Evaluation of XRF Spectra from basics to advanced systems Piet Van - - PowerPoint PPT Presentation

evaluation of xrf spectra from basics to advanced systems
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Evaluation of XRF Spectra from basics to advanced systems Piet Van - - PowerPoint PPT Presentation

Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring Evaluation of XRF Spectra from basics to advanced systems Piet Van Espen piet.vanespen@uantwerpen.be


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Evaluation of XRF Spectra from basics to advanced systems

Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring

Piet Van Espen piet.vanespen@uantwerpen.be

20 Nov 2014

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Content

  • 1. Introduction: some concepts
  • 2. Simple peak integration
  • 3. Method of least squares
  • 4. Fitting of x-ray spectra
  • 5. Improvements to the model
  • 6. Final remarks
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Some basic concepts

Nature and science: a personal view Nature = Signal + Noise Science = Model + Statistics

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Why spectrum evaluation? element concentrations ⇔ net intensity of fluorescence lines But: frequent peak overlap presence of a continuum Especially in energy-dispersive spectra

interference free continuum corrected

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Spectrum contains

  • Information: energy and intensity of x-rays

  • Amplitude noise: due to Poisson statistics


► fluctuations in the spectrum


  • Energy noise: finite resolution of the detector

► nearly Gaussian peaks with a width of ~160 eV

Information content of a spectrum the signal the noise

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Amplitude noise

Counting events involves Poisson statistics Poisson probability density function: The probability to observe N counts if the true number is µ

Poisson : P(N | µ=3) Normal : P(x | µ=3 σ2 = 3)

Property:

Poisson distribution µ ≅ Normal distribution µ and σ2 = µ approximation is very good for µ (or N) ≥ 9

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Resolution of ED-XRF spectrometers

Full Width at Half Maximum (FWHM) of a peak Mn Kα @ 5.895 keV FWHMDet = 120 eV FWHMElec = 100 eV => FWHMPeak = 156 eV Intrinsic contribution

2.35 √ × F × E

ϵ energy to create e-h pair 3.85 eV F Fano factor ~0.114 E x-ray energy in eV

FWHM2

Peak = FWHM2 Elec + FWHM2 Det

Electronic noise ~100 eV Energy Noise

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Cr – Mn – Fe overlap at ~20 eV Cr – Mn – Fe overlap at ~160 eV Resolution of ED-XRF spectrometers

Energy Noise

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Without amplitude noise (counting statistics) there would be NO PROBLEM

But it is part of the nature We can only measure longer or with a more efficient system

Without energy noise there would be LITTLE PROBLEM

The natural line width of x-rays is only a few eV!!! The observed peak width is the result of the detection process with a fundamental limitation imposed by the Fano factor

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Information content of a spectrum If no energy noise or no amplitude noise ► could determine the “information” unambiguously Need methods to extract information in a optimum way These methods rely on “addition” information (knowledge)
 to extract the useful information Not the method itself is important (if implemented correctly)
 but the correctness of the additional information.

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  • 2. Simple peak integration
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Simple peak integration Estimate Uncertainty We have to make assumptions integration limits linear background no interference As good as is can get if the assumptions (model) are correct!

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  • 3. Method of Least Squares
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Need to “estimate” the net peak area with highest possible

  • correctness (no systematic error)
  • precision (smallest random error)

Least-squares estimation (fitting):

  • unbiased
  • minimum variance

Limiting factors:

  • counting statistical fluctuations (precision)
  • accuracy of the fitting model

Method of least squares

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Method of least squares, straight line

SS = X

i

[yi − y(i)]2 = X

i

[yi − b0 − b1xi]2 = min

⇤SS ⇤b0 = 0 → X

i

yi = b0n + b1 X

i

xi ⇤SS ⇤b1 = 0 → X

i

xiyi = b0 X xi + b1 X

i

x2

i

Set of 2 equations in 2 unknowns b0 and b1 Normal equations

Direct analytical solution Data: {xi,yi}, i=1, 2, …, N Model: y(i) = b0 + b1xi Fitting the model: estimating b0 and b1 Criterion: noise

