SAMPA linearity test results SAMPAmeeting 11.03.2015 Sohail Musa - - PowerPoint PPT Presentation

sampa linearity test results
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SAMPA linearity test results SAMPAmeeting 11.03.2015 Sohail Musa - - PowerPoint PPT Presentation

SAMPA linearity test results SAMPAmeeting 11.03.2015 Sohail Musa Mahmood on behalf of SAMPA team and Norwegian group Gain and Peaking time Setup configuration Connecting a small capacitance in series with the input cable. Applying an


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Sohail Musa Mahmood

  • n behalf of SAMPA team and Norwegian group

SAMPA linearity test results

SAMPAmeeting 11.03.2015

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Gain and Peaking time

Setup configuration

  • Connecting a small capacitance in series

with the input cable.

  • Applying an input signal (square wave, ramp

up/down, exponential rise/fall ).

  • Connecting the input signal directly to the

detector pads.

  • Setting the configuration of the analog chip.
  • Observe the differential output at the

corresponding channel.

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Setup configuration

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Gain Results

26.80 27.00 27.20 27.40 27.60 27.80 28.00 28.20 28.40 28.60 28.80 29.00 29.20 29.40 29.60 29.80 30.00 30.20 30.40 30.60 30.80 31.00 31.20

30mV/fC@160ns + 30mV/fC@160ns - 30mV/fC@80ns + 30mV/fC@80ns -

30mV/fC

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Gain Results

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30mV/fC@160 ns - Linearity

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20mV/fC@160 ns - Linearity

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30mV/fC@160 ns (pos) – Linearity – all channels

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30mV/fC@160 ns (pos) – Linearity – mean value

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30mV/fC@160 ns (pos)- Linearity INL

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30mV/fC@160 ns (neg) – Linearity All channels

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30mV/fC@160 ns – Linearity INL – ALL CHANNELS

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30mV/fC@160 ns (neg) – Linearity MEAN

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30mV/fC@160 ns (neg) – Linearity MEAN - INL

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20mV/fC@160 ns (pos) – Linearity ALL channels

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20mV/fC@160 ns (pos) – Linearity MEAN

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20mV/fC@160 ns (pos) – Linearity MEAN - INL

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20mV/fC@160 ns (neg) – Linearity ALL channels

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20mV/fC@160 ns (neg) – Linearity MEAN

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20mV/fC@160 ns (neg) – Linearity MEAN - INL

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Conclusion

  • Linearity seems to be good.
  • Some issues with the desired gain.
  • More oscillations on channel 1 than other
  • channels. (tested 2 chips)
  • Some more linearity results for the chip 3

analog part (only for positive configurations)

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On going work and future plans

  • Analysing the results for statistical linearity

measurements.

  • Preparing the setup for first irradition tests of

SAMPA MPW1.

  • Single-Event Latchup tests on all 3 chips and

Single Event Upset tests on shift registers (chip 3).

  • Planning to perform the first irradiation tests

in the end of april in Uppsala (together with RCU2 testing).

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SLIDE 23

Thank you for your attention. Any questions ?