34th IGC presentation 2958
measurements of Sr and Nd at the nanogram level using the Phoenix - - PowerPoint PPT Presentation
measurements of Sr and Nd at the nanogram level using the Phoenix - - PowerPoint PPT Presentation
High precision isotope ratio measurements of Sr and Nd at the nanogram level using the Phoenix TIMS with next generation Faraday detectors Zenon Palacz Isotopx Limited 34th IGC presentation 2958 34th IGC presentation 2958 What are the
34th IGC presentation 2958
34th IGC presentation 2958
What are the parameters required for high precision measurements of small samples? (on Faraday collectors)
- High Sensitivity
– Instrument sensitivity – Use of activators
- Low noise
– Close to theoretical Johnson noise – Baseline stability
- Gain stability between detectors
– Required for static analyses
- Multidynamic measurements
– Eliminates gain and efficiencies – But can it be used on small samples?
34th IGC presentation 2958
How quiet are Xact amplifier/resistor boards
5 10 15 20 25 30 35 40 45 50 10 20 30 40 50 60 70 80 90 100 Integration time SECONDS
mV
Faraday Noise each point average of 9 channels Theoretical Measured
34th IGC presentation 2958
How quiet are Xact amplifier/resistor boards
5 10 15 20 25 30 35 40 45 50 5 10 15 20 Integration time SECONDS
mV
Faraday Noise each point average of 9 channels Theoretical Measured
34th IGC presentation 2958
Noise comparison between 1e11 and 1T resistors
Noise comparison between 1T and 1e11 ohm resistors 2.0E-17 6.0E-17 1.0E-16 1.4E-16 1.8E-16 2.2E-16 2.6E-16 3.0E-16 50 100 150 200 250 300 350 Integration time (seconds) Noise (amps) 1T 1e11 ohm
Noise (Amps)
Integration time (seconds) 1e12 ohm n=5 1e11 ohm n=4 1e11/1e12
1 2.3E-16 3.8E-16 1.7 5 1.0E-16 1.7E-16 1.6 10 6.5E-17 1.2E-16 1.8 20 5.1E-17 7.3E-17 1.4 40 3.6E-17 6.3E-17 1.7 60 3.6E-17 5.1E-17 1.4 300 3.5E-17 4.9E-17 1.4
34th IGC presentation 2958
How fast are Xact resistors (1e11 ohm)?
- 10.00
- 5.00
0.00 5.00 10.00 15.00 20.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 Seconds PPM of intensity
Baseline in <1 second Old specification
34th IGC presentation 2958
1T baseline in 4 seconds
1T signal response
- 10
- 5
5 10 15 20
0.0 2.0 4.0 6.0 8.0 10.0 12.0 Seconds PPM of signal 5ppm of signal in 3 seconds
34th IGC presentation 2958
Gain stability 5ppm over 1 month No drift.
CCGains H2 relative to Axial over 1 month
y = 6E-08x + 0.9977 0.99771 0.99772 0.99773 0.99774 0.99775
10 20 30 40 50 60 70 80 Measurement Gain relative to axial collector
0.997732+/-0.000005 5ppm 1RSD
34th IGC presentation 2958
Day averages
Reduced scatter shows subtle coherent trends. Measured on factory floor with no environmental temperature control
Gain Day averages
- 15
- 10
- 5
5 10 15
- 5
10 15 20 25 30 Days Gain Drift (PPM) Series1 Series2 Series3 Series4 Series5 Series6 Series7 Series8
34th IGC presentation 2958
Sr dynamic precision 3ppm reproducibility (5volt ion beam)
200ng NBS987 Dynamic
0.710230 0.710235 0.710240 0.710245 0.710250 0.710255 0.710260 2 4 6 8 10 12 14 16 18 20 22
Filament
87Sr/86Sr
0.7102444+/-0.0000021, 3ppm 1RSD
1RSD 200ng NBS 987
34th IGC presentation 2958
Static precision 5ppm no gain corrections between analyses (5 volt ion beam)
200ng NBS 987 STATIC
0.710240 0.710245 0.710250 0.710255 0.710260 0.710265 0.710270 0.710275 0.710280 5 10 15 20 25 Filament
87Sr/86Sr
0.7102577+/- 0.0000035, 5ppm 1RSD
34th IGC presentation 2958
How small a sample of Nd can be measured on Faradays
- Nd+ ion atom efficiency is about 2.5% (triple
filament)
- NdO+ is higher than this.
