JASCO Pr
- duc t Se minar
F e b 9th 2018, Kuala L umpur
IRT 5000/7000 Infrared Microscopes JASCO Pr oduc t Se minar e b 9 - - PowerPoint PPT Presentation
IRT 5000/7000 Infrared Microscopes JASCO Pr oduc t Se minar e b 9 th 2018, Kuala L F umpur Contents Basic of Infrared Microspectrometry Advantage of IRT-5000/7000 Competitive information Basic of Infrared Microspectrometry
JASCO Pr
F e b 9th 2018, Kuala L umpur
・Target – Micro object Sample size : micron order ・Mapping measurement for small area, or analysis of change state by heating/cooling. ・The result is local information of micron area. Spectrum may be changed when you change the measurement position. The material seems to be ununiform, several points should be measured
Transmission Refrection ATR Type of measurement Sample Minimun size Sample Thickness
RAS
Standard mid-band MCT detector Please note that these specification may be changed according to sample !
FT/IR main unit Light source, Interferometer IR microscope (IRT-5000 series) Microscope optica system, Detector Control PC
Microscope measurement Standard model Wide area mapping measurement Wide area, high-speed mapping Wide area, high-speed, high resolution mapping IRT-5100 IRT-5200 IRT-7100 IRT-7200 Primary use 10μm2 1 Point Measurement OK OK OK OK Identification of foreign material IQ Mapping (320x320μm) × OK OK OK Mapping of foreign material and it’s peripheral, Separation of foreign material compound Wide Area Mapping (10x7.5cm) × OK OK OK Component distribution analysis High-speed Mapping (10data/sec) × × OK OK Scanning of whole sample Change of sample state High-speed, High resolution Mapping (160data/sec) × × × OK Scanning of microscopic material Time course mapping analysis
IRT-5100 IRT-5200 IRT-7100 IRT-7200
Select instrument Depending on the purpose
Transmission Reflection ATR RAS
Example of ATR cassegrain installation (Slide-in)
Auto focusing by IR light at measuement ! This is necessary for IR microscope !
Observation (Visible light focusing) Measurement (IR light focusing) Visible light IR light Sample
Detector can be select as measurement purpose from 10 detectors. 2 detectors can be mounted on IR microscope, and one of them can be exchanged in a single operation.
Linear array midband MCT(7000-650)(1 x 16Element) Linear array midband MCT(7000-650)(2 x 16Element) Linear array InSbDetector(10000-1900) Linear array InGaAsDetector(10000-5000) Mid-band MCTDetector(7800-600) Narrow-band MCTDetector(7800-750) Wide-band MCTDetector(7800-450) DLATGSDetector(7800-400) InSbDetector(15000-1850) InGaAsDetector(12000-4000)
Fig.1 New DLATGS and MCT, polystyrene film measurement
Measurement conditions FT/IR-6600 + IRT-5200 Aperture : 50 x 50um Accumulation : New DLATGS : x100 MCT : x50 Transmission method Accumulation number for DLATGS is twice as MCT, DLATGS have an ability to measure small area as 50x50um.
1 point
Area
Specular reflectance Transmittance-reflectance Diffuse reflectance
Observation image 1649cm-1 Peak height
1.2 0.5 1 4000 750 1000 2000 3000 Abs Wavenumber [cm-1]Mapping analysis
1 point
Area
Specular reflectance Transmittance-reflectance Diffuse reflectance
Manual stage Auto stage
Mapping analysis Other manufacturer still classify analysis method as this category
Transmittance mapping by auto stage
1 point
Area
Specular reflectance Transmittance-reflectance Diffuse reflectance
Manual stage Auto stage
IQ mapping can cover all of the measurement method. Only Jasco can do this !
Advantage of mapping measurement A B C
A B C 1 point measurement by IR microscope
(macro) ATR measurement Mapping measurement by small aperture size Macro measurement (ATR) or 1 point measurement by IR microscope Mapping measurement by IR microscope A B C
Aperture (measurement unit) Aperture (measurement unit)
1 0.5 4000 650 2000 1000 Abs Wavenumber [cm‐1] 100 μm
Multi layer sample (white frame : measurement unit)
100 μm 100 μm
Multi layer sample (each white frame : measurement unit) Mapping Image
4000 650 2000 1000 Abs Wavenumber [cm‐1]
PVC + Protein PVC Polyester
0.5
Maximum mapping area, um
Problem 1 : Can not observe the sample surface
Nothing can be
Observation Image
Can not perceive even if the measurement point is wrong !
