HGCal Test Beam Data Analysis: Wire Chamber Efficiency and Electron/Pion Separation
Wihan Adi - Summer Student 2018 Supervisors: Thorben Quast & Erica Brondolin
HGCal Test Beam Data Analysis: Wire Chamber Efficiency and - - PowerPoint PPT Presentation
HGCal Test Beam Data Analysis: Wire Chamber Efficiency and Electron/Pion Separation Wihan Adi - Summer Student 2018 Supervisors: Thorben Quast & Erica Brondolin Motivation Part I DWCs are used in test beams thanks to high e ffi ciency
Wihan Adi - Summer Student 2018 Supervisors: Thorben Quast & Erica Brondolin
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and spatial resolution
claim of about 0.2mm [1]
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Source: [1]
cm2
Current is induced in corresponding cathode
converted via TDC
X − position = (timeRight − timeLeft) × slopehorizontal + Offsethorizontal
Y − position = (timeUp − timeDown) × slopevertical + Offsetvertical
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DWC configuration
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Source: Thorben Quast CLICdp presentation 29 August 2018
DWC4 & 3 in CERN SPS H2
Data sets
May 2018
~10 to ~160GeV
per energy
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Assume particles’ tracks to be straight line and plot residual distribution
Offset Distribution of DWC1 in x direction
pre-correction post-correctionOffset Distribution of DWC2 in x direction
pre-correction post-correctionOffset Distribution of DWC3 in x direction
pre-correction post-correctionOffset Distribution of DWC4 in x direction
pre-correction post-correction0.024mm
0.015mm
1.022mm
0.364mm
Efficiency Studies Position alignment
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1. Require three points from the other DWCs 2. Fit a line through three points from the other DWCs 3. Extra-/interpolate a point at the location of DWC_i 4. Check if the point is within a rectangular region of DWC_i (8 x 8 cm^2) 5. If yes increase denominator by 1
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E =
#hit_registered #hit
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First, fit a line Then extra-/ interpolate this line to DWCx and increase #hit Do not increase #hit
E =
#hit_registered #hit
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E =
#hit_registered #hit
and determined #hit
registered any signal
tolerance radius from the predicted coordinates
DWC is aligned & #hit increased Is the measured coordinates within tolerance?
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Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC1 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.47 mm Sigma 0.43 mm Sigma 0.28 mm Sigma 0.26 mm Sigma 0.31 mm Sigma 0.26 mm Sigma 0.26 mm Sigma 0.27 mm Sigma 0.29 mm Sigma 0.27 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC2 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.46 mm Sigma 0.43 mm Sigma 0.30 mm Sigma 0.28 mm Sigma 0.33 mm Sigma 0.28 mm Sigma 0.28 mm Sigma 0.30 mm Sigma 0.32 mm Sigma 0.29 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 DWC3 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.71 mm Sigma 0.50 mm Sigma 0.41 mm Sigma 0.34 mm Sigma 0.48 mm Sigma 0.31 mm Sigma 0.30 mm Sigma 0.38 mm Sigma 0.44 mm Sigma 0.36 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC4 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.61 mm Sigma 0.43 mm Sigma 0.34 mm Sigma 0.29 mm Sigma 0.40 mm Sigma 0.27 mm Sigma 0.26 mm Sigma 0.32 mm Sigma 0.37 mm Sigma 0.31 mm31 August 2018
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Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC1 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.47 mm Sigma 0.43 mm Sigma 0.28 mm Sigma 0.26 mm Sigma 0.31 mm Sigma 0.26 mm Sigma 0.26 mm Sigma 0.27 mm Sigma 0.29 mm Sigma 0.27 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC2 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.46 mm Sigma 0.43 mm Sigma 0.30 mm Sigma 0.28 mm Sigma 0.33 mm Sigma 0.28 mm Sigma 0.28 mm Sigma 0.30 mm Sigma 0.32 mm Sigma 0.29 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 DWC3 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.71 mm Sigma 0.50 mm Sigma 0.41 mm Sigma 0.34 