M ethodologies for Reducing ULP Device Power Consumption Dr. Ivan - - PowerPoint PPT Presentation

m ethodologies for reducing ulp device power consumption
SMART_READER_LITE
LIVE PREVIEW

M ethodologies for Reducing ULP Device Power Consumption Dr. Ivan - - PowerPoint PPT Presentation

M ethodologies for Reducing ULP Device Power Consumption Dr. Ivan OConnell, & Donnacha ORiordan, M icroelectronic Circuis Centre Ireland (M CCI), Tyndall Wednesday 30 th M ay 2018 Energy Harvesting Source: Lorandt Foelkel, Energy


slide-1
SLIDE 1

M ethodologies for Reducing ULP Device Power Consumption

  • Dr. Ivan O’Connell, & Donnacha O’Riordan,

M icroelectronic Circuis Centre Ireland (M CCI), Tyndall Wednesday 30th M ay 2018

slide-2
SLIDE 2

Energy Harvesting

Source: Lorandt Foelkel, “Energy Harvesting Seminar," Wurth Elektronik eiSos, 2013

slide-3
SLIDE 3
  • Address the “Energy Gap”
  • Designers always look for ways to reduce unwanted components of power

consumption – architecting the design in a fashion which includes low power techniques – adopting a process which can reduce the consumption

  • Always done at the expense of performance, reliability, chip area, or several of

these – one has to reach a compromise between power, performance, and cost

M otivation

slide-4
SLIDE 4
  • Battery Powered Systems – Phones

– M obile revolution has really driven need for low power design

  • High-Performance Systems – Server Farms

– Cost of removing the unused energy  Heat – Reliability

  • IoT

– Deploy and forget devices – Cost of transmitting data  move processing being done at the edge

Ultra Low Power Drivers

slide-5
SLIDE 5
  • Dynamic Power Consumption
  • Static Power Consumption
  • Process T

echnology

  • Architectural decisions

How to achieve this?

slide-6
SLIDE 6
  • Switching & short circuit power
  • Pdyn = aC

tot VDD 2 F

– C

tot = C load + C par

– VDD - Supply Voltage – F – clock Frequency

Dynamic Power Consumption

Ctot VDD In Out discharge Charge

slide-7
SLIDE 7

Voltage Scaling – Reducing the Supply Voltage

VDD VDD Logic High Logic Low

Limited by the ability to accurately differentiate between a 1 and 0

slide-8
SLIDE 8
  • Remove unnecessary switching activity
  • Only clock necessary blocks
  • Remove clock from other blocks

Clock Gating

slide-9
SLIDE 9
  • Clock frequency adjusted to meet requirements
  • Frequency islands

Frequency scaling

20M Hz 1M Hz 5M Hz Island Thresholds Island Thresholds Island Thresholds

slide-10
SLIDE 10
  • Synchronous
  • Clock Driven
  • Pdyn  activity independent
  • Asynchronous
  • Event Driven
  • Pdyn  activity dependent

Asynchronous logic

slide-11
SLIDE 11
  • The power a circuit consumes when it’s doing nothing!
  • Finite off Resistance
  • P = k VDD

– Voltage scaling – T

echnology

– Device Selection

  • High Vt Devices

Static – Leakage Power Reduction

Ctot In  1 Out  Roff VDD

slide-12
SLIDE 12
  • Remove the power to inactive blocks
  • Leakage Power  zero

Power Gating

CM OS Block

VDD

slide-13
SLIDE 13
  • Turning on and off sub-blocks to mininise the power consumption

Power Duty Cycling

T

slee p

Tturn-

  • n

T

  • n

Tturn-off Pon Pleakag

e

slide-14
SLIDE 14
  • t sleep – time the device spends in sleep mode
  • Tturn-on – time the device/ block takes to turn on
  • T
  • n – active time
  • Tturn-off – time it takes to turn the device/ block off
  • Objective

– Pavg = 2x Pleakage

  • e.g. Pon = 100X Pleakage
  • T

sleep = 100 X T

  • n

Power Duty Cycling

Limited by the Leakage Current

slide-15
SLIDE 15
  • Linear Region
  • Near Threshold
  • Sub Threshold

M OS Transistor Regions of operation

Linear Subthreshold Near Threshol d Source: www.design-reuse.com/news_img/20090316b_5.gif

slide-16
SLIDE 16

T echnology Scaling – M oore – M ore than M oore

slide-17
SLIDE 17

Technology Scaling – M oore – M ore than M oore

slide-18
SLIDE 18

Technology Scaling – M oore – M ore than M oore

slide-19
SLIDE 19
  • Process scaling will continue
  • Cost/ transistor no longer reducing
  • Energy density increasing
  • Leakage currents increasing
  • M ature process nodes here to stay

– Driven by reliability requirements – Cost

CM OS T echnology Scaling

Source: Z. Abbas, M. Oliveri “Impact of technology scaling

  • n leakage power in nano-scale bulk CMOS digital standard

cells” Microelectronics Journal

slide-20
SLIDE 20
  • Full precision is not always required!
  • Circuits / Systems are over designed
  • Driven by QoS

Adequate computing

slide-21
SLIDE 21

Source: EU Workshop ““Energy-Efficient Computing Systems, dynamic adaptation of Quality of Service and approximate computing”

slide-22
SLIDE 22

Some recent developments

slide-23
SLIDE 23

23

Conclusions

  • Significant progress in ULP design
  • Energy Gap is reducing
  • Most Power efficient block does not imply power

efficient system

  • Portfolio of tricks/techniques available
  • No silver bullet technique
slide-24
SLIDE 24

Thanks a lot for your time and attention! Any questions and/ or comments?

24

Q & A