Integration of GET electronics on TPC for HIC program at RIBF
Tadaaki Isobe RIKEN Nishina Center ATTPC 2015 Workshop
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Integration of GET electronics on TPC for HIC program at RIBF - - PowerPoint PPT Presentation
Integration of GET electronics on TPC for HIC program at RIBF Tadaaki Isobe RIKEN Nishina Center ATTPC 2015 Workshop 1 RIBF-SPiRIT exp: study of symmetry energy for high dense region ( r ~2 r 0 ) PRC71 (2005) 0146a08 r r
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PRC71 (2005) 0146a08
p+ p-
– Mainly for high dense region.
– Same-Z, different-N. – Control coulomb effect.
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?
IBUU 124Sn+132Sn E=300AMeV
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was delivered at 2014 spring RIBF experimental campaign.
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High-resolution beam line F0-F11: 125.983m
ZeroDegree SHARAQ by U. of Tokyo SAMURAI
=6.8Tm max. Field integral =7Tm
NeuLAND NEBULA STQ
Dayone: 132Sn 300AMeV+124Sn Total beam rate ~ 5kHz Trigger rate ~ 10Hz
Measure differential flow and yield ratios for (π+ & π-), (p & n), (3H & 3He) in Heavy RI Collisions at E/A=300MeV
p+ p-
as well.
(1atm).
chamber.
paddles + MPPC
B,E beam
X: wire Y: drift Z: beam 108pads (864mm) 112pads (1344mm) 12mm 8mm 53cm drift
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– R&D by GET (General Electronics for TPC) Collaboration for the next generation of readout electronics. France-USA(-Japan) Collaboration. – Not only for SPiRIT-TPC. – Make it possible to readout 12bit ADC 512 samples from 12000 pads under 1kHz DAQ rate.
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CoBo
FPGA + Memo
ZAP
AsAd
AGET
ADC FPGA PULSER
CoBo
FPGA + Memo
Mutant
2 FPGA
Pre-amp & Filter Protection
Concentrator Embedded SystemS: .T. Stamp
. ‘0’-suppress .Formatting .Reduction
.Calibration
Slow Control
Front-End Coding V, I, EM & Temp Control/Satb
FARM
Trigger4 Event- Building
Data Control
Web Service Security
3-Level .Trigger .Clock .Calculated Selected Read-out
Generic Structure (H&S) 212 Final Dyn Rnge 10Gbit B.width 4 Level Digital Trigger
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SPiRIT TPC: 48 AsAd boards 12 CoBo boards 2 m-TCA crates 2 MuTANT boards
Novel ASIC Chip by GET project: AGET Architecture
64 analog channels : CSA, Filter, SCA, Discriminator Auto triggering : discriminator + threshold (DAC) Multiplicity signal : analog OR of 64 discriminators Address of the hit channel(s); 3 SCA readout modes : all, hit or specific channels 4 charge ranges/channel : 120 fC, 240 fC, 1 pC & 10 pC 16 peaking time values : 50 ns to 1 µs Fsampling : 1 MHz to 100 MHz Possibility to bypass the CSA and to enter directly into the filter or SCA inputs Input current polarity : positive or negative
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Serial Interface Mode CK In Test
Readout Mode SCA Control
SLOW CONTROL
W / R CK
TEST
Power on Reset
AGET
512 cells
SCA
FILTER
tpeak
CSA 1 channel 64 channels ADC Charge range DAC
Discri inhibit
BUFFER
x68 Hit register
SCAwrite
Trigger pulse
AMS CMOS 0,35 µm
Courtesy of P. Baron
– Most of the TPC channel have pedestal data. – loss of conversion time
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Courtesy of D. Calvet
monitoring software.
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TPC.
– For matching of the connector – Protection of the circuit
– Space issue
– Noise level
counts
– Transfer function (i.e. Gain)
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Pad DC converter ASIC AsAd
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Designed/Made by H. Baba
Pulser: 1 Event 5 Channels
Channel 0
σ=3.08 σ=7.25 σ=6.21 Pedestal: 1 Event 5 Channels Connected Unconnected Courtesy of W. Powell
120fC, 233nsec
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Courtesy of W. Powell
Courtesy of W. Powell
AsAd fits in 17cm space!
beam Before FPN subtraction Very good
Left hand side pads
~1850 ~4% of all of pads 925 ~4% of pads show the gain amplitude of less than half of that of majority
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Configured to set the baseline FADC data of 64 channel: 1ASIC
register with MuTANT.
– Data of neighboring pad is needed to get track position. – Signal of neighboring pad is smaller.
be finished within 2msec.
– Evaluation of algorithm is necessary.
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track Get hit information Set hit register
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RIKEN EN : T. Isobe, M. Nishimura, H. Baba, H. Otsu, K-I Yoneda, H. Sato, Y. Nakai, S. Nishimura, J. Lee, H. Sakurai, He Wang, N. Fukuda, H. Takeda,
Kyoto to Univ.: T. Murakami, N. Nakatsuka, M. Kaneko MSU MSU: W. Lynch, M.B. Tsang, S. Tangwancharoen, Z. Chajecki, J. Estee, R. Shane, J. Barney, Z. Chajecki, Y. Ayyad TAMU: A. Mchintosh, S. Yennello, M. Chapman Liverpool rpool/ / Darsb sbury ury: M. Chartier, W. Powell, J. Sampson, R.Lemmon TITech Tech: T. Nakamura, Y. Kondo, Y. Togano Korea a Univ. v.: B. Hong, G. Jhang, J. Lee INFN: G. Verde, P. Russotto Tsinghu nghua Univ.: Z. Xiao, R. Wang, Y. Zhang Lanzhou hou: Z. Sun CEA: : E. Pollacco INP: J. Lukasik, P. Pawlowski ORNL: A. Galindo-Uribarri Tohoku ku Univ. v.: T. Kobayashi Rikkyo yo Univ. v.: K. Ieki GSI: T. Aumann