo, NUSPIN 2017
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SLIDE 24

Acknowledgment

  • J. Frühauf, C. Karagiannis, A. Kratz, M. Kiš, O. Kiselev, N. Kurz, F. Schirru,
  • M. Träger, R. Visinka

GSI, Darmstadt, Germany

  • M. Ciobanu

Horia Hulubei National Institute for Physics and Nuclear Engineering, Magurele- Bucharest, Romania

  • S. Schlemme

TU Darmstadt, Germany

  • V. Eremin

Ioffe Physical-Technical Institute, Russian Academy of Science,

  • St. Petersburg, Russia
  • M. Jastrzab

Henryk Niewodniczański Institute of Nuclear Physics, Polish Academy of Sciences, Krakow, Poland

  • C. Nociforo, NUSPIN 2017