mm Sigma 0.48 mm Sigma 0.31 mm Sigma 0.30 mm Sigma 0.38 mm Sigma 0.44 mm Sigma 0.36 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC4 Corrected Residual Distribution in y Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.61 mm Sigma 0.43 mm Sigma 0.34 mm Sigma 0.29 mm Sigma 0.40 mm Sigma 0.27 mm Sigma 0.26 mm Sigma 0.32 mm Sigma 0.37 mm Sigma 0.31 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 DWC1 Corrected Residual Distribution in x Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.92 mm Sigma 0.89 mm Sigma 0.49 mm Sigma 0.46 mm Sigma 0.54 mm Sigma 0.41 mm Sigma 0.39 mm Sigma 0.48 mm Sigma 0.49 mm Sigma 0.46 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.01 0.02 0.03 0.04 0.05 0.06 0.07 0.08 0.09 DWC2 Corrected Residual Distribution in x Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 1.02 mm Sigma 0.93 mm Sigma 0.51 mm Sigma 0.48 mm Sigma 0.58 mm Sigma 0.44 mm Sigma 0.44 mm Sigma 0.49 mm Sigma 0.50 mm Sigma 0.48 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 DWC3 Corrected Residual Distribution in x Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.70 mm Sigma 0.49 mm Sigma 0.41 mm Sigma 0.36 mm Sigma 0.42 mm Sigma 0.33 mm Sigma 0.32 mm Sigma 0.40 mm Sigma 0.43 mm Sigma 0.38 mm Offset[mm] 5 − 4 − 3 − 2 − 1 − 1 2 3 4 5 Entries 0.02 0.04 0.06 0.08 0.1 0.12 0.14 DWC4 Corrected Residual Distribution in x Direction pdgID 211 10 GeV pdgID 211 20 GeV pdgID 211 40 GeV pdgID 211 80 GeV pdgID 211 100 GeV pdgID 211 120 GeV pdgID 211 160 GeV pdgID 211 50 GeV pdgID 211 30 GeV pdgID 211 60 GeV Sigma 0.60 mm Sigma 0.42 mm Sigma 0.36 mm Sigma 0.31 mm Sigma 0.36 mm Sigma 0.28 mm Sigma 0.27 mm Sigma 0.34 mm Sigma 0.37 mm Sigma 0.33 mm31 August 2018
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(back up slide)
generally ~90% within 2mm
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(back up slide)
generally ~90% within 2mm
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(back up slide)
generally ~90% within 2mm
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(back up slide)
generally ~90% within 2mm Peculiar Case
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angle at 100 GeV
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Looking at beam profiles help: Most follow a pattern but not all 10GeV 160GeV 100GeV 60GeV
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Looking at beam profiles help: Most follow a pattern but not all 10GeV 160GeV 100GeV 60GeV Points selection: Only those that seem not out of
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Looking at beam profiles help: Most follow a pattern but not all 10GeV 160GeV 100GeV 60GeV Points selection: Only those that seem not out of
For Example:
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Looking at beam profiles help: Most follow a pattern but not all 10GeV 160GeV 100GeV 60GeV Points selection: Only those that seem not out of
For Example:
Or
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Looking at beam profiles help: Most follow a pattern but not all 10GeV 160GeV 100GeV 60GeV Points selection: Only those that seem not out of
For Example:
Or
Or
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beam at SPS H2
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Source: Thorben Quast CLICdp presentation 29 August 2018
Data set HGCal June 2018
n-type wafer
1 cm^2
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extension
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δ = Max{{Elayeri+1 − Elayeri|i ∈ {1,...,27}}} z = ∑ Ei ⋅ zi E
r = (Max{Ei ⋅ xi E } − (Min{Ei ⋅ xi E })2 + (Max{ Ei ⋅ yi E } − (Min{ Ei ⋅ yi E })2
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extension
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δ = Max{{Elayeri+1 − Elayeri|i ∈ {1,...,27}}} z = ∑ Ei ⋅ zi E
r = (Max{Ei ⋅ xi E } − (Min{Ei ⋅ xi E })2 + (Max{ Ei ⋅ yi E } − (Min{ Ei ⋅ yi E })2
Simulated data
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extension
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δ = Max{{Elayeri+1 − Elayeri|i ∈ {1,...,27}}} z = ∑ Ei ⋅ zi E
r = (Max{Ei ⋅ xi E } − (Min{Ei ⋅ xi E })2 + (Max{ Ei ⋅ yi E } − (Min{ Ei ⋅ yi E })2
Simulated data TPR = #electron_chosen #total_electron Specificity = #pion_counted #total_ pion
