BEL AIR MASS Nic Allen FINISHING MQP Jeff Laun OBJECTIVE Study - - PowerPoint PPT Presentation

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Jan 29, 2023 371 likes •597 views

BEL AIR MASS Nic Allen FINISHING MQP Jeff Laun OBJECTIVE Study surfaces produced by mass finishing Understand the basic mechanisms we have determined the normal forces between a surface and a sample mass finishing media Study how

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Nic Allen Jeff Laun

BEL AIR MASS FINISHING MQP

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 Study surfaces produced by mass finishing  Understand the basic mechanisms we have determined the normal forces between a surface and a sample mass finishing media  Study how the surface produced by mass finishing effects the shininess of the surface.

OBJECTIVE

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BEL AIR FMSL 22

CENTRIFUGAL DISC FINISHER

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 Al 6061-T6  Polished Al Surfaces to a mirror.  Obtained a Vickers Hardness value of the surface  Mass Finished with abrasive media for 30 s.  Measured the depths of the scratches  Calculated the normal force

EXPERIMENT, SCRATCH DEBTHS

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POLISHED SURFACE (100X)

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EXAMPLE SCRATCH (50X)

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EQUATION USED FOR FORCE CALC

HV= Vickers Hardness F= Force (Newtons) A= Area

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Pa Parameter Mean Value Standard dard Deviation

Scratch Depth 0.399 µm 0.180 µm Scratch Width 5.396 µm 1.337 µm Scratch Cross- Sectional Area 2.204 µm2 0.790 µm2 Vickers Hardness 124.0 HV10g 6.555 HV10g Normal Force 19.09 mN

RESULTS

Normal Force = 0.07 ounces

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OLYMPUS USPM-RU III

MICRO SPECTROPHOTOMETER

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 Turned Al 6061-T6 @ 0.05mm/rev @ 2000 rpm (~3.94 in/min)  Took measurements of surface on confocal microscope  Mass Finished for 30s, 1 min, 4min, 10 min, 30 min, & 60 min taking measurements of the surface at each time interval  Also, measurements were taken with the spectrophotometer

EXPERIMENT, REFLECTIVITY

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IMAGES OF SURFACES (20X)

Initial 30s 1 min 4 min 10 min 1 hr.

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SPECTROPHOTOMETER RESULTS (INITIAL)

10 20 30 40 50 60 350 400 450 500 550 600 650 700 750 800 Reflectivity vity, , % Wavelengt ngth, h, nm

Percentage rcentage of LIg Ight t Ret eturned rned vs. Wave velengt ength

Series1

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SPECTROPHOTOMETER RESULTS (1 HR)

5 10 15 20 25 350 400 450 500 550 600 650 700 750 800 Percent ntage age of Lgith Retur urne ned Wavelengt ngth, h, nm

Percentage rcentage of Lig ight t Ret eturned urned vs. Wave vele length ngth

Series1

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ROUGHNESS VS. TIME

0.1 0.2 0.3 0.4 0.5 0.6 10 20 30 40 50 60 70 Ra, µm2 Time, , min

Roughn hness ess vs. Tim ime e in in Fin inis isher her

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RELATIVE AREA VS. SCALE FOR ALL TIMES 100X OBJECTIVE

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REFLECTIVITY VS. TIME

15 20 25 30 35 40 10 20 30 40 50 60 Reflectivity vity, , % Time, , min

Reflect flectivi vity ty (405 nm) vs. Tim ime

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RELATIVE AREA VS. REFLECTIVITY

y = -384.51x + 418.83 R² = 0.8701 5 10 15 20 25 30 35 40 0.995 1 1.005 1.01 1.015 1.02 1.025 1.03 1.035 1.04 Reflectivity vity, , % Relative ve Area, a, µm2

Rela lative e Area a (2 µm2) vs. Reflectivity (405 nm)

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CORRELATION OF REFLECTIVITY AND AREA SCALE (380NM)

0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 0.001 0.01 0.1 1 10 100 1000 10000 R2 Scale, , µm2

Reflectivity - 380 nm vs. Relative Area

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CORRELATION OF REFLECTIVITY AND AREA SCALE (405 NM)

0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 0.001 0.01 0.1 1 10 100 1000 10000 R2 Scale, µm2

Reflectivity - 405 nm vs. Relative Area

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CORRELATION OF REFLECTIVITY AND AREA SCALE (515 NM)

0.00 0.10 0.20 0.30 0.40 0.50 0.60 0.70 0.80 0.90 1.00 0.001 0.1 10 1000 R2 R2 Scale, e, µm2

Reflect flectivity ivity - 515 5 nm nm vs. Relativ tive e Area

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3D GRAPH OF AREA SCALE, WAVELENGTH, AND CORRELATION

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 Best correlations found at 405 nm and a scale of ~2μm2  This Wavelength of light is the same used in the confocal microscope’s laser

▪ Unsure of significance of this finding

 Correlations drop off significantly after ~450 nm and again at ~600 nm