Measurement and Control for High-Speed Sub-Atomic Positioning in Scanning Probe Microscopes
Andrew J. Fleming and Kam K. Leang
Measurement and Control for High-Speed Sub-Atomic Positioning in - - PowerPoint PPT Presentation
Measurement and Control for High-Speed Sub-Atomic Positioning in Scanning Probe Microscopes Andrew J. Fleming and Kam K. Leang Outline Challenges and benefits of feedforward control System inversion Linear dynamics (creep and
Andrew J. Fleming and Kam K. Leang
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Piezoelectric actuators
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Nonlinear Linear
Short-range, low/high-speed Long-range, low-speed 7
Creep model Vibration model 8
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(Exact Inversion)
Find input subject to the cost:
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Range: 10 x 10 x 2 µm Resonances: 25 kHz (x), 6 kHz (y), >80 kHz (z) AFM imaging rate: >70 fps (100x100 pixels) w/o FF w/ FF w/FF
High-speed AFM imaging example
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Hysteresis curve:
Play operator Sum of basic relays 13
1 Hz 14
Loop due to phase shift 15
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Iteratively find the feedforward input
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1Arimoto et. al., 1983; 2Leang and Devasia, 2006
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* Wu et. al., 2007
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21 1 Hz scanning; 100 iterations
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