Kuala Lumpur, July 2-4, 2009, 2nd RCM of the IAEA F1-RC-1056.1
- n „Improved production and utilization of short pulsed, cold neutrons
Pavol Mikula al. Nuclear Physics Institute, 250 68 e Czech Republic - - PowerPoint PPT Presentation
Pavol Mikula al. Nuclear Physics Institute, 250 68 e Czech Republic Kuala Lumpur, July 2-4, 2009, 2nd RCM of the IAEA F1-RC-1056.1 on Improved production and utilization of short pulsed, cold neutrons at low-medium energy spallation
NBCT
1 2 m
SANS multipurpose diffractometer
strain scanner I
NDP powder diffractometer Radiative capture
powder
diffractometer
strain
scanner II
Detector unit Monochromator drum Sample
size range
1 nm .. 100 nm
10 nm .. 1 µm
1 µm .. 10 µm
Developed experimental
Advanced data evaluation
beam shutter position sensitive detector beam tube with collimator samples bent Si 220 bent Si 111 analyzer (asymmetric cut)
PE + B Pb
bent Si 111 diffraction planes 111 steel rods
∆ θ ∆θ x R L
D A D S
= ( sin(2 ) + )
∆θS ∆xD L
D
Instrument Parameters
Monochromator bent perfect crystal Si 111 symmetric geometry Sample maximum 5x25 mm2 Analyzer bent perfect crystal Si 111 fully asymmetric geometry Detector 1-dimensional 3He PSD resolution ~ 1 mm Wavelength λ = 2.1 A, ∆λ/λ < 0.01 Neutron flux 5⋅103 n s-1 cm-2 / RM = 300 m 4⋅104 n s-1 cm-2 / RM = 35 m Q-resolution 1⋅10-4 A-1 / RM = 300 m 1⋅10-3 A-1 / RM = 35 m Vertical Q-resolution 10-1 A-1 Total Q-range 2 10-4 ÷ 2 10-2 A-1
0.01 0.1 1 20 40 60 80 100 120 140
as sprayed 1300
1520
1730
D(R) [10
R [µm]
0.1 1 5 10 15
1 10 100 0.01 0.1 1 10 100 1000 10000 z=5 mm z=2.5 mm empty beam
T=1730
z dΣ/dθ
Qx [ µm
Bonse-Hart
Collimator instruments
Size distribution of pores in plasma-sprayed Al2O3 SANS data for various resolutions and sample thickness fitted to a single model.
PSD detector 2θ=30 deg B P C-monochromator
PSD detector 2θ=30 deg B P C-monochromator
PSD detector 2θ=30 deg BP C-monochromator
PSD detector 2θ=30 deg BP C-monochromator
Spatial resolution of the PSD – 2 mm 1 channel = 0.009o
50 100 150 200
50 100 150 200
50 100 150 200 Si 111, chi=29.5, 1/Ropt=0.29 Intensity [n/s] x [mm] Ge 111, chi=29.5, 1/Ropt=0.31 x [mm] Si 111, chi=35.26, 1/Ropt=0.33 x [mm]
50 100 150 200 Si 111, chi=22, 1/Ropt=0.26 Intensity [n/s] x [mm]
50 100 150 200 Si 111, chi=48.53 1/Ropt=0.40 x [mm]
50 100 150 200 Si 111, chi=-48.53 1/Ropt=-0.25 x [mm]
50 100 150 200 Si 111, chi=0, 1/Ropt=0.11 x [mm]
50 100 150 200
50 100 150 200
50 100 150 200 Si 111, chi=-29.5, 1/Ropt=-0.11 Intensity [n/s] x [mm] Ge 111, chi=-29.5, 1/Ropt=-0.11 x [mm] Si 111, chi=-35.26, 1/Ropt=-0.155 x [mm]
50 100 150 200 Si 111, chi=-22, 1/Ropt=-0.05 Intensity [n/s] x [mm]
50 100 150 200 Si 111, chi=-48.53 1/Ropt=-0.24 x [mm]
50 100 150 200 Si 111, chi=0, 1/Ropt=0.11 x [mm]