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  • 4. Fitting X-ray Spectra
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Least-squares estimate of x-ray spectrum parameters

Peak described by a Gaussian Minimum: No direct analytical solution Search χ2 for minimum

2 = 1 ⌫

n2

X

i=n1

1 wi [y(i) − yi]2

y(i) = b + A 1 σ √ 2π exp (xi − xp)2 2σ2

  • position

width area continuum

Criterion, agreement between model and data

linear parameter non-linear

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We can still apply the concept of least squares minimising the square of the differences between the model and the data The sum of squares is a function of the values of the parameters and for a given set of values should be minimum In this case SS describes a 4 dimensional hyper-surface in a 5- dimension space h We can only “see” in 3-dimensions but mathematically we can search in a higher dimensional space to locate the minimum Starting from some initial values we can modify the parameter values until the minimum is reached. χ2 = χ2(b, h, x0, w) = 1

ν

P

i 1 yi [yi − y(xi, b, h, x0, w)]2

w

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General form of such a search algorithm

  • 1. Select starting values for all parameters bj

and calculate the ch-square

  • 2. Obtain (calculate, guess...) a change

(increment or decrement) Δbj such that one moves towards the minimum:

  • 3. Replace the old parameter values with the new ones


b ← b + Δb

  • 4. repeat step 2 until the “true” minimum is found

Iterative process

AXIL = Analysis of X-ray spectra by Iterative Least-squares

χ = χ(b) χ(b + ∆b) < χ(b)

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Analytically important parameters: net peak areas In general y(i) is non-linear → Marquardt – Leverberg algorithm Gradient search ↔ linearisation Reliable error estimated But unstable Statistical optimal estimate: using correct weight (Poisson statistics wi = yi)

2 = 1 ⌫

n2

X

i=n1

1 wi [y(i) − yi]2

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10 peaks ⇒ > 30 parameters !!!! WANT WORK in practice!!!! But we can do better

⇒ Add additional information to the model We known the energies of the x-ray lines (in most cases) Where they are depends on the energy calibration (the same applies to the width of the peaks: resolution calibration)

G(i, E) = Gain σ(E) √ 2π exp (Ei − E)2 2σ2(E)

  • Gaussian peak shape

Energy relation: Resolution relation: E(i) = Zero + Gain × i

(E) = "✓ Noise 2 √ 2 ln 2 ◆2 + ✏FanoE #1/2

Only 4 non-linear parameters For 10 peaks only 14 parameters

Need parsimony!!!

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Already better, but we know more

We know (to some extend) the ratio between lines of an element

IKα2 IKα1 , IKβ IKα . . .

We can group lines together (“peakgroup”) with one “area” and fixed intensity ratios

Continuum function Area Line ratio Peak shape

for j elements (or peak groups)

y(i) = yCont(i) + X

j

Aj (X

k

RjkP(i, Ejk) )

10 elements ⇒ 10 Area’s + 4 calibration parameters

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Further refinements: escape peaks

Known position (energy) intensity (escape probability)

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Sum peaks

Known position relative intensity

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And more

Different background models polynomial exponential polynomial Bremsstrahlung background filter background Parameter constraining

and more...

