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Evaluation of 50 m square pixel detector with test ASIC for the HL-LHC ATLAS upgrade Yamanaka Group M2 Daiki Yamamoto 2017 1 LHC-ATLAS Experiment ATLAS detector 44m LHC Large

slide-1
SLIDE 1

Evaluation of 50 μm square pixel detector with test ASIC for the HL-LHC ATLAS upgrade

1

Yamanaka Group M2 Daiki Yamamoto

2017年 山中研・久野研合同年末発表会

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SLIDE 2

LHC（Large Hadron Collider） 25m 44m ATLAS detector 1442mm

LHC-ATLAS Experiment

2

430mm

pixel silicon detector

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SLIDE 3

goal

efficiency study of pixel detector ü structure effect

telescope

get track of particle tracking resolution must be less than 10 μm

Beam Test

3

50 μm

pixel detector

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SLIDE 4

proton (120GeV)

Beam Test

@Fermilab

4

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SLIDE 5

Experimental Setup SVX4 telescope

5

〜70cm

Tilt

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SLIDE 6

SVX4 telescope track reconstruction

6

slide-7
SLIDE 7

vertical tilted signal can be detected at only 1 strip resolution

𝜏 =

$% &'

  • ~14[µm]

more than 1 strip centroid method hit position

this time, tilted sensors by 10 degree

Merit of Tilting the Sensors

thickness 300µm width 50µm

7

⇨

slide-8
SLIDE 8

Data Processing

8

Hit Selection Clustering GetLocalPosition

charge

strip #

hit threshold cluster

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SLIDE 9

Alignment

9

GetGlobalPosition Shift Rotation

target residual

track position x track position y track position x track position y

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SLIDE 10
  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800

residualX0

residualX0 Entries 17030 Mean 0.2321 RMS 8.46 Underflow 15 / ndf 2 χ 3.06 / 5 Prob 0.6908 Constant 23.9 ± 1840 Mean 0.1128 ± 0.1159 Sigma 0.199 ± 7.272

residualX0

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000 2200

residualX1

residualX1 Entries 17039 Mean 0.00946 RMS 7.271 Underflow 10 / ndf 2 χ 7.139 / 5 Prob 0.2105 Constant 26.0 ± 2130 Mean 0.07683 ± 0.06194 Sigma 0.110 ± 5.994

residualX1

1000 1200 1400 1600 1800 2000 2200
  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000 2200

residualX2

residualX2 Entries 18705 Mean
  • 0.3672
RMS 8.103 Underflow 29 / ndf 2 χ 4.607 / 5 Prob 0.4657 Constant 26.9 ± 2266 Mean 0.0768 ±
  • 0.1862
Sigma 0.113 ± 6.099

residualX2

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000

residualX3

residualX3 Entries 18724 Mean 0.4358 RMS 9.294 Underflow 28 / ndf 2 χ 5.754 / 6 Prob 0.4513 Constant 23.6 ± 1996 Mean 0.0919 ± 0.1766 Sigma 0.133 ± 6.977

residualX3

Residual Distribution (after alignment)

10

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000

residualY0

residualY0 Entries 17030 Mean 0.1411 RMS 8.704 Underflow 35 / ndf 2 χ 8.635 / 5 Prob 0.1245 Constant 24.4 ± 1895 Mean 0.09392 ±
  • 0.02973
Sigma 0.149 ± 6.564

residualY0

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000 2200

residualY1

residualY1 Entries 17039 Mean
  • 0.1624
RMS 7.559 Underflow 36 / ndf 2 χ 2.769 / 5 Prob 0.7355 Constant 26.5 ± 2159 Mean 0.07528 ±
  • 0.01021
Sigma 0.109 ± 5.942

residualY1

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000

residualY2

residualY2 Entries 18705 Mean 0.1119 RMS 11.18 Underflow 84 / ndf 2 χ 24.61 / 9 Prob 0.003439 Constant 20.8 ± 1855 Mean 0.072436 ± 0.007493 Sigma 0.086 ± 7.119

residualY2

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800

residualY3

residualY3 Entries 18724 Mean
  • 0.02642
RMS 12.59 Underflow 85 / ndf 2 χ 31.55 / 9 Prob 0.0002384 Constant 19.3 ± 1643 Mean 0.08931 ± 0.00299 Sigma 0.117 ± 7.947

residualY3

σ:7.2 μm σ:6.1 μm σ:6.6 μm σ:7.1 μm σ:6.0 μm σ:7.0 μm σ:5.9 μm σ:7.9 μm

  • 100

100 [µm]

