PI Photovoltaic-Institute Berlin Company portrait of PI-Berlin - - PowerPoint PPT Presentation

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PI Photovoltaic-Institute Berlin

Company portrait of PI-Berlin

Photovoltaic Module Technology Testing | Consulting | Research

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Name: PI Photovoltaic-Institute Berlin (share holding company) Inscription: 10/12/2006 Investment: 1.2 Mio € (80% for lab equipment) Location: c/o TU Berlin, Einsteinufer 25, D-10587 Berlin, Germany Phone/Fax: +49 30 3142 5977 / +49 30 3142 6617 Founders: 9 PV-Specialists from industry and research Workforce: 4 Senior Consultants (in 2007: 15 workers) Milestones:

• Foundation

October 2006

• Cooperation contract TU Berlin

February 2007

• Start of lab

Q1 2007

• Own R&D projects

Q4 2007

At a glance

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• Prof. Dr.-Ing. Stefan Krauter, Electrical Engineer

Experience: Professor at TU Berlin and UFRJ/UECE Brazil, Director of Rio Solar Ltd., LAREF, RIO 02/3/5/6

Persons

Senior Consultants und Board of Directors: Dr.-Ing. Jürgen Arp, Engineer-Economist in mechanical engineering Experience: Sputnik Engineering Inverters, Abastrial Solar Consulting Berlin

• Dr. rer. nat. Paul Grunow, Physicist

Experience: Founder of Solon AG, Q-Cells AG Head of supervisory board: Prof. Dr. Rolf Hanitsch (TU, EE) Dipl.-Ing. Sven Lehmann, Electrical Engineer Experience : Energiebiss, Solon AG, SolarExperts Berlin

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Testing

• Class A flasher and spectral response set-up for precision measurements
• Climatic chambers 2m x 3m x 2m (heat-damp, thermal cycling, humidity

freeze)

• Continuous light simulator class C (Hot spot, degradation)
• Outdoor measurement test site
• UV test
• Wet leakage isolation test, Dielectrimeter
• Mechanical testing (load, twist, hail, scratch)
• Bypass diode reverse load test
• (fire test stage)

Characterization & Development

• Laminator
• IR-camera for failure detection
• Soldering lab
• 2 additional characterization set-ups (n.n.)

Laboratory Equipment (Q1 2007)

Fig.1: Out-door measurement set-up in Berlin

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Laboratory in April 2007

23.4 m 7.7 m Laminator Load table Unlod table Climatic chamber 1 temperature cycling Climatic chamber 2 humidtiy- cold cycling Climatic chamber 3 humidity- heat cycling 2.8 m Steady

• State-

Simul. UV test

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Testing of modules

• Power at Standard Test Conditions STC (Class A simulator)
• Energy yield (Temperature, non-perpendicular and low irradiance performance,

Spectral effects, degradation)

• Reliability (combined test cycles according to IEC 61215/IEC 61646)

Consulting in module technology

• Product-Assessment und market analyses
• Failure analysis
• Training (Product manger, distribution, developers)

R&D in module technology

• New materials and production processes for thin film encapsulation
• advanced connection technology for cells based on wafers (thin, back contact)
• Quality safeguard for module production

The three pillars of PI‘s business

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Precision measurements modules up to 2 x 1.4 m² < ±3% Standard measurements modules up to 2 x 1.4 m² > ±3% Isolation test (6,000 V): wet leakage Spectral response module or cell EVA curing analysis > 5g EVA Load tests (UV, mechanical load, hail) Climatic tests (Temperature cycles, damp-heat, damp-cold)  Pre-testing for IEC 61215/61730 and IEC 61646 with multiple cycles for product comparison

Service 1: Measurements (Q1 2007)

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Power output prediction via operation model

(→ Research → Service)

Standard Test Conditions STC: PV module power output at 25°C, 1,000 W/m², AM 1.5g direct Typical measurement duration: 10ms non-STC

• Temperature performance
• Non-perpendicular incidence
• Low irradiance level
• Spectral effects
• Degradation and regeneration
• > electrical energy yield (kWh/a kWp)

Is predictable for silicon technology For thin film technology more difficult: Indoor test ≠ outdoor performance

[Krauter &Grunow 21th PVSEC (2006), p.2065]