Sample surface can not be
contacted on it. Therefore, we don’t know precise measurement position by ATR. In particular, hard target sample
foreign material on the gel sample) will be slipped when the prism contact on it, as a result it is difficult to measure it.
Problem 2 : measurement point is limited Only the center position of the prism can be measured.
Contamination
If you want to measure other place of the sample, once prism need to be detached from sample, move the sample position and contact the prism again. In this way, mapping data
foreign material can not be measured.
Observe and ATR measurement during contact
be done only by Clear View ATR
prism under the condition of contacting the prism onto sample.
measure desired position by ATR while
IRT-5000+FT/IR-4100
Survey position : Observe and reflectance measurement ATR positon
Before contact the prism (Survey position) After contact the prism (ATR position) Observation image by Clear View ATR before contact the prism (observation by cassegrain mirror) and after contact the prism onto sample. Contact surface is clearly seen.
By combination of Clear View ATR and IQ monitor / IQ mapping, desired position can be freely measured in the state of contacting the prism onto sample and observing the sample. This feature is quite useful for the sample which is not possible to measure again (for example, sticky foreign sample). Plastic tape Paint
IR light
Sample
Prism contact on sample, and
be freely selected to measure. Only Jasco can offer this function.
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
ATR mapping by auto stage
Mapping Observation Image
50 um 20 um
<Conditions> Model : IRT-5000 Sample : Paint Resolution : 8cm-1 Accumulation :1 Method :ATR (ZnS) Area : 100x100 um2 (6x6 pixel)
0.5 0.1 0.2 0.3 0.4 4000 700 2000 1000 Abs Wavenumber [cm-1]
Oil-based parint Water-based paint
Real time sample observation is possible during contacting the prism onto sample. Measurement of interested position on the sample can be done while checking the observation image of the sample by real time observation and IQ mapping. Just One Time contacted + IQ mapping Faster measurement time, No need to worry about contamination
contacting of the prism onto sample
Spectrum, Observation image, Measurement conditions etc., All information put in one window
Spectrum Real time display Measurement conditions Observation Image Thumbnail Real time data analysis
Stereo Microscope x20 objective lens x16 Cassegrain (zoom x1.0) IRT-5000/7000 series
Focus position 1 Focus position 2 Auto Focus graph Focus point
Spectrum recording is suited to searching for a point where the spectrum of a sample with differing thickness is not saturated.
・ The window displayed on the microscopic image can be registered in the thumbnail. ・ The image registered in the thumbnail can be saved as linked with a spectrum. ・ The stage can be moved to the registered image position.
Each component of multi layer and foreign material on it is analyzed by IR imaging and MCR (Multivariate Curve Resolution) analysis
Component A
Main Component spectrum Observation image Mapping image Green:Protein,
Blue:PVC, Red:Polyester,Yellow:Polyethylene
Database search result of main component
Component B Component C Component D
Imaging analysis result of multi layer by MCR
Component A Component C Component B Component D Protein Polyester Polyethyl ene
JASCO Sharing Holder JASCO Sharing Holder
NRS-4500 NRS-5500/7500 IRT-5200/7200
Coordinate origin Correction of coordinate
Certificated sample
Share (commonize) the coordinate between instrument
Scanning image: Search the highly coincidence position. Select the comparison image
(1) Set the holder to IR microscope (2) IR measurement (3) Set the holder to Raman microscope (4) Position adjustment (5) Raman measurement (6) Analysis
IR Raman
IR Raman
Visible image Infrared chemical image
Cellulose PP PE PET 4000 1000 2000 3000 Wavenumber [cm-1]
Cellulose PP PE PET
Raman chemical image
PP PE PET TiO
2
3000 500 1000 2000 Raman Shift [cm-1] PP PE PET TiO2
(1) PET + pigment (2) Cellulose + pigment
4000 1000 2000 3000 Abs Wavenumber [cm-1]
(2) Cellulose (1) PET (1) Organic pigment 1 (2) Organic pigment 2
2000 200 500 1000 1500 Raman Shift [cm-1]
IR Raman
It is possible to analyze the material of the fiber and pigment by using IR spectroscopy with Raman spectroscopy together.