Flash Memory For Automative 2016 10 Do not distribute without - - PowerPoint PPT Presentation

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Flash Memory For Automative 2016 10 Do not distribute without - - PowerPoint PPT Presentation

Flash Memory For Automative 2016 10 Do not distribute without permission 1 2007 2 2011 6th 3 2015 9th 4 Automotive Flash 5 NAND for Automotive More storage requires NAND Navigation, ADAS,


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SLIDE 1

이에프텍

Flash Memory For Automative

2016 10

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Do not distribute without permission

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SLIDE 2

2007년 시작

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SLIDE 3

2011년 6th

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SLIDE 4

2015년 9th

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SLIDE 5

Automotive Flash

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NAND for Automotive

  • More storage requires NAND

– Navigation, ADAS, Infotainment and Black-box

  • NAND is acceptable for the dashboard or a head unit

– Under -20C to 85

  • Data retention on high temperature is critical issue

장치의 장착위치 저장온도 동작온도 직사광선 노출 안됨 85C 75C 직사광선 노출 근처 95C 85C 직사광선 노출 115C 105C

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Data retention loss

  • For 19nm MLC (Multi-Level Cell) NAND the acceleration factors for retention

degradation are 6.5 at 55°C and a fatal 168 at 85°C which means that stored data is definitely corrupted after a few months without additional countermeasures.

출처:

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SLIDE 8

AEQ-Q100

  • High Temp Program/Erase Endurance Cycling
  • 85C, cycling for 15% of product life time : 1/3 time on full area, 3/1

time on 10% area, 1/3 time on the rest of area (90%)

– High Temp Data Retention(HTDR)

  • Example) 150C bake 40 hr

– High Temp Operating Life (HTOL)

  • 90C R/W for 408 hours OR 70C R/W for 1000 hours
  • High speed
  • Low Temp Program/Erase Endurance Cycling procedure
  • 55C, cycling for 15% of product life time

– Low Temp Data Retention(HTDR) procedure

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SLIDE 9

Customer Requirement

테스트명 시나리오 High Temp 85C, Read/Write, 2000Hours Low Temp

  • 25C, Read/Write, 100Hours

Cross Temp

  • 25~85C 1000cycle, Read/Write

High Temp+SPOR 85C 2000Hours with SPOR 5K

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SLIDE 10

EFTech Industrial eMMC/SD Tester

  • Test solution for industrial eMMC/SD

– Smart test cases and monitor/control GUI program – Chamber & test board

  • Working temperature test with high speed interface

– AP based chamber solution for 128 para

– Working temperature : -40C to 120C

  • Industrial Tester overview

– Functional/power-cycle test – endurance/retention test with burn-in – Performance benchmark

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Recent Test Result for automotive SD

  • All Sdcards of 5 makers could not pass our room temp

SPOR test

– Power cycle test fails within 100 ~ 1K – Write/read timeout with SPOR

  • Recommendation : Buy S-Sdcard or T-Sdcard on Gmarket !!
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System Configuration of NAND application

  • Navigation : Map-SD and OS-embedded flash

– eMMC on Wince/linux – MLC NAND + S/W FTL + Wince/linux

  • Is it Strong FTL ?
  • Driver Monitoring system

– SoC + SLC NAND in one chip package

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Automotive & Robotics

  • New Market & New Challenge

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ABB Industrial Robot Softbank PePe

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New S/W Tech

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Endurance(X) : Retention(Y) : Performance(Z) Target Specific Requirement

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Q&A : lauren@elixirflash.com