ADC for operation in LAr TPC Name: Yuan Mei Brookhaven National - - PowerPoint PPT Presentation

Name: Yuan Mei Brookhaven National Laboratory Instrumentation Division ULITIMA 2018

A Calibration concept for SAR ADC for operation in LAr TPC

9/11/2018

Yuan Mei

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yuanmei@bnl.gov

Motivation

▪Design a 12-bit ADC running 2MS/s for DUNE ▪Risk mitigation for cold temperature @77K ▪Errors from analog circuits should be overcome with digital calibration, transferring complexity from analog to digital domain

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SAR ADC Architecture

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DAC

SAR Logic Vin Digital Outputs Comparator

• Bottom plate sampling method with synchronous timing
• 12-bit resolution with 14 conversion-cycle (2-bit redundancy)
• Digital foreground calibration implemented

Static Error sources

• Conversion accuracy is subject to the non-idealities of analog

components, the main error source are DAC mismatch and comparator offset errors.

• SAR only has one comparator, offset won’t affect linearity.
• Bottom-plate sampling is performed, thus injected charge to the top-

plate is independent of input signal and contribute a fixed offset

• Auto-zeroing and chopper techniques are often used to eliminate

comparator offset

• Capacitor mismatch is fatal to ADC performance if not solved

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Capacitor mismatch issues

• 12-bit matching is needed in the capacitor array
• Random mismatch: Gaussian distribution
• Gradient mismatch: Location-dependent
• Routing mismatch: Layout dependent
• Unit-cap and common-centroid layout can fix gradient mismatch and

routing mismatch

• Random mismatch can be solved by using larger unit-capacitor [1] or

using calibration method

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Capacitor mismatch in DAC

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DAC mismatch limit ADC performance and calibration would improve ADC!

Id Idea of f Digital Calibration

• Post-processing of codes
• Relies on digital signal processing
• No feedback to ADC and thus no stability issue
• Doesn’t required complex analog circuit
• Digital circuits scale in advanced process

Correlation-based calibration is selected for this prototype

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Correlation-based Calibration

• Inject a small amount of analog signal that is uncorrelated with the

input signal. Since it passes through the same path as DAC signal, it encounter same non-idealities and hence can detect the mismatch error

• Using a statistical correlator (histogram method) or the least mean

square (LMS) algorithm, the inject signal can be “correlated out” in the digital back-end and capacitor mismatch error are estimated in the process [2]

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Im Implementation of f Algorithm

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• Each sampled analog signal will be digitized twice
• Decimal output codes d1 and d2 will create a error function
• Error function will provide information to infer the

unknown weighting vector W

• Adaptive learning algorithm (LMS) to update weight

coefficient in DAC in which error is gradually forced to zero

• Learning procedure converges, the mean of d1 and d2 will

yield the correct digital output codes

• Fig. Block diagram of the perturbation based

digital calibration for SAR ADC [3]

SAR CORE

Encode 1 Encode 2

e[n] LMS d a a 2 D1 D2 d2 d1

dout

Vin W1 W2

Calibration engine LMS : Wk [N+1] = Wk[n] - µ*e[n]*dk[n] e [N] = d1[n] - d2[n] -2 d

Capacitor ratio with redundancy

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Calibration circuit

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Advantage

• Calibration circuit can be utilized in DAC
• Calibration circuit is stable at cold
• Calibration control is simple

Disadvantage

• Decrease input dynamic range

Notes : Single-ended for simplicity Implemented in differential

Vinput Bootstrap_Switch Transmission-Gate Switch Vref_pos Transmission-Gate Switch Vref_neg 1920 1024 544 288 144 80 40 24 12 8 6 2 2 1 10 MSB LSB Calibration Cap VCM Controlled by SAR Logic VCM Calibration Circuit

Timing Diagram

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40 Cycles Reset Sample Output1 D14 D13 D12 D2 D1 Clk Output2 D14b D2b D1b Input regeneration

• One complete conversion consist of a 5 clock-cycle sampling phase and two 14 clock-cycle conversion phases;
• Besides, 1 clock-cycle is reserve for reset and 6 clock-cycle is for input regeneration.

