OECD Patent Statistics Mosahid KHAN Economic Analysis and - - PDF document

oecd patent statistics
SMART_READER_LITE
LIVE PREVIEW

OECD Patent Statistics Mosahid KHAN Economic Analysis and - - PDF document

OECD Patent Statistics Mosahid KHAN Economic Analysis and Statistics Division Directorate for Science, Technology and Industry, OECD WIPO OECD WORKSHOP ON STATISTICS IN THE PATENT FIELD Geneva, September 18 and 19, 2003 1 IPR related


slide-1
SLIDE 1

1

1

WIPO – OECD WORKSHOP ON STATISTICS IN THE PATENT FIELD

Geneva, September 18 and 19, 2003

OECD Patent Statistics

Mosahid KHAN

Economic Analysis and Statistics Division Directorate for Science, Technology and Industry, OECD

2

…IPR related issues attracting great deal of interest & surge in world-wide patent activities

20 000 40 000 60 000 80 000 100 000 120 000 1985 1987 1989 1991 1993 1995 1997 1999 Other European Union Japan United States 50 000 100 000 150 000 200 000 1985 1987 1989 1991 1993 1995 1997 1999

EPO patent applications USPTO patent grants

slide-2
SLIDE 2

2

3

Data availability and limitations

Data sources

Primary Source

– National and regional patent office – International organisation

Secondary Source

– Commercial data provider – National and international public institutes

Limitations

Difficult to access standardised data for statistical purpose Limited metadata / methodological weakness 4

Patent statistics activities at the OECD

Complementary to existing efforts International statistical infrastructure Taskforce - EPO, JPO, USPTO, WIPO, EC, NSF &

OECD

Database

– EPO, USPTO, Patent families – National offices (e.g. JPO), citations, PCT (on going work) – Firm level data (on going)

Methodology

– Counting procedure, families, technology, industry, citations, firm level data

slide-3
SLIDE 3

3

5

Understanding patent indicators

Wide-ranging indicators: conflicting / misleading

messages

Understanding patent indicators and what they reflect

– Designing indicators to measure a particular phenomena

Methodological choice for calculating indicators

– Geographical distribution – Reference date – Multiple inventors

6

30000 60000 90000 120000 150000 180000 1980 1983 1986 1989 1992 1995 1998 2001 Application Priority Grant

USPTO patent grants

30000 60000 90000 120000 1980 1983 1986 1989 1992 1995 1998 2001 Application Priority Grant

EPO patent applications

Impact of methodological choice: reference date

slide-4
SLIDE 4

4

7

Impact of methodological choice: reference country

10 20 30 40 50 European Union United States Germany Japan 10 20 30 40 50 Applicant Inventor Priority 2 4 6 8

France United Kingdom Italy Netherlands Switzerland Israel 2 4 6 8 Applicant Inventor Priority

Country shares in EPO applications, 1998

8

OECD patent indicators

Focus on inventive performance, diffusion, etc. Priority date / inventor country Priority date => time lag International comparison (e.g. families) …but indicators based on other criteria are available

slide-5
SLIDE 5

5

9

Triadic patent families

8.3 7.0 10.9 17.4 26.6 20.6 27.8 34.0 52.6 46.5 32.4 15.9 20 40 60 80 100 EPO Triadic Patent Families USPTO % European Union United States Japan Other countries

Patent applications to the EPO / Patent grants at the USPTO Triadic Patent Families OECD country shares, priority in 1999

10

Technology areas

Israel

1.2%

Australia

1.3%

Korea

0.9%

Other countries

2.5%

Canada

2.9%

Switzerland

1.6%

Other European countries

4.4%

Denmark

1.6%

Netherlands

2.4%

France

5.1%

Belgium

2.3%

United Kingdom

7.4%

Germany

11.0%

Japan

10.1%

United States

45.3%

Other countries

10.4%

European Union

34.1%

Share of countries in Biotechnology patents - EPO, 1999

slide-6
SLIDE 6

6

11

Dissemination

Improve accessibility of data / metadata Current OECD practice

– Various OECD publications (e.g. Compendium) – CD-ROM for the TF members, test users, on request

Online access

– www.oecd.org/sti/measuring-scitech – EPO / USPTO / Triadic patent families – Covers more than 100 countries – Reference date (application / priority / grant) – Reference country (inventor / applicant) – IPC / US patent class – International co-operation

12

Future plan

National patent office data PCT database Firm level data Citations Further methodological work Improve dissemination of data