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Hall Effect Measurement System Hall and Hall and van der Pauw - PDF document

Variable Temperature Hall Effect Measurement Systems Hall Effect Measurement System Hall and Hall and van der Pauw Measurements van der Pauw Measurements The Hall Effect Measurement System MMR Technologies, Inc. 1 Web: www.mmr-tech.com


  1. Variable Temperature Hall Effect Measurement Systems Hall Effect Measurement System Hall and Hall and van der Pauw Measurements van der Pauw Measurements The Hall Effect Measurement System MMR Technologies, Inc. 1 Web: www.mmr-tech.com

  2. Variable Temperature Hall Effect Measurement Systems The Hall Effect  Hall effect refers to potential difference (Hall voltage) on opposite sides of a thin sheet of conducting or semi-conducting material through which an electric current is flowing, created by a magnetic field applied perpendicular to the Hall element  Presence of measurable transverse voltage is called the Hall effect after E. H. Hall who discovered it in 1879. The Hall Effect  Ratio of voltage created to product of the amount of current and the magnetic field divided by the element thickness is known as the Hall coefficient  Characteristic of the material  Conduction phenomenon  Different for different charge carriers  Hall voltage has a different polarity for positive and negative charge carriers  Used to study the details of conduction in semiconductors and other materials which show a combination of negative and positive charge carriers. MMR Technologies, Inc. 2 Web: www.mmr-tech.com

  3. Variable Temperature Hall Effect Measurement Systems The van der Pauw Method  Characterizes a sample of semiconductor material  can be successfully completed with a current source and a voltmeter.  From the measurements made, the following properties of the material can be calculated:  The sheet resistance, from which the resistivity can be inferred for a sample of a given thickness.  The doping type (i.e. if it is a P-type or N-type) material.  The sheet carrier density of the majority carrier (the number of majority carriers per unit area).  Density of the semiconductor (doping level) can be found for a sample with a given thickness.  The mobility of the majority carrier. Taking Measurements  Measurements require four ohmic contacts on the sample:  On or as close to sample boundary as possible  Infinitely small  Error is given by D/L  D = average diameter of contact  L = distance between contacts  Leads from contacts should be of the same batch of wires to minimize thermoelectric effects  All four contacts need to be same material MMR Technologies, Inc. 3 Web: www.mmr-tech.com

  4. Variable Temperature Hall Effect Measurement Systems Taking Measurements Taking Measurements  Current I AB is a positive DC current measured in amperes (A) A B  Injected into contact A  Take out of contact B  Voltage V CD is a DC voltage (V)  measured between contacts C and C with no externally applied magnetic field C D  Sheet Resistance, R S , is measured in Ohms ( Ώ ) MMR Technologies, Inc. 4 Web: www.mmr-tech.com

  5. Variable Temperature Hall Effect Measurement Systems Taking Measurements  Ohm’s Law: R AB,CD = V CD / I AB  calculates the resistance along one edge e.g. Vertical edge: R AC,BD and Horizontal edge: R AB,CD  Actual sheet resistance is related to these resistances by the van der Pauw formula:    π R R   e e AB,CD AC BD ^ ( ) ^ ( , ) 1 R R s s  Obtain a more precise measurement of Rs by taking several reciprocal measurements and averaging Hall Measurements  When a charged particle (e.g. electron) is placed in a magnetic field, it experiences a Lorentz force proportional to the strength of the field and the velocity at which it is traveling through the field.  Force is strongest when the field is perpendicular to the direction of motion.  Applying a current results in a steady flow of electrons through the material  Applying an external magnetic field will result in an accumulation of electrons at one edge of the sample  Creates a potential difference across the material MMR Technologies, Inc. 5 Web: www.mmr-tech.com

  6. Variable Temperature Hall Effect Measurement Systems Hall Measurements  Magnitude of the Hall voltage (V H ): IB V  H qn s  I = current (A)  B = strength of magentic field  q = Elementary Charge (1.602 x 10 -19 coulombs)  n S = sheet density of the majority carrier Making the Hall Measurements  Two types of measurements need to be made:  One in a magnetic field in the positive field direction  One in a magnetic field in the negative field direction  Constants:  Direction of magnetic field  Magnitude of injected current  Overall Hall voltage can be calculated  Polarity of the V H indicated the type of material  Positive = P-Type  Negative = N-Type MMR Technologies, Inc. 6 Web: www.mmr-tech.com

  7. Variable Temperature Hall Effect Measurement Systems Components in a Hall System  Hall Vacuum Chamber  Pure high-pressure gas (greater than 1800 psi)  Hall Electronics and Software  Gas Lines, Pressure Gauge, etc  Magnet (optional)  Filter/Dryer Apparatus  Magnetic Power Supply  Refrigerator (optional)  Computer (not included)  Temperature controller  Circuit Breakout Box  Vacuum Pump (not included) Gas, Lines, Gauges, etc  99.998% Prepurified Nitrogen at 2640 psi or higher  High Pressure Nitrogen Regulator  High Pressure Nitrogen Lines (supplied)  Gas Flow Meter (supplied) MMR Technologies, Inc. 7 Web: www.mmr-tech.com

  8. Variable Temperature Hall Effect Measurement Systems Filter/Dryer Systems The Joule-Thomson Refrigerators R2500-XX MMR Technologies, Inc. 8 Web: www.mmr-tech.com

  9. Variable Temperature Hall Effect Measurement Systems Computer System  Minimum Requirements:  Pentium Processor, 1 GHz minimum  Windows Operating System  XP Professional  Windows 7 Professional or Ultimate with XP Emulator  CD-ROM Drive  500 MB RAM  250 MB free on hard drive  2 RS232 Serial Ports or a USB port with USB to RS232 Converter (included with Hall systems) Circuit Breakout Box MMR Technologies, Inc. 9 Web: www.mmr-tech.com

  10. Variable Temperature Hall Effect Measurement Systems Vacuum Pump and Accessory Kit Hall Vacuum Chamber MMR Technologies, Inc. 10 Web: www.mmr-tech.com

  11. Variable Temperature Hall Effect Measurement Systems Spring-Loaded Probes Hall Electronics MMR Technologies, Inc. 11 Web: www.mmr-tech.com

  12. Variable Temperature Hall Effect Measurement Systems Magnets and Power Supplies Possible Temperature Ranges Kelvin Scale Centigrade Scale  70 K to 580 K  - 200 ºC to 305 ºC  80 K to 580 K  - 190 ºC to 305 ºC  70 K to 730 K  - 200 ºC to 455 ºC  80 K to 730 K  - 190 ºC to 455 ºC  300 K to 730 K  25 ºC to 455 ºC K = ºC + 273 MMR Technologies, Inc. 12 Web: www.mmr-tech.com

  13. Variable Temperature Hall Effect Measurement Systems Potential Applications Why do we care about the Hall Effect?  Hall effect devices:  Immune to dust, dirt, mud, water  Better for position sensing  Hall sensors:  Can easily detect stray magnetic fields  Work well as electronic compasses  Hall effect current transducers:  High accuracy, environmentally hardy, low power consumptopn  Ideal solution for solar energy management Thank you for your time and attention Website: Website: www.mmr-tech. www.mmr-tech.com com Phone: +1 (650) 962-9622 Phone: +1 (650) 962-9622 Fax: +1 Fax: +1 (650) 962-9647 (650) 962-9647 Email: sales@mmr-tech.com Email: sales@mmr-tech.com MMR Technologies, Inc. 13 Web: www.mmr-tech.com

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