Timing diagram of the proposed calibration method

Simulations with digital calibration

• Simulations are done in Cadence @ 77K temperature
• All blocks are implemented and simulated in transistor level
• Unit capacitor is MIM cap provided by foundry (about 10 fF)
• DAC mismatch errors are the major error source

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Capacitor mismatch calibration verification

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• Set random mismatch on capacitor weights
• Simulate to see if calibration can find the optimal weight

and improve the performance

• Other mismatch is excluded from this verfication

Capacitor mismatch calibration

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Simulated with 2^14 (16,384) samples, weights are converged around 10,000 samples X-axis: # of samples Y-axis: Capacitor weight

Capacitor mismatch calibration

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Simulated with 2^14 (16,384) samples, weights are converged around 10,000 samples X-axis: # of samples Y-axis: Capacitor weight

Capacitor mismatch calibration

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With calibration, all the weights in the DAC are updated X-axis: # of samples Y-axis: Capacitor weight

Dynamic test

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FFT points:2^14 Without Calibration ENOB = 8.3 bits With Calibration ENOB= 11.2 bits

• ENOB is improved
• Dynamic range also improved

Dynamic test

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FFT points:2^17 Without Calibration ENOB = 8.3 bits With Calibration ENOB= 11.9 bits

• ENOB is further improved from 11.2bits to 11.9bits
• Dynamic range also improved from 69.1 dB to 73.6dB

With more samples :

Static test

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Without Calibration Without Calibration

• Linearity is improved with the digital calibration

Sample points:2^14 A lot missing codes! NO missing code!

Static test

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With samples 131,072 (2^17)

• Linearity is further improved with more samples

With samples 16,384 (2^14)

Floorplan

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N-DAC P-DAC

Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy Dummy N-DAC DC Switches P-DAC DC Switches

VCM Switch VCM Switch Vin+ Bootstrap Switch Vin- Bootstrap Switch

Comparator

Pre amp Pre amp Nomal Mode SAR Logic Calibration Mode SAR Logic Clock Generator Data Formatter +LVDS I/O

Digital Domain Analog Domain

Floorplan of SAR ADC prototype

Die Photo

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Die photo of SAR ADC prototype

Measurement

• Chip came back in Mid-July and measurement will be done in October

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Power consumption @77K(Simulation by PEX)

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Block Name Power consumption 2MS/s Digital 240 µw Analog 280 µW Total 520 µW

Acknowledgement

• My colleagues : Gabriella Carini, Huchen Chen, Mietek Dabrowski,

Shaorui Li , and Emerson Vernon

• Fermi lab collaborators and their cold model for TSMC 65nm at 77K
• DUNE and DoE for support of this work

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Reference

[1] Yi-long Yu, ADI talk, A 12 bit 100MS/s two step hybrid ADC in 40nm CMOS with statistical calibration [2] Ahmed M. A. Ali. 2016. High Speed Data Converters. Institution of Engineering and Technology. [3] W. Liu, P. Huang and Y. Chiu, "A 12-bit, 45-MS/s, 3-mW Redundant Successive-Approximation-Register Analog-to-Digital Converter With Digital Calibration," in IEEE J. of Solid-State Circuits, vol. 46, no. 11, pp. 2661-2672, Nov. 2011.

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Q & A Thank you for your attention.

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Backup slides

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Wi represents the respective bit weight. µi is the step size of the update equation and is scaled according to the bit. e[N] is the total error of the Nth step. dN are the raw ADC output; Δd are digitized offset of the inserting analog offset Δa

LMS : Wk [N+1] = Wk[n] - µ*e[n]*dk[n] e [N] = d1[n] - d2[n] -2 d

Convergence of f Error

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