  • 100

100 [µm]

  • 100 0

100 [µm]

  • 100

100

[µm]

  • 100

100 [µm]

  • 100

100 [µm]

  • 100 0

100 [µm]

  • 100

100

[µm]

1st layer 2nd layer 3rd layer 4th layer

X Y

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SLIDE 11

Assumption

l Track is parallel to the Z axis l Each sensor has almost same resolution

layer 𝝉𝒚 [𝛎𝐧] 𝝉𝒛 [𝛎𝐧]

6 6 1 5 6 2 5 6 3 6 7

Position Resolution of Sensor

11

𝜏&56789:;<

'

= 𝜏&

' + 𝜏>5;?@ '

= 𝜏&

' +

𝜏'

' + 𝜏A ' + 𝜏B '

  • 3

'

𝜏&56789:;<〜𝜏B56789:;<

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SLIDE 12

Analysis of Position Resolution

12

Factors

l fluctuation of dE/dx according to the FWHM of cluster charge,

DEFGF EFGF 〜0.2

𝑦 = 𝑦&𝑅& + 𝑦'𝑅' 𝑅& + 𝑅' 𝜀K~ 2

  • (𝑥𝑗𝑒𝑢ℎ) 𝑅&𝑅'

𝑅& + 𝑅' ' 𝜀𝑅 𝑅 if 𝑅&= 𝑅' , 〜4 μm l multiple scattering 〜2 μm l noise of ADC 〜 1 ADC 〜 1 ke (this effect is included in δQ)

Charge_Dist_0 Entries 67832 Mean 2.749e+04 RMS 1.114e+04 20 40 60 80 100

3 10 × 1000 2000 3000 4000 5000 Charge_Dist_0 Entries 67832 Mean 2.749e+04 RMS 1.114e+04

Charge_dist_0

20 40

charge[10A𝑓V]

cluster charge

𝜀𝑅>W>

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SLIDE 13

Tracking Resolution

Evaluating by weighting of each sensor resolution

𝝉𝒚V𝒖𝒔𝒃𝒅𝒍 [𝛎𝐧] 𝝉𝒛V𝒖𝒔𝒃𝒅𝒍 [𝛎𝐧] 3 3

13

ü Enough resolution ( ＜ 10 μm ) for evaluating pixel sensor

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SLIDE 14

FE65 pixel detector

14

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SLIDE 15

15

1000 2000 3000 4000 5000 6000 7000 8000 9000 500 1000 1500 2000 2500 3000

CorrelationX_track_vs_hit

Entries 1046 Mean x 4869 Mean y 1543 Std Dev x 1128 Std Dev y 827.3 2 4 6 8 10 12 14 16 18 20

CorrelationX_track_vs_hit

Entries 1046 Mean x 4869 Mean y 1543 Std Dev x 1128 Std Dev y 827.3

CorrelationX_track_vs_hit

6000 7000 8000 9000 10000 11000 12000 13000 500 1000 1500 2000 2500 3000

CorrelationY_track_vs_hit

Entries 1046 Mean x 9514 Mean y 1838 Std Dev x 1309 Std Dev y 841.2 5 10 15 20 25

CorrelationY_track_vs_hit

Entries 1046 Mean x 9514 Mean y 1838 Std Dev x 1309 Std Dev y 841.2

CorrelationY_track_vs_hit

track x [um] hit x[um] track y [um] hit y[um]

track vs hit Correlation

slide-16
SLIDE 16

16

Residual Histogram

ResidualX_track_hit Entries 3028 Mean 3533 Std Dev 20.45 3440 3460 3480 3500 3520 3540 3560 3580 3600 3620 20 40 60 80 100 120 140 ResidualX_track_hit Entries 3028 Mean 3533 Std Dev 20.45