34th IGC presentation 2958
How small an ion beam can we measure with good precision and accuracy? 50mv on 1e11, 10mv on 1T
142Nd
(amps)
142Nd
(mv)
143Nd/144Nd
%1se
145Nd/144Nd
%1se
142Nd/144Nd
%1se 7.1E-12 706 0.512095 0.0003 0.348402 0.0003 1.141827 0.0005 4.9E-12 485 0.512096 0.0004 0.348395 0.0004 1.141819 0.0006 3.0E-12 296 0.512082 0.0008 0.348399 0.0008 1.141837 0.0012 1.1E-12 105 0.512113 0.0016 0.348371 0.0020 1.141793 0.0019 4.9E-13 49 0.512057 0.0028 0.348383 0.0030 1.141822 0.0042 1.1E-13 11 0.512261 0.0106 0.348341 0.0135 1.143178 0.0139 4.9E-14 5 0.511754 0.0191 0.348499 0.0340 1.142667 0.0265 3.6E-14 4 0.512215 0.0257 0.348698 0.0274 1.142779 0.0221
142Nd
(amps)
142Nd
(mv)
143Nd/144Nd
%1se
145Nd/144Nd
%1se
142Nd/144Nd
%1se 6.88E-12 688 0.512121 0.0003 0.348419 0.0003 1.141855 0.0005 4.98E-12 498 0.512127 0.0003 0.348421 0.0003 1.141861 0.0005 2.94E-12 294 0.512117 0.0006 0.348415 0.0006 1.141837 0.0007 9.67E-13 97 0.512169 0.0010 0.348432 0.0017 1.141870 0.0013 5.16E-13 52 0.512116 0.0023 0.348425 0.0022 1.141833 0.0018 1.26E-13 13 0.512106 0.0042 0.348400 0.0050 1.141863 0.0045 4.83E-14 5 0.512418 0.0083 0.348734 0.0123 1.141554 0.0105 1E+11 1T
34th IGC presentation 2958
Errors expand below 1e-13A
0.51140 0.51160 0.51180 0.51200 0.51220 0.51240 0.51260 0.51280 1.0E-14 1.0E-13 1.0E-12 1.0E-11 142Nd intensity (amps) 143Nd/144Nd 1.00E+11 1T
34th IGC presentation 2958
10.5% ion/atom efficiency <20ppm reproducibility 300mv 142Nd16O
142Nd/144Nd
%1se
143Nd/144Nd
%1se
145Nd/144Nd
%1se
148Nd/144Nd
%1se
142Nd16O
amps Minutes ion/atom efficiency 1 1.141818 0.0008 0.512085 0.0006 0.348413 0.0006 0.241589 0.0012 3.3E-12 152 9.0% 2 1.141821 0.0008 0.512099 0.0008 0.348420 0.0009 0.241589 0.0015 2.9E-12 187 9.5% 3 1.141816 0.0007 0.512103 0.0007 0.348419 0.0007 0.241594 0.0010 3.1E-12 206 11.4% 4 1.141764 0.0010 0.512085 0.0007 0.348409 0.0006 0.241603 0.0013 3.1E-12 207 11.5% 5 1.141838 0.0010 0.512080 0.0007 0.348406 0.0006 0.241590 0.0015 3.1E-12 229 12.6% 6 1.141776 0.0010 0.512093 0.0007 0.348428 0.0006 0.241598 0.0015 3.1E-12 206 11.5% 7 1.141789 0.0009 0.512091 0.0007 0.348423 0.0006 0.241597 0.0014 3.2E-12 206 11.5% 8 1.141773 0.0011 0.512078 0.0007 0.348412 0.0007 0.241607 0.0016 3.1E-12 187 10.1% 9 1.141818 0.0009 0.512097 0.0007 0.348419 0.0006 0.241593 0.0013 3.2E-12 206 11.6% 10 1.141762 0.0014 0.512084 0.0009 0.348417 0.0008 0.241587 0.0014 3.2E-12 103 5.8% 11 1.141838 0.0007 0.512109 0.0006 0.348410 0.0006 0.241598 0.0011 3.0E-12 204 11.0% Mean 1.141801 0.0009 0.512091 0.0007 0.348416 0.0007 0.241595 0.0013 3.1E-12 190 10.5% 1SD 0.000029 0.0002 0.000010 0.0001 0.000006 0.0001 0.000006 0.0002 1.1E-13 35 2% 1RSD 0.0025% 0.0019% 0.0018% 0.0026%
2ng NdO 1T resistor data
34th IGC presentation 2958
2ng Nd measured as oxide at 300mv 142Nd16O
2ng NdO
0.51205 0.51206 0.51207 0.51208 0.51209 0.51210 0.51211 0.51212 5 10 15 20 25 Sample
143Nd/144Nd
1T 1e11 ohm Isotopx preferred value 0.512104 0.512076+/-0.000007 (14ppm 1RSD) 0.512091+/-0.000010 (19ppm 1RSD)
34th IGC presentation 2958
Total evaporation measurements
- Widely used in nuclear applications to overcome mass
fractionation by taking the average isotopic composition
- f the whole evaporation process.