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Highly flexible method

  • Fit individual lines, multiplets, elements…
  • Different parametric and non-parametric continuum models
  • Include escape and sum peaks

Quality criteria

  • Chi-square of fit
  • uncertainty estimate of parameters

Statistically correct

  • unbiased, minimum variance estimate of the parameters

“Resolving power” is only limited by the noise (counting statistic) BUT THE MODEL MUST BE ACCURATE

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  • 5. Improvements to the model
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Incorrectness of the model

Not all peaks follow the energy calibration relation

  • incoherent (Compton) scatter peaks
  • spurious peaks (diffraction, γ-rays)
  • even the relation might not be linear

Not all peaks follow the resolution calibration relation

  • incoherent scatter peaks (are wider)
  • spurious peaks

Peaks are certainly not perfect Gaussians

  • shelf (step) due to detector effects (incomplete charge collection)
  • tailing due to radiative effects and detector effects
  • deviation due to natural line width (Lorentzian)
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Incorrect fitting model biased results

Solution Adapt the model
 (fitting region, which lines to include...)
 for each particular case Very inconvenient
 when analyzing many spectra

especially for trace elements

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Step

h i S(i, Ejk) = Gain 2Ejk erfc E(i) − Ejk

2

  • Peak

P(i, Ejk) = G(i, Ejk) + fSS(i, Ejk) + fT T(i, Ejk)

Adding 1 non-linear and 2 linear parameters for each peak!!! Tail

T(i, Ejk) = Gain 2 exp h − 1

2β2

i exp E(i) − Ejk

  • erfc

E(i) − Ejk

2 + 1 √2

  • Improve the peak profile

Where is my parsimony gone!!! Improvements

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Step parameterisation

Step is a fundamental aspect of the detector
 (charge loss by photo-electrons near the surface of the detector)

Step fraction fS is related to the MAC

  • f the detector crystal

Tail fraction parameterisation

Tail fraction fT is related to the MAC of the detector and the type

  • f radiation (Kα and Kβ)

The tail has a component due to the detector and a radiative component

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Tail width parameterisation

similar magnitude over the entire energy range fS(Ejk) = µDet(Ejk) (a0 + a1Ejk) fTKα(Ejk) = b0 + b1µDet(Ejk) fTKβ(Ejk) = c0 + c1µDet(Ejk) (Ejk) = d0 + d1Ejk

(compare to Zero, Gain, Noise and Fano)

⇒ Fitting parameters a0, a1, b0, b1, c0, c1, d0, d1

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improvement

Fit of a NIST SRM 1106 Brass spectrum (SpecTrace 5000, Rh tube)

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To account for peak shift and peak broadening

Need to make the peak profile still a bit more complicated X X G ( i , E ) = G a i n

  • (

E ) √ 2 ⇡ e x p  ( E

i

− E ( i ) +

  • E

)

2

2

  • 2

( E )

  • γ peak broadening parameter (normally 1.00)

δE peak shift parameter (normally 0.00) These parameters are constrained to vary within a certain range Eini − ∆E ≤ E ≤ Eini + ∆E ini − ∆ ≤ ≤ ini + ∆

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The last step

Replace Gaussian with the convolution of a Gaussian with a Lorentzian = Voigt profile

Gain jk √ 2⇡K E(i) − Ejk jk √ 2 , ↵L 2jk √ 2 !

K(x, y) = Re ⇥ exp(−z2)erfc(−iz) ⇤ z = x + iy

with K(...) the complex error function For high Z elements the natural line width becomes substantial relative to the detector resolution

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Natural line width at high Z elements becomes important e.g. W K ~ 50 eV Gaussians Voigts

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Original fit of a geological standard (JG1)

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Improved fit of the geological standard (JG1) Mo secondary target No background

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NIST SRM 1155

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NIST SRM 1247

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More Details Handbook of X-ray Spectrometry

  • R. Van Grieken, A. Markowicz

Marcel Decker, N.Y. 2002 ISBN: 0-8247-0600-5 Chapter 4: Spectrum Evaluation

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Some final remarks: The future Non-linear least-squares works if you have a good parsimonious model if you have TIME X-ray fluorescence imaging: 256 x 256 image = 65536 x-ray spectra @ 1 s / spectrum = 65536 seconds = 1092 minutes = 18 hours !!!! Need to explore new methods Linear models? Multivariate models?

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  • 6. Final remarks
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Thanks for your attention