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ESW Technical Program Paper and Presentation Recognition Page 1 of 3
IEEE IAS Electrical Safety Workshop Technical Program Paper and Presentation Recognition
2016
- Best Technical Paper and Presentation: “Risk Perception and Decision Making in
Hazard Analysis – Improving Safety for the Next Generation of Electrical Workers”, Allison Haluik
- Best Technical Paper-Honorable Mention: “A Misunderstanding We Should
Eliminate”, H. Landis “Lanny” Floyd II
- Best Technical Paper-Honorable Mention: “Measuring Arc Blast: Effects of electrode
type, current level, enclosure sizes, and enclosure cover on arc blast in a LV system toward calculations”, Hugh Hoagland, Claude Maurice, Andrew Haines, Andre Maurice
- Best Technical Paper-Honorable Mention: “Current-Limiting Fuses: Proposed NFPA
70-2017 240.67, Arc Modeling and an Assessment based on IEEE 1584-2002”, Tammy Gammon, Vince Saporita 2015
- Best Technical Paper: ”Bridging the Gap: Using Technology to Capture the Old and
Encourage the New”, Joe Barrios and Katie Scarlett Reyes
- Best Technical Paper-Honorable Mention: “A Practical Guide for Applying the
Hierarchy of Controls to Electrical Hazards”, H. Landis “Lanny” Floyd II
- Best Technical Paper-Honorable Mention: “Risk Assessment and Your
Electrical Safety Program”, Daniel Roberts
- Best Technical Paper-Honorable Mention: “Enhanced Safety Features in Motor
Control Centers and Drives for Diagnostics and Troubleshooting”, Larry R. Olsen, John
- A. Kay, Martin Van Krey
2014
- Best Technical Paper: “Prevention Through Design: Reducing Risks Near Service and
Main Disconnects”, Daleep Mohla, Craig Wellman, & Kevin Lippert
- Best Presentation: “Change Management and Your Electrical Safety Program”, Tim
Rohrer
- Best Focus Session Presentation: “Electrical Safety Audit Findings – Do’s and Don’ts”,
Terry Becker 2013
- Best Technical Paper: “Cultural Drift and the Occlusion of Electrical Safety”, Anna
Floyd & Lanny Floyd
- Best Presentation: “Clothing in Arc Flash: Four Types of Arc Exposure and the effect of
moisture on garment appearance after an arc event”, H. Hoagland, M. Golovkov, C. Maurice, & P. Clark
- Best Overall Paper and Presentation: “AFCIs – From a Standards Perspective”, K.