- Baselines , peak centring and focussing at the start of
the measurement prior to filament current ramping
- All above must remain stable during the evaporation.
- Used for small Sr in this application
- Potential benefit for micro-drilled samples, ice cores?
34th IGC presentation 2958
Total Evaporation (summed isotope ratios)
TIME INTENSITY
88Sr 87Sr 86Sr
End of analysis Ionization profile Baseline Baselines must remain constant throughout analysis
34th IGC presentation 2958
50ng Sr ion beam profile 7v for nearly 2 hours Efficiency 3.5% (No focussing or peak centring)
50ng NBS987
0.0E+00 1.0E-11 2.0E-11 3.0E-11 4.0E-11 5.0E-11 6.0E-11 7.0E-11 8.0E-11 1000 2000 3000 4000 5000 SECONDS 88Sr (amps)
34th IGC presentation 2958
86Sr/88Sr (summed) 50ng NBS 987
86/88 summed
1.1880E-01 1.1900E-01 1.1920E-01 1.1940E-01 1.1960E-01 1.1980E-01 1.2000E-01 1.2020E-01 1.2040E-01 1000 2000 3000 4000 5000
34th IGC presentation 2958
87Sr/86Sr (summed)
87/86N SUMMED
7.1016E-01 7.1017E-01 7.1018E-01 7.1019E-01 7.1020E-01 7.1021E-01 7.1022E-01 7.1023E-01 7.1024E-01 7.1025E-01 7.1026E-01 1000 2000 3000 4000 5000
0.710243
34th IGC presentation 2958
1ng Sr 3volts 88Sr for 150 minutes Efficiency= 13%
Sr88 S1 int
0.00E+00 1.00E-11 2.00E-11 3.00E-11 4.00E-11 5.00E-11 6.00E-11 7.00E-11 8.00E-11
1 000 2000 3000 4000 5000 6000 7000 8000 9000
Seconds Intensity (amps)
34th IGC presentation 2958
Total evaporation measurements of NBS 987 <1ng
100pg 200pg 500pg 1ng 0.710244 0.710320 0.710249 0.710266 0.710255 0.710279 0.710263 0.710262 0.710285 0.710269 0.710265 0.710274 0.710242 0.710222 0.710264 0.710278 0.710256 0.710298 0.710273 0.710253 0.710320 0.710229 0.710253 0.710265 0.710299 0.710250 0.710249 0.710257 0.710229 0.710249 0.710273 0.710285 0.710272 0.710254 0.710303 0.710268 0.710258 mean 0.710272 0.710267 0.710261 0.710264 1SD 0.000031 0.000036 0.000010 0.000009 1RSD (PPM) 43 50 14 12 Total Evaporation NBS 987
34th IGC presentation 2958
Ion/Atom detection efficiency for Sr with TaCl activator on rhenium filament
0% 5% 10% 15% 20% 25% 30% 35% 1 10 100 Sr (ng) Ion/atom efficiency Max transmission due to z focussing
?
34th IGC presentation 2958
Conclusions
- Sub nanogram isotope ratio measurements of Sr can be easily
made using total evaporation analyses.
- NdO measurements at the nanogram level produce 20ppm
reproducible 143Nd/144Nd
- 1T resistors are 1.5 to 2 times less noisy than 1e11 depending on
integration time.
- 1e11 ohm and 1T ohm resistors produce analytically similar data
with ion beams >50mv.
- 1T resistors show analytical advantage below 10mv. No benefit to Sr
and Nd, Probable benefit for small sample Os, Pb and U isotopes.
- Static Isotope ratio reproducibilities of 5ppm are now possible with
new amplifier boards in a temperature controlled environment. (no need for dynamic amplifiers)
- Boards are upgradeable on Sector 54, IsoProbe-T and IsoProbe-P
instruments.
34th IGC presentation 2958