Intel’s Revolutionary 22 nm Transistor Technology
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Intels Revolutionary 22 nm Transistor Technology Mark Bohr Kaizad - - PowerPoint PPT Presentation
Intels Revolutionary 22 nm Transistor Technology Mark Bohr Kaizad Mistry Intel Senior Fellow 22 nm Program Manager May, 2011 1 Key Messages Intel is introducing revolutionary Tri-Gate transistors on its 22 nm logic technology
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Silicon Substrate Oxide Gate Source Drain High-k Dielectric
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Silicon Substrate Oxide Source Drain Gate
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Silicon Substrate Oxide Gate
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Silicon Substrate Oxide Gate
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Gates
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Fins
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SiGe SiGe
Invented SiGe Strained Silicon 2nd Gen. SiGe Strained Silicon 2nd Gen. Gate-Last High-k Metal Gate Invented Gate-Last High-k Metal Gate First to Implement Tri-Gate Strained Silicon High-k Metal Gate Tri-Gate
Gate Silicon Substrate Source Gate Oxide Inversion Layer Depletion Region Drain
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Gate Silicon Substrate Source Floating Body Drain Oxide
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Gate Silicon Substrate Source Drain Oxide
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Gate Silicon Substrate Oxide Silicon Fin 14
Gate Voltage (V)
“On” Current “Off” Current Threshold Voltage Operating Voltage
Channel Current
(normalized) 15
Planar
Planar Tri-Gate
Reduced Leakage
Gate Voltage (V) Channel Current
(normalized)
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Channel Current
(normalized)
Tri-Gate Tri-Gate
Reduced Threshold Voltage Reduced Operating Voltage
Gate Voltage (V)
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Operating Voltage (V)
32 nm Planar Lower Voltage Slower
Transistor Gate Delay
(normalized)
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32 nm Planar 22 nm Planar
Operating Voltage (V) Transistor Gate Delay
(normalized)
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22 nm Tri-Gate 32 nm Planar 18%
Faster
37%
Faster
Operating Voltage (V) Transistor Gate Delay
(normalized)
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22 nm Tri-Gate 32 nm Planar
Operating Voltage (V) Transistor Gate Delay
(normalized)
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37% performance increase at low voltage >50% power reduction at constant performance
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22 nm SRAM, Sept. „09
D1C Oregon Fab 12 Arizona D1D Oregon Fab 32 Arizona Fab 28 Israel
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