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extension
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δ = Max{{Elayeri+1 − Elayeri|i ∈ {1,...,27}}} z = ∑ Ei ⋅ zi E
r = (Max{Ei ⋅ xi E } − (Min{Ei ⋅ xi E })2 + (Max{ Ei ⋅ yi E } − (Min{ Ei ⋅ yi E })2
Simulated data TPR = #electron_chosen #total_electron Specificity = #pion_counted #total_ pion
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Contaminated test beam data Simulated pion data Simulated electron data
Some observables least correlated with number of hit/ energy sum e.g. max energy jump
Ratio of electron/pion in test beam Observables ROC curves Cut threshold Use supervised ML with simulated data to discriminate electron/pion
Obtain Are the ratios from numerous
Study differences b/w data and MC Unsupervised Learning
No
+
Yes Compare
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Contaminated test beam data Simulated pion data Simulated electron data
Some observables least correlated with number of hit/ energy sum e.g. max energy jump
Ratio of electron/pion in test beam Observables ROC curves Cut threshold Use supervised ML with simulated data to discriminate electron/pion
Obtain Are the ratios from numerous
Study differences b/w data and MC Unsupervised Learning
Done
No
+
Yes Compare
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Check quality of simulation
Create a tidy GitHub repo before leaving Summer student report
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Personal Take on Summer School
in top research institution
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Seaborn in particular)
25 June 2018 - 21 September 2018
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description (DWC)
1.Alignment 2.Efficiency algorithm
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Part I: Efficiency study DWC Part II: Test beam analysis electron/pion separation
configuration
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n-type wafer
1 cm^2
Cu for hadronic
chips per module
and biasing purposes
Source: Martelli A. 2018
Source: Thorben Quast CLICdp presentation 29 August 2018
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extension
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δ = Max{{Elayeri+1 − Elayeri|i ∈ {1,...,27}}} z = ∑ Ei ⋅ zi E
r = (Max{Ei ⋅ xi E } − (Min{Ei ⋅ xi E })2 + (Max{ Ei ⋅ yi E } − (Min{ Ei ⋅ yi E })2
Simulated data Simulated data Simulated data
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ROC Curves
TPR = #electron_chosen #total_electron Specificity = #pion_counted #total_ pion
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least correlated with energy sum and number of hit
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Correlation Plots
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least correlated with energy sum and number of hit
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Correlation Plots
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least correlated with energy sum and number of hit
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Correlation Plots
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Back up
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Tolerance [mm] 2 4 6 8 10 12 14 Beam Energy [GeV] 20 40 60 80 100 120 140 160 10 20 30 40 50 60 70 80 90
Efficiency vs Tolerance vs Beam Energy DWC2
Tolerance [mm] 2 4 6 8 10 12 14 Beam Energy [GeV] 20 40 60 80 100 120 140 160 10 20 30 40 50 60 70 80 90
Efficiency vs Tolerance vs Beam Energy DWC1
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Tolerance [mm] 2 4 6 8 10 12 14 Beam Energy [GeV] 20 40 60 80 100 120 140 160 10 20 30 40 50 60 70 80 90
Efficiency vs Tolerance vs Beam Energy DWC4
Tolerance [mm] 2 4 6 8 10 12 14 Beam Energy [GeV] 20 40 60 80 100 120 140 160 10 20 30 40 50 60 70 80 90
Efficiency vs Tolerance vs Beam Energy DWC3
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guide (No. SL-Note-98-023-BI). CERN-SL-Note-98-023-BI. 2.Beam Tests for the CMS HGCal upgrade 2018 by Thorben Quast at CLICdp Collaboration Meeting, 29th August 2018. 3.Martelli, A. (2017). The CMS HGCAL detector for HL-LHC
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