Gated Mode Testing with PXD9 Pilot
20th International Workshop on DEPFET Detectors and Applications Kloster Seeon, May 13th 2016
- L. Andricek, C. Koffmane, F. Müller, E. Prinker for the Testing Crew
1 20th Int. Workshop on DEPFET Detectors and Applications Christian Koffmane