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Doping of optical fiber preforms by by oxide and metal nanoparticles Stanislav ampelj, Borut Lenardi , Sta s a a pe j, o ut e a d , Miha Kveder Scope of presentation Interest Fabrication method Experimental


  1. Doping of optical fiber preforms by by oxide and metal nanoparticles Stanislav Č ampelj, Borut Lenardi č , Sta s a Č a pe j, o ut e a d č , Miha Kveder

  2. Scope of presentation • Interest • Fabrication method • Experimental • Results • Results • Conclusions

  3. Interest • Interest � fabrication of layers inside optical fiber, containing metal nanoparticles or even thin metal layers metal layers � fabrication of silica-based optical fibers, containing a crystalline or amorphous phase containing a crystalline or amorphous phase of a different (oxide) material (i.e. Optacore‘s project to fabricate OF with magneto-strictive � characteristics under MANUNET programme) h t i ti d MANUNET ) � fabrication of rare earth- or metal-doped optical fibers with dopants distributed as optical fibers with dopants distributed as nanoparticles or agglomerations with limited size

  4. Fabrication method • Flash vaporization and aerosol preform fabrication methods were used • Optacore‘s FVS and AES devices connected to MCVD system were used • Nanoparticle dopants were either commercial products or custom developed suspensions with low agglomeration characteristics l l ti h t i ti • Standard preform analysis tools were used S d d f l i l d combined with SEM, TEM microscopy and EDAX probe probe

  5. Процесс Осаждения

  6. Experimental • Nanoparticles � Al2O3 cat no 544833 avg particle size <50 nm Sigma Aldrich � Al2O3, cat.no. 544833, avg. particle size <50 nm, Sigma Aldrich � Er2O3, cat.no. 903581, avg. particle size 41-53 nm, MaTecK GmbH � Cu, avg. particle size 25-70 nm, Tekna C l 2 0 k � Fe-Co ferrite custom developed by Department for Material Synthesis of JSI, Ljubljana, part of FOMS project � Gold nanorod suspension, prod. code 716855, nanorods 25 nm OD and approx. 600 nm long Aldrich Chemistry • Preform deposition materials � standard MCVD materials (tubes, chlorides, gases) � in most cases TEOS was the Si-precursor � TEOGe and TEPO replaced GeCl4 and POCl3 precursors, when used in combination with TEOS used in combination with TEOS

  7. Experimental

  8. Experimental SEM im age of Er2 O3 nanoparticles – agglom erates of approx. 2 5 0 nm g p gg pp TEM im age of Er2 O3 nanopraticles, ave. 1 5 -2 5 nm , am orphous layer 1 -2 .5 nm

  9. Experimental SEM im age of Al2 O3 nanoparticles – agglom erates of approx. 1 0 0 - 5 0 0 nm

  10. Experimental TEM im age of Al2 O3 nanopraticles, aggl. 1 0 0 - 2 9 0 nm , am orphous layer 4 -8 nm TEM im age of Al2 O3 nanopraticles, aggl. 1 0 0 2 9 0 nm , am orphous layer 4 8 nm

  11. Experimental

  12. Experimental

  13. Experimental

  14. Results Refractive index profile of P0350 preform (pos. 420, angle 0 ° ) and P0351 preform, both doped by Er2O3/Al2O3 nanoparticles

  15. Results TEM im age of nanopraticles in the P0 3 5 0 w ith the enlargm ent of the circled area TEM im age of nanopraticles in the P0 3 5 1 w ith the enlargm ent of the circled area

  16. Results – Er/Al nanoparticles • Electron diffraction pattern (EDP) of pure silicon matrix showed no presence of crystalline phase • However, an EDP of the matrix containing nanoparticles suggested the presence of crystalline nanoparticles • • EDP was too weak due to the small crystallite sizes and the EDP was too weak due to the small crystallite sizes and the presence of an amorphous matrix and no conclusive finding on the structure could be drawn from it • C Crystalline nature of the particles was undoubtedly confirmed ll f h l d b dl f d with high-resolution images showing crystal-lattice • EDXS spectrum showed a very weak Al and Er peaks S spect u s o ed a e y ea a d pea s together with the peaks of other elements, present in the matrix (Si, O) and in the supporting foil (Ni, Cu, C). It has to be noted that Er peaks overlap with the Co peaks. Since the sample noted that Er peaks overlap with the Co peaks. Since the sample contamination with the Co source cannot be entirely excluded the presence of Er in the P0350 sample can only be assumed from the initial composition

  17. Results Refractive index profile of P0433 preform doped in cladding by ferrite nanoparticles, core doped by GeO2

  18. Results Figures show photo of P0433 Fe/Co- ferrite doped preform sample surface at two different Fi h h t f P0433 F /C f it d d f l f t t diff t magnifications, nanoparticle-doped region on the left, and undoped region on the right

  19. Conclusions • It was demonstrated that fully vitrified, transparent, nanoparticle- f f doped preforms without inclusions or bubbles can be fabricated using flash vaporization process and device. Preforms were f b i fabricated in-situ and in relatively short time, handling of t d i d i l ti l h t ti h dli f it nanoparticles’ and other precursors is straightforward and simple • Metal nanoparticles oxidize at high temperature in the presence of oxygen. This can be prevented by providing reducing or inert environment or they have to be replaced by precious metals. • Nanoparticle suspensions need to be prepared properly, otherwise particles may agglomerate. Nanoparticles density in deposited layer p y gg p y p y needs to be increased significantly to achieve the desired level, by increasing their content in the suspension • Recent results using alternative approaches in preparation of nanoparticle suspensions and use of aerosol are promising and further results shall be presented in specialty fiber conferences further results shall be presented in specialty fiber conferences

  20. Affiliations & Acknowledgements • The authors would like to acknowledge support from Center of Excellence CO->EnFist and Slovenia Research Agency • Partial support by Manunet project „FOMS“ is also acknowledged. • Special thanks for to Dr. Darja Lisjak for nanoparticle synthesis and suspension preparation, as well as SEM and TEM analysis TEM analysis • Thanks also to Dr. Andreja Jelen of Jožef Stefan Institute in Ljubljana for additional SEM and TEM analysis

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