140 160 180 200 220 240 54 56 58 60 62
FWHM Peak height
Bending /µm FWHM / channel numbers
si(111) Ψ=35.26 deg Output beam compression 200x40x4 mmm
800 820 840 860 880 900 920
Peak height
40 60 80 100 120 140 50 55 60 65 70 75
si(111) Ψ=22 deg Output beam compression 200*30*4
FWHM Peak height
Bending / µm FWHM / channel numbers
500 550 600 650 700 750
Peak height
100 120 140 160 180 200 45 50 55 60
FWHM Peak height
Bending / µm FWHM / channel numbers
Ψ =29.5 deg
Output beam compression 200x30x3 mm
600 650 700 750 800
Peak height
90 100 110 120 130 140 150 160 170 180 50 60 70 80 90 100 110
FWHM Peak height
Bending / µm FWHM / channel numbers
Si(111) Symmetric reflection 200x40x4 mm
1500 2000 2500 3000 3500
Peak height
60 70 80 90 100 110 50 60 70 80 90 100
FWHM Peak height
Bending / µm FWHM / channel numbers
Si(111) sandwich Symmetric reflection 200*40*3x1.3 mm
1600 1800 2000 2200 2400 2600
Peak height
80 90 100 110 120 130 30 40 50 60 70 80
FWHM Peak height
Bending / µm FWHM / channel numbers
Si(111) Symmetric reflection 200*40*1.3 mm
600 900 1200 1500 1800
Peak height
200 300 400 100 200 300 400 500
y0 31.57447 ±0.89147 xc 290.47328 ±0.14791 w 28.15938 ±0.31185 A 12693.23319 ±133.37826
Gauss fit
Intensity / 180 s
Channel number
200 300 400 50 100 150
Channel number
y0 10.59425 ±0.41425 xc 290.28919 ±0.20455 w 28.29931 ±0.43141 A 4293.31844 ±62.13225
Gauss fit
Intensity / 60 s
200 300 400 10 20 30 40 50 60
Channel number
y0 3.26385 ±0.19322 xc 290.70484 ±0.28109 w 28.1952 ±0.5927 A 1450.1081 ±28.92698
Gauss fit
Intensity / 20 s
200 300 400 5 10 15
Channel number
y0 0.84227 ±0.09552 xc 288.05412 ±0.54286 w 28.47831 ±1.14544 A 376.16193 ±14.37198
Gauss fit
Intensity / 5 s
Section A, A586 (2008) 18-22.
Neutron Optics”, eds. A. Erko, M. Idir, T. Krist, A.G. Michette, Springer Berlin/Heidelberg, Volume 137/2008, pp. 459-470.
Efficiency Boost of the Materials Science Diffractometer E3 at BENSC: One Order of Magnitude, Due to a Double Focusing Monochromator, Neutron News, 19 (2008) 16-19.
Boost of the Materials Science Diffractometer E3 at BENSC: One Order of Magnitude, BENSC Experimental Report 2007, HMI Berlin, Edited by U. Stahnke, A. Brandt and H.A. Graf, April 2008, HMI-B 617, ISSN 0936-0891.
Shimizu, S. Satoh, P. Mikula, T. Satoh, K. Tanabe, K. Koyama, H. Takahashi, K. Fujita, T. Kamiyama, S. Naito, Y. Kawamura, H. Yoshizawa, S. Ikeda, First results from a mini-focusing Small-Angle Neutron Scattering Instrument (mfSANS) with an ellipsoidal mirror, In Proc. of the
Kiyanagi, S. Naito, H. Yoshizawa, Installation of a prototype of focusing-type small-angle neutron scattering instrument with an ellipsoidal supermirror, Activity Report on Neutron Scattering Research: Experimental Reports 15 (2008), Report Number: 655, Tokyo University