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Temperature effects

[Photon International 03/2006]

module eff. Tkoeff Pmax

• coeff. Current
• coeff. Voltage

coff FF NOCT a-Si (triple) 5.3%

• 0.20%/K

0.11%/K

• 0.32%/K

0.02%/K 45.1 a-Si (tandem) 5.2%

• 0.20%/K

0.07%/K

• 0.30%/K

0.03%/K 49.0 CdTe 7.7%

• 0.23%/K

0.05%/K

• 0.30%/K

0.02%/K 45.1 a-Si (single) 5.5%

• 0.24%/K

0.09%/K

• 0.33%/K

0.00%/K 47.7 DSC 0.8%

• 0.30%/K

0.50%/K

• 0.30%/K
• 0.50%/K

40.0 HIT 15.1%

• 0.31%/K

0.03%/K

• 0.25%/K
• 0.08%/K

49.0 mono Si 11.6%

• 0.41%/K

0.05%/K

• 0.39%/K
• 0.08%/K

45.8 CIS 9.1%

• 0.44%/K

0.04%/K

• 0.34%/K
• 0.13%/K

47.0 multi Si 11.8%

• 0.44%/K

0.05%/K

• 0.39%/K
• 0.10%/K

45.0 multi EFG Si 11.6%

• 0.47%/K

0.10%/K

• 0.41%/K
• 0.16%/K

46.3 Ribbon Si 10.0%

• 0.47%/K

0.06%/K

• 0.49%/K
• 0.03%/K

44.0 mono LGBC 13.3%

• 0.49%/K

0.05%/K

• 0.45%/K
• 0.09%/K

47.0 Apex 7.6%

• 0.52%/K

0.08%/K

• 0.49%/K
• 0.12%/K

45.7

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40% 50% 60% 70% 80% 90% 100% 0° 10° 20° 30° 40° 50° 60° 70° 80° 90° incident angle  Isc/cos 

Q6L Diamant Q6L Alberino T Q6L Alberino P

Non-perpendicular incidence

[Grunow et al. 20th EPVSEC (2005) p.2384]

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Performance for low irradiance levels

[Grunow et al. 19th EPVSEC (2004), p.2190]

13% 14% 15% 1 10 100 1000 Rshunt in  (for a 150mm cell) European Efficiency

• calc. cells

N = 1.2 Rs = 5.3 m measured cells

• calc. modules

n= 1.2 Rs = 7.8m measured modules

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Relative spectral performance vs. AM 1.5 direct

a-S i/µ

• S

i a-S i/µ

• S

i a-S i/µ

• S

i a-S i/µ

• S

i a-S i/µ

• S

i a-S i/µ

• S

i µ

• S

i µ

• S

i µ

• S

i µ

• S

i µ

• S

i µ

• S

i µ

• S

i C dT e C dT e C dT e C dT e C dT e C dT e C IG S C I G S C IG S C IG S a-S i/a-G e a-S i/a-G e a-S i/a-G e a-S i/a-G e a-S i/a-G e a-S i/a-G e a-S i/a-G e a-S i/µ

• S

i C dT e C I G S C IG S C IG S

• 30%
• 20%
• 10%

0% 10% 20% 30%

direct AM 1.0 direct AM 2.0 direct AM 5.6 diffuse AM 1.0 diffuse AM 1.5 diffuse AM 2.0 diffuse AM 5.6 a-S i/µ

• S

i µ

• S

i C dT e C I G S a-S i/a-G e m ulti c-S i acidic m ulti c-S i m

• no c-S

i

[Krauter et al. 21th PVSEC (2006), p.2065]

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Degradation/Regeneration

[Herrmann, PERFORMANCE IP, ISPRA Workshop on Thin Film Module Technology 8./9. Nov 2006]

technology 1h of light soaking at 1,000 W/m² c-si 0.0% a-Si single

• 0.3%

a-Si tandem +0.2% a-Si/µ-Si

• 0.8%

CIS1

• 2.2%

CIS2 +17.2% CdTe +3.6%

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Setback analysis of modules via electro- luminescence (use of solar cell as IR-LED)

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PI‘s position in the PV market

> Independent testing and certification Institute > R&D – service provider for cost reduction in module technology (=Encapsulation)

Thin film start up & producer Operator

Module producer Cell producer

Product developer & Investor

R&D; Testing, Consulting

Retailer PI-Berlin

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Thank you very much !

arp@pi-berlin.com, grunow@pi-berlin.com, lehmann@pi-berlin.com, krauter@pi-berlin.com