Source Artefact Classification in Interferometric Images using - - PowerPoint PPT Presentation

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Source Artefact Classification in Interferometric Images using - - PowerPoint PPT Presentation

Source Artefact Classification in Interferometric Images using Machine Learning Arun Aniyan SKA SA & Rhodes University Cape Town , South Africa Motivation The field around 3C147, at 5 million dynamic range using 21cm JVLA data. Smirnov


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Source Artefact Classification in Interferometric Images using Machine Learning

Arun Aniyan

SKA SA & Rhodes University Cape Town , South Africa

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Motivation

The field around 3C147, at 5 million dynamic range using 21cm JVLA data.

Smirnov et. al 2015

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Motivation

  • 1. Improving reliability of source

finders and thus creating better source catalogues. 


  • 2. Reducing the steps in the reduction
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Objective

Distinguishing real sources from artefacts in radio interferometric images in order to make reliable sources catalogs

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Dataset Generation

Simulation pipeline with Meqtrees Noordam & Smirnov , 2010 http://meqtrees.net/

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Dataset Generation

Generate sources in random positions Induce DDE + pointing errors

Generate Images for “n” hours of observations

Extract sources with PyBDSM

Cross match with known sky model & PyBDSM model

Extract PyBDSM + generated features

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Dataset Generation

Generated simulated skies for the JVLA in C-configuration using L-band Generated Images for observational periods from 1 hr to 25 hrs Ran PyBDSM to get catalogues of sources and artefacts with their features.

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Feature Extraction

  • 1. Flux features


Total flux, Peak flux

  • 2. Axis-Angle features


FWHM of deconvolved major axis etc

  • 3. Nearest bright source features


Distance to nearest bright source

Total 28 features

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Results

Classifier Accuracy Recall Decision Tree

88.67 92.05

KNN

95.92 99.94

Random Forest

95.22 99.18

Naive Bayes

82.04 84.75

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Feature Analysis

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Feature Analysis

Features rich in discriminatory power

  • 1. Nearest bright source features

2 . Flux features
 


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Conclusion and Future Direction

High accuracy Classification of Sources and Artefacts Identification of useful features for classification Development of Convolution Neural Network

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arun@ska.ac.za

Thank You !