ResidualX_track_hit

ResidualY_track_hit

Entries 3028 Mean 1.157e+04 Std Dev 21.58

11450 11500 11550 11600 11650 11700 10 20 30 40 50 60 70 80 ResidualY_track_hit

Entries 3028 Mean 1.157e+04 Std Dev 21.58

ResidualY_track_hit

track – hit x [um] track – hit y [um] ~50 μm (1 pixel size) ~50 μm (1 pixel size)

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SLIDE 17

17

To Do

  • Draw Hit Efficiency map

like this

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SLIDE 18

Backup

18

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SLIDE 19

ATLAS実験の目的 u Higgs粒子の精密測定 u 超対称性粒子の探索

現在 HL-LHC

現在の5倍の輝度

HL-LHCにより 高統計を期待

High Luminosity LHC

19

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SLIDE 20

より細かい目のピクセル

新型ASIC搭載 50μm角ピクセル検出器

高放射線耐性

陽子線照射後、 ビームを用いて性能評価

High Luminosity 5倍の粒子密度 Integrated Luminosity

1.7×10&$ [𝑜6a/𝑑𝑛'] 相当のダメージ ＠ピクセル3層目

HL-LHCにおける検出器への要求

20

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SLIDE 21

width 50 μm # of strip 256 thickness 300 μm

ü charge readout（8bit ADC） ü 128ch

8 sensors (x, y) ↓ 4layer

13mm

15.4 mm

Silicon Strip Sensor (Telescope)

21

SVX4 chip strip sensor

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SLIDE 22

𝑦' − 𝑦& = 50 𝜈𝑛 ストリップ間隔 、𝜀𝑅& = 𝜀𝑅'とする 𝑦 = 𝑦&𝑅& + 𝑦'𝑅' 𝑅& + 𝑅' 𝜀𝑦 = 𝜖𝑦 𝜖𝑅&

'

𝜀𝑅&

' +

𝜖𝑦 𝜖𝑅'

'

𝜀𝑅'

'

  • =

𝑥𝑅' 𝑅& + 𝑅' '

'

𝜀𝑅&

' +

−𝑥𝑅& 𝑅& + 𝑅' '

'

𝜀𝑅'

'

  • =

𝑥𝜀𝑅& 𝑅& + 𝑅' ' 𝑅& + 𝑅' ' − 2𝑅&𝑅'

  • 位置分解能とノイズ

22

slide-23
SLIDE 23 channel_index 100 200 300 400 500 charge 50 100 150 200 250 3 10 × 1 10 2 10 3 10

charge:channel_index {layer_index==0}

üEvaluate pedestal of each strips ücharge = (ADC-pedestal)×gain

100 200 strip#

200 100

100 200 300 400 strip#

200 100

Convert ADC to Charge

1chip

100 200 strip#

23

X Y channel vs adc 0x channel vs adc 0y channel vs charge 0xy

charge[10A𝑓V]

ADC

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SLIDE 24

ü hit selection (ADC) > (pedestal) + 9×(pedestal width) ücentroid method local hit postion

2000 4000 6000 8000 10000 12000 10000 20000 30000 40000 50000 60000 70000 LocalPosition_vs_TotCharge_0 Entries 67832 Mean x 7523 Mean y 2.673e+04 RMS x 2290 RMS y 9116 1 10 2 10 LocalPosition_vs_TotCharge_0 Entries 67832 Mean x 7523 Mean y 2.673e+04 RMS x 2290 RMS y 9116

LocalPosition_vs_TotCharge_0

2000 4000 6000 8000 10000 12000 10000 20000 30000 40000 50000 60000 70000 LocalPosition_vs_TotCharge_1 Entries 57551 Mean x 7043 Mean y 2.585e+04 RMS x 2327 RMS y 9097 1 10 2 10 LocalPosition_vs_TotCharge_1 Entries 57551 Mean x 7043 Mean y 2.585e+04 RMS x 2327 RMS y 9097

LocalPosition_vs_TotCharge_1

4 8

x[mm] 60 30

Charge_Dist_0 Entries 67832 Mean 2.749e+04 RMS 1.114e+04 20 40 60 80 100 3 10 × 1000 2000 3000 4000 5000 Charge_Dist_0 Entries 67832 Mean 2.749e+04 RMS 1.114e+04

Charge_dist_0

20 40 60

charge[10A𝑓V]

cluster charge

Hit Selection & Clustering

4 8

y[mm]

24

charge

strip # local x vs cluster charge local y vs cluster charge

hit threshold

⇨

cluster

[10A𝑓V]

slide-25
SLIDE 25

X Z Y

Definition of Global Coordinate

25

slide-26
SLIDE 26

üConvert local position to global position üCalculate difference of hit positions of first layer and other layer, then shift the each layers

rot_x_0_1_py Entries 43876 Mean
  • 516.7
RMS 50.35 Layer1[um]
  • 1000
  • 800
  • 600
  • 400
  • 200
200 5000 10000 15000 20000 25000 rot_x_0_1_py Entries 43876 Mean
  • 516.7
RMS 50.35 Difference of X Position vs Y Position between Layer0 and Layer1
  • 800
  • 400

[µm]

Prealignment

26

reference difference of X positions

ü x shift & y shift

slide-27
SLIDE 27
  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200

residualX1

residualX1 Entries 24630 Mean 4.035 RMS 17.1 Underflow 15 / ndf 2 χ 18.09 / 15 Prob 0.2581 Constant 12.3 ± 1114 Mean 0.257 ± 3.201 Sigma 0.49 ± 17.96

residualX1

  • 150
  • 100
  • 50
50 100 150 500 1000 1500 2000 2500 3000

residualY1

residualY1 Entries 24630 Mean
  • 0.07846
RMS 8.124 Underflow 61 / ndf 2 χ 3.37 / 5 Prob 0.6431 Constant 30.9 ± 2977 Mean 0.0687 ± 0.1066 Sigma 0.104 ± 6.214

residualY1

ü3 points excluding target layer tracking ümean of residual correction

  • 100

0 residual x[µm]

Shift

  • 100

0 residual y[µm]

Residual of X, Y

target

ü After correction, mean of residual equal to zero

27

residual

⇨ ⇨

mean:3.2 µm mean:0.1 µm

slide-28
SLIDE 28

Rotation Y axis、X axis

hit position x’

üresidual x = x – x’ correlates to x üslope of “x vs residual x” estimate Y axis rotation

track position x

28

  • 1

1

zero

⇨

slide-29
SLIDE 29

29

Rotation Z axis

track position x track position y track position x track position y

ü residual = x – x’ correlates y ü slope of “y vs residual x” estimate Z axis rotation

⇨

slide-30
SLIDE 30 Layer0[um] 2000 4000 6000 8000 10000 12000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 5 10 15 20 25 30 35 40

Correlation of X Position vs ResidualX @Layer0

/ ndf

2

χ 403.8 / 155 p0 0.32 ±

  • 44.52

p1 0.000067 ± 0.008767 / ndf

2

χ 403.8 / 155 p0 0.32 ±

  • 44.52

p1 0.000067 ± 0.008767

Layer0[um]
  • 2000
2000 4000 6000 8000 10000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 10 20 30 40 50 60 70 80

Correlation of X Position vs ResidualY @Layer0

/ ndf

2

χ 250.2 / 155 p0 0.171 ± 5.446 p1 0.000036 ±

  • 0.001186

/ ndf

2

χ 250.2 / 155 p0 0.171 ± 5.446 p1 0.000036 ±

  • 0.001186
Layer0[um] 2000 4000 6000 8000 10000 12000 14000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 5 10 15 20 25 30 35 40 45

Correlation of Y Position vs ResidualX @Layer0

/ ndf

2

χ 1967 / 197 p0 0.41 ± 45.74 p1 0.000047 ±

  • 0.005966

/ ndf

2

χ 1967 / 197 p0 0.41 ± 45.74 p1 0.000047 ±

  • 0.005966
Layer0[um] 2000 4000 6000 8000 10000 12000 14000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 10 20 30 40 50 60 70 80

Correlation of Y Position vs ResidualY @Layer0

/ ndf

2

χ 367 / 197 p0 0.230 ±

  • 6.753

p1 0.000026 ± 0.000821 / ndf

2

χ 367 / 197 p0 0.230 ±

  • 6.753

p1 0.000026 ± 0.000821

0.1

  • 0.1

2 6 10 y[mm]

δx [mm]

2 6 10 y[mm] 4 8 x[mm]

Rotation (before alignment)

30

0.1

  • 0.1

δy [mm]

0.1

  • 0.1

0 4 8 x[mm]

δy [mm]

0.1

  • 0.1

δx [mm]

𝜒K : 2° 𝜒jk : 3° 𝜒l : 8° 𝜒jm : 6°

slide-31
SLIDE 31

Rotation (after alignment)

Layer0[um] 2000 4000 6000 8000 10000 12000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 20 40 60 80 100

Correlation of X Position vs ResidualX @Layer0

/ ndf 2 χ 165.8 / 155 p0 0.167 ± 2.155 p1 0.0000351 ±
  • 0.0004011
/ ndf 2 χ 165.8 / 155 p0 0.167 ± 2.155 p1 0.0000351 ±
  • 0.0004011
Layer0[um] 2000 4000 6000 8000 10000 12000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 10 20 30 40 50 60 70

Correlation of X Position vs ResidualY @Layer0

/ ndf 2 χ 275.6 / 155 p0 0.1739 ±
  • 0.4455
p1 0.0000372 ± 0.0001293 / ndf 2 χ 275.6 / 155 p0 0.1739 ±
  • 0.4455
p1 0.0000372 ± 0.0001293 Layer0[um] 2000 4000 6000 8000 10000 12000 14000 Layer0[um]
  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 10 20 30 40 50 60 70 80

Correlation of Y Position vs ResidualX @Layer0

/ ndf

2

χ 274.8 / 196 p0 0.21963 ± 0.03276 p1 2.477e-05 ± 4.494e-05 / ndf

2

χ 274.8 / 196 p0 0.21963 ± 0.03276 p1 2.477e-05 ± 4.494e-05 Layer0[um] 2000 4000 6000 8000 10000 12000 14000 Layer0[um]

  • 100
  • 80
  • 60
  • 40
  • 20
20 40 60 80 100 20 40 60 80 100

Correlation of Y Position vs ResidualY @Layer0

/ ndf

2

χ 252.3 / 196 p0 0.224 ± 7.402 p1 0.00003 ±

  • 0.00085

/ ndf

2

χ 252.3 / 196 p0 0.224 ± 7.402 p1 0.00003 ±

  • 0.00085

31

0.1

  • 0.1

2 6 10 y[mm]

δx [mm]

2 6 10 y[mm] 4 8 x[mm]

0.1

  • 0.1

δy [mm]

0.1

  • 0.1

0 4 8 x[mm]

δy [mm]

0.1

  • 0.1

δx [mm]

𝜒K : 2° 𝜒jk : 1° 𝜒l : 2° 𝜒jm : 1°

slide-32
SLIDE 32

多重散乱による寄与 𝜄o<;p6

5q7

= 13.6 𝑁𝑓𝑊 𝛾𝑑𝑞 𝑨 𝑦 𝑦%

  • = 5.9×10Vy

評価対象検出器における散乱の寄与は tan 𝜄o<;p6

5q7

×0.35 ≈ 2 𝜈𝑛

35cm

位置分解能と多重散乱

32

silicon 600 μm

slide-33
SLIDE 33 1 10 2 10 3 10 4 10

ADC_vs_TDC_tele0

50 100 150 200 250 2 4 6 8 10 12 14 16 18 ADC_vs_TDC_tele0 Entries 9.586688e+07 Mean x 12.35 Mean y 9.491 RMS x 7.161 RMS y 5.739

ADC_vs_TDC_tele0

1 10 2 10 3 10 4 10

ADC_vs_TDC_tele1

50 100 150 200 250 2 4 6 8 10 12 14 16 18 ADC_vs_TDC_tele1 Entries 9.586688e+07 Mean x 27.61 Mean y 9.507 RMS x 59.1 RMS y 5.739

ADC_vs_TDC_tele1

1 10 2 10 3 10 4 10

ADC_vs_TDC_tele2

50 100 150 200 250 2 4 6 8 10 12 14 16 18 ADC_vs_TDC_tele2 Entries 9.586688e+07 Mean x 9.941 Mean y 9.434 RMS x 7.259 RMS y 5.648

ADC_vs_TDC_tele2

1 10 2 10 3 10 4 10

ADC_vs_TDC_tele3

50 100 150 200 250 2 4 6 8 10 12 14 16 18 ADC_vs_TDC_tele3 Entries 9.586688e+07 Mean x 10.16 Mean y 9.458 RMS x 5.392 RMS y 5.72

ADC_vs_TDC_tele3

シグナルの大きさはTDCの値に 依存する。 今回の位置分解能の最小値の 見積もりには、 4<TDC<16 を用いた。

TDC cut

33

slide-34
SLIDE 34
  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000

residualX0

residualX0 Entries 24836 Mean
  • 4.798
RMS 20.4 Underflow 30 / ndf 2 χ 25.62 / 18 Prob 0.1088 Constant 10.5 ± 944.8 Mean 0.304 ±
  • 4.172
Sigma 0.6 ± 21.1

residualX0

  • 150
  • 100
  • 50
50 100 150 500 1000 1500 2000 2500

residualY0

residualY0 Entries 24836 Mean
  • 0.03303
RMS 9.403 Underflow 57 / ndf 2 χ 8.757 / 7 Prob 0.2705 Constant 25.7 ± 2560 Mean 0.0757 ±
  • 0.1495
Sigma 0.107 ± 7.324

residualY0

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200

residualX1

residualX1 Entries 24630 Mean 4.035 RMS 17.1 Underflow 15 / ndf 2 χ 18.09 / 15 Prob 0.2581 Constant 12.3 ± 1114 Mean 0.257 ± 3.201 Sigma 0.49 ± 17.96

residualX1

  • 150
  • 100
  • 50
50 100 150 500 1000 1500 2000 2500 3000

residualY1

residualY1 Entries 24630 Mean
  • 0.07846
RMS 8.124 Underflow 61 / ndf 2 χ 3.37 / 5 Prob 0.6431 Constant 30.9 ± 2977 Mean 0.0687 ± 0.1066 Sigma 0.104 ± 6.214

residualY1

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800 2000 2200

residualX2

residualX2 Entries 20706 Mean 0.4644 RMS 8.611 Underflow 27 / ndf 2 χ 8.217 / 6 Prob 0.2226 Constant 25.0 ± 2214 Mean 0.0851 ± 0.8121 Sigma 0.127 ± 7.005

residualX2

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800

residualY2

residualY2 Entries 20706 Mean 0.256 RMS 14.06 Underflow 91 / ndf 2 χ 38.88 / 11 Prob 5.553e-05 Constant 18.7 ± 1724 Mean 0.0770 ± 0.2762 Sigma 0.087 ± 7.967

residualY2

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600 1800

residualX3

residualX3 Entries 21154 Mean
  • 0.7938
RMS 10.62 Underflow 30 / ndf 2 χ 14.35 / 8 Prob 0.07302 Constant 20.0 ± 1758 Mean 0.123 ±
  • 1.382
Sigma 0.203 ± 9.411

residualX3

  • 150
  • 100
  • 50
50 100 150 200 400 600 800 1000 1200 1400 1600

residualY3

residualY3 Entries 21154 Mean
  • 0.327
RMS 15.96 Underflow 87 / ndf 2 χ 31.32 / 13 Prob 0.003029 Constant 16.6 ± 1558 Mean 0.0854 ±
  • 0.4071
Sigma 0.095 ± 9.005

residualY3

  • 100 0 100 residual x[µm]
  • 100 0 100 residual y[µm]
  • 100 0 100 residual x[µm ]
  • 100 0 100 residual y[µm]
  • 100 0 100 residual x[µm]
  • 100 0 100 residual y[µm]
  • 100 0 100 residual x[µm]
  • 100 0 100 residual y[µm]

alignment前の残差分布

34

slide-35
SLIDE 35

位置分解能の評価

35

位置分解能に影響するファクター l 電離損失の揺らぎ cluster chargeの幅より、δQ〜2.4 ke cluster total charge の幅から見積もり 𝑦 = 𝑦&𝑅& + 𝑦'𝑅' 𝑅& + 𝑅' 𝜀K = (𝑦& − 𝑦')' (𝑅'

'𝜀𝑅& ' + 𝑅& '𝜀𝑅' ')

  • 𝑅& + 𝑅' '

~ 𝑒𝜀𝑅& 2 2

  • 𝑅&

~3.9 µm l 多重散乱 〜4μm l ADCのnoise 〜 1ADC 〜 1ke δQに含まれる

Charge_Dist_0 Entries 67832 Mean 2.749e+04 RMS 1.114e+04 20 40 60 80 100 3 10 × 1000 2000 3000 4000 5000 Charge_Dist_0 Entries 67832 Mean 2.749e+04 RMS 1.114e+04

Charge_dist_0

20 40 60

charge[10A𝑓V]

cluster charge

slide-36
SLIDE 36

Data Structure of detectors

36

SVX4 (telescope) FE65 (pixel sensor) TLU (trigger) EventNumber ○ ○ ○ TimeStamp ○ × ○ ADC ○ × × ToT × ○ ×

However, There is mismatching of EventNumber...

slide-37
SLIDE 37

TimeStamp

37

200 400 600 800 1000 1200 1400 1600 1800 2000 2200 100 − 50 − 50 100 150 200 250

difference_of_TimeStamp

entry# timestamp (SVX-TLU)

here : mismatching

slide-38
SLIDE 38

TimeStamp

38

200 400 600 800 1000 1200 1400 1600 1800 2000 2200 100 − 50 − 50 100 150 200 250

difference_of_TimeStamp

entry# timestamp (SVX-TLU)

here : mismatching

SVX TLU

SVX TLU

slide-39
SLIDE 39

39

50 100 150 200 250 10 20 30 40 50 60

CorrelationY_SVXMaxAdcCh_hitFE65

Entries 1300 Mean x 125.2 Mean y 3.344 Std Dev x 77.25 Std Dev y 11.78 10 20 30 40 50

CorrelationY_SVXMaxAdcCh_hitFE65

Entries 1300 Mean x 125.2 Mean y 3.344 Std Dev x 77.25 Std Dev y 11.78

CorrelationY_SVXMaxAdc_hitFE65

50 100 150 200 250 10 20 30 40 50 60

CorrelationY_SVXMaxAdcCh_hitFE65

Entries 1500 Mean x 126.3 Mean y 3.126 Std Dev x 76.45 Std Dev y 11.44 10 20 30 40 50

CorrelationY_SVXMaxAdcCh_hitFE65

Entries 1500 Mean x 126.3 Mean y 3.126 Std Dev x 76.45 Std Dev y 11.44

CorrelationY_SVXMaxAdc_hitFE65

0〜1500 entry 1700〜3000 entry svx y svx y FE65 y FE65 y

correlation disappear after event mismatching occurred

TimeStamp

slide-40
SLIDE 40

40

üMaking list of EventNumber whose TimeStamp matching → This will resolve mismatching between SVX4 and TLU

TimeStamp

60 80 100 120 140 160 180 200 220 240 10 20 30 40 50 60

CorrelationX_SVXMaxAdcCh_hitFE65

Entries 34999 Mean x 151.9 Mean y 31.44 Std Dev x 23.68 Std Dev y 16.68 1 2 3 4 5 6 7 8 9 10

CorrelationX_SVXMaxAdcCh_hitFE65

Entries 34999 Mean x 151.9 Mean y 31.44 Std Dev x 23.68 Std Dev y 16.68

CorrelationX_SVXMaxAdc_hitFE65

50 100 150 200 250 10 20 30 40 50 60

CorrelationX_SVXMaxAdcCh_hitFE65

Entries 32802 Mean x 132.4 Mean y 30.88 Std Dev x 61.32 Std Dev y 17.69 0.5 1 1.5 2 2.5 3

CorrelationX_SVXMaxAdcCh_hitFE65

Entries 32802 Mean x 132.4 Mean y 30.88 Std Dev x 61.32 Std Dev y 17.69

CorrelationX_SVXMaxAdc_hitFE65

0〜35000 entry 35000entry ~ svx x svx x FE65 x FE65 x

However, there is also mismatching